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Analysis

examine and interpret that sensed.

See Also: Analyze, Analyzers, Analytics, Data


Showing results: 3151 - 3165 of 3765 items found.

  • Scanning Electron Microscopy

    SEM - Materials Evaluation and Engineering

    JEOL JSM-6610 LV LaboratoryScanning electron  microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.

  • 200 MS/sec RF/IF Rugged Rackmount Recorder

    Talon RTR 2746 - Pentek, Inc.

    - Operates under conditions of shock and vibration- 4U 19 inch industrial rugged rackmount PC server chassis- Windows® workstation with Intel® processor- 200 MHz max. 16-bit A/D sampling and recording - up to eight channels- 80 MHz recording/playback signal bandwidths- Capable of record/playback of IF frequencies up to 700 MHz- Real-time aggregate recording rates of up to 3.2 GB/sec- Removable SSD drives- Up to 243 terabytes of storage to NTFS RAID disk array- RAID levels 0, 1, 5, 6, 10 and 50- SystemFlow® GUI with signal viewer analysis tool- C-callable API for integration of recorder into application- File headers include time stamping and recording parameters- DDC decimation and DUC interpolation range from 2 to 65,536- Optional GPS time and position stamping- See Datasheet for configuration options for playback, recording and storage capacity

  • DIgital 3D Image Correlation System

    Q-400 - Dantec Dynamics A/S

    The Digital 3D Image Correlation System Q-400 is an optical measuring device for true full-field, non-contact, three-dimensional measurement of shape, displacements and strains on components and structures made from almost any material.The Q-400 system is used for determination of three-dimensional material properties in tensile, torsion, bending or combined tests. In addition, deformation and strain analysis can be applied to fatigue tests, fracture mechanics, FEA validation, and much more.

  • Automated Shock Test Systems

    AutoShock-II Test System - L. A. B. Equipment, Inc.

    The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.

  • Battery Pack/Module Test Solution

    Chroma ATE Inc.

    Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current  Constant voltage  Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration

  • Power Line Transducers

    Meco Instruments Pvt. Ltd.,

    Current Transducers measure AC Current and converts it to an industry standard output signal which is directly proportional to the measured input. These Transducers provide an output which is load independent and isolated from the input. The output can be connected to Controllers, Data-Loggers, PLC''''s, Analog / Digital Indicators, Recorders for display, analysis or control. They are ideal for SCADA, Energy Management, Telemetering for Remote, Local as well as Central Monitoring Systems.

  • D Spectrum Analyzer

    TE-3000 - Antenna Technology Communications, Inc.

    The TE-3000 has set the standard for field testing equipment. Not only it's a comprehensive RF test setbut also a stream analyzer. For your RF needs, it covers all your terrestrial and satellite needs. All modulationtypes analyzed along with their associated measurements. Stream analysis accommodates IP and ASI inputs.You can now test your signal all the way through from RF level to data level!

  • Microelectronics Test & Engineering Services

    Evans Analytical Group®

    EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems

  • ARINC BusTools Software Analyzer

    Abaco Systems Inc

    BusTools-ARINC is the only solution for Bus Analysis, Simulation, Maintenance and Data Logging of ARINC 429, 575, 561/6-wire, 717 and CSDB databus protocols. Simultaneously control, log and display data from a single Windows-based program on USB, PCI, CompactPCI, PCI Express, ExpressCard, PC/AT, PC/104 and PCMCIA platforms. BusTools-ARINC provides comprehensive monitoring, data logging and simulation for 100% bus loading activity.

  • Micro Hardness Testers

    QATM GmbH

    QATM micro hardness testers for Vickers, Knoop and Brinell cover a test load range from 0.25 g to 62.5 kg. All hardness testers are equipped with an intuitive software that allows easy operation, analysis, and documentation of results. Turrets with either 6 or 8 different test diamonds or lenses can be mounted, which makes switching between Vickers, Knoop and Brinell hardness testing very simple.

  • Power-off Circuit Board Testing

    Huntron® Trackers® - Huntron

    Adding diagnostic tools to enhance your circuit board test capabilities is an important part of any electronic repair environment.Huntron Tracker power-off circuit board test uses analog signature analysis to detect and isolate component faults on boards beyond power-on functional testing. By comparing Tracker signatures from a working circuit board to the signatures of a non-working board, you can troubleshoot down to the component level.

  • Protocol Test System

    USB Explorer 260 - Ellisys Sàrl

    The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.

  • Acoustic Microscope

    AMI D9650 - Nordson Corporation

    Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.

  • Acoustic Microscope

    AMI D9650Z - Nordson Corporation

    The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.

  • Water Filler for Nickel-Cadmium Cells

    MasterFiller - JFM Engineering

    The MasterFiller is an instrument designed to deliver measured quantities of distilled water as required in the service of Aircraft Nickel-Cadmium batteries.· The MasterFiller consists of a microprocessor controlled pump with a level sensing probe, a keypad and display and an external 12VDC power supply (or optional battery).· The MasterFiller is part of a system comprising Intelligent Charger-Analyzers and Software for Battery Data Acquisition and Analysis, designed to improve the accuracy and efficiency of the process of testing batteries for airworthiness certification.

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