Showing results: 1906 - 1920 of 14424 items found.
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Yelo Ltd.
A hipot test is conducted by ensuring no current flows from one point to another on a circuit. A hipot test will take two conductors that should be isolated from one another and passes a high voltage between the two points. The current which flows between these points is then measured. If too much current flows, this would indicate that the points are not well isolated and the test will fail.
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Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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TR-220 -
Tel-Instrument Electronics Corp.
The TR-220 provides test capability for Traffic and Collision Avoidance Systems (TCAS), Distance Measuring Equipment (DME) and Transponders (Modes A, C, and S). The TR-220 features state-of-the art design technology. Microprocessor control results in easy-to-use operation that requires minimum amounts of training. Setup menu allows storage of various test parameters to facilitate quick recall of test conditions.
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7750TG -
Evertz Microsystems Ltd.
The 7750TG Test Signal Generator provides a cost effective method of generating SDTV 270Mb/s test signals. The 7750TG is ideal for checking signal path integrity, monitor alignment or to determine system performance over varying cable lengths. The 7750TG generates test signals in 525 line and 625 line SMPTE 259M-C video formats and offers four 270Mb/s outputs.
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TRICOR Systems Inc.
TRICOR Systems Inc. offers test equipment for switches, keypads, rubber, etc. Virtually any component where accurate force-displacement and measurements are required. From our Model 933A, a low cost life test system to our Model 925 test station used to obtain precise force measurements relative to displacement; we have the system you require.
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Teradyne, Inc.
Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.
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midUTS -
Bloomy Controls, Inc.
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Delta MATRiX -
Cohu, Inc.
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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WEETECH, INC.
WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
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630 -
The Eastern Specialty Company
TESCO’s Closed-Link Field Test Kit (Catalog No. 630) with Power Factor has been designed to reduce the weight of field test equipment to the lowest possible limit when testing electric meters without potential links or with the links closed. The unit is protected within its ergonomic carrying case by a durable powder coated aluminum shell. The total weight of the meter test kit including leads, and digital reference standard is only 30 lbs! The test kit carrying case also incorporates ample storage space for the cable set and other tools.
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A8a -
atg Luther & Maelzer
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Corelis, Inc.
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Intellitech Corp.
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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C50NMNM -
Copper Mountain Technologies
Our N-type test cable is made to ideally suit our larger line of vector network analyzers. The C50NMNM test cable operates at a frequency of 18000 MHz and is compatible with our PC-driven vector network analyzers.
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PW636i-F -
Ponovo Power Co., Ltd.
PW636i-F (6×32A, 4×300V, 8 fiber optic ports) is the new generation of PW series relay test set which can be used both as an conventional relay test kit and IEC61850 testing tools.
