Showing recent results 2476 - 2490 of 3560 products found.
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PL2003 - Ektron Tek Co., Ltd.
Designed and manufactured in accordance with ASTM F414, DOT571.109, F870 & JIS D4230 standards. New generation of PL-2000X series Plunger Testers, equipped with servo-hydraulic system to control the testing speed, are available fpr customers to select the suitable model. Test functions including Radial elasticity test, Tread footprints test, Tire dimension test, Bead unseating test, Lateral elasticity test and Pressure distribution analysi for Footprints.
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PL2002 - Ektron Tek Co., Ltd.
Designed and manufactured in accordance with ASTM F414, DOT571.109, F870 & JIS D4230 standards. New generation of PL-2000X series Plunger Testers, equipped with servo-hydraulic system to control the testing speed, are available fpr customers to select the suitable model. Test functions including Radial elasticity test, Tread footprints test, Tire dimension test, Bead unseating test, Lateral elasticity test and Pressure distribution analysi for Footprints.
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PL2001 - Ektron Tek Co., Ltd.
Designed and manufactured in accordance with ASTM F414, DOT571.109, F870 & JIS D4230 standards. New generation of PL-2000X series Plunger Testers, equipped with servo-hydraulic system to control the testing speed, are available fpr customers to select the suitable model. Test functions including Radial elasticity test, Tread footprints test, Tire dimension test, Bead unseating test, Lateral elasticity test and Pressure distribution analysi for Footprints.
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PDS6042 Inquire now - Xiamen Lilliput Technology Co., Ltd
PDS series portable digital storage oscilloscopes embody completely the perfect combination of capability, speed and analysis. With 40-100M bandwidth, 250M S/s realtime sample rate on each and dual channels storage, PDS series would be the ideal instrument for design, maintenance and detection. 250M realtime sample rate for each channelManual Cursor Measurement; 5 automatic measurements; High-speed screen update, Saving 4 Waveforms & setup parameters;
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X-5000 - Olympus Corp.
The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
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N1912A - Keysight Technologies
30 MHz video bandwidthSingle shot real time capture at 100 Msample/s per secondKey Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc.One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc.Internal Zeroing and Calibration while connecting to the DUTBenchVue software enabled
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N1911A - Keysight Technologies
30 MHz video bandwidthSingle shot real time capture at 100 Msample/s per secondKey Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc.One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc.Internal Zeroing and Calibration while connecting to the DUTBenchVue software enabled
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JSV-4498-PXI - Jumho Electric Corporation
16-channel ICP analog voltage input Maximum sample rate: 204.8KS/s; simultaneous acquisition Analog-to-digital converter: delta-sigma, 24 bits Phase accuracy < 0.02deg@10KHz Maximum analysis bandwidth：96KHz Input range from ± 10 V to ± 316mV Coupled mode：AC Signal conditioning: anti-aliasing filter Digital filter: user-defined low pass, high pass, band pass, band stop Dynamic range：114 dB ICP Current：0-4 mA, optional Overload indication: software displa
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Aaronia AG
Professional RF measurement devices use a frequency dependant measurementapproach, the so-called spectrum analysis. In a certain frequency range,the individuals signals and their respective strengths are being broken down, forexample into a "bargraph" display (see SPECTRAN screenshots on the left).The height of the individual bars represents the corresponding signal strength.For the 3 strongest signal sources, SPECTRAN automatically displays theexact frequency and signal level, thanks to its "Auto Marker" feature.
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AC600 - Leco Corp.
Developed to measure the calorific content of solid and liquid fuels, the LECO AC600 semi-automatic isoperibol calorimeter sets the standard for future calorimetry instruments. Its semi-automated operation, combined with the use of thermodynamic TruSpeed®, obtains a rapid analysis of calorific content and increased instrument throughput without sacrificing accuracy or instrument precision. A new, ergonomically-designed, lightweight combustion vessel assures ease of operation while greatly reducing operator strain.
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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QA-C - PRQA Programming Research
QA·C offers a simple way of analysing your code against your chosen coding standard, providing an effective and accurate solution to improving your software. Deploying industry standard metrics and providing code structure visualisations, QA·C brings a level of clarity to complex code, identifying issues long before they reach production. Through analysis your software becomes more robust, more maintainable and much more reliable.
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SIFT - FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Inframet
SAT (semi-automatic test) module is a PC with installed frame grabber card and specialized software optimized for testing surveillance imaging systems or modules of such systems. Generally SAT module enables capture and analysis of images generated by tested electro-optical imaging systems like thermal imagers, TV cameras or video cameras used in the test system.. The PC is the heart of the SAT module and is connected both to the test system and to the tested imager.
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ETS788 - Hilevel Technology, Inc.
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
