-
product
Harmonic Filter Resistors
Post Glover designs, builds and tests their harmonic filter resistors in accordance with applicable IEC and IEEE standards to guarantee their performance. With no two installations ever being the same, our experienced engineers develop the proper solution for your particular application and environment. Our low inductance designs are built using all stainless steel elements in corrosion resistant enclosures chosen for your unique specification. Request a quote for your custom harmonic filter resistor.
-
product
Software Abstraction for Easy Control of DC Power Supplies
Konrad DCPower
It consists of three modules:- A windows driver which is responsible for the communication and device abstraction- A DLL with NI TestStand Test Steps which allows easy integration in automated production environments- A standalone executable which simplifies debugging and setup of test sequencesThis architecture allows to open a communication channel from multiple instances to the same device. This is important when for example two channels of a power supply are used in two independent applications.
-
product
MCB Thermal + Magnetic Characteristic Test Bench
The test system is a special version of the thermal + Magnetic test test system. The single power source able to deliver either thermal or magnetic test parameters set on the PC by the user.
-
product
Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
-
product
PTO Dynamometers
AW is the world leader in AG/PTO dynamometers with over 14,000 units sold. AW's hydraulic activated load unit is water cooled allowing it to test high torque loads for continuous periods of time. AW's heavy duty load units are well known to last for decades. Combine this with all new computerized electronic load control, software, thermocouples, sensors and you have a system second to none - the AG.X Series.
-
product
Record and Analyze Flight Data
TDS AND MRC
AMPOL's TDS and MRC-150 are complete legacy solutions that can record and analyze flight data from a number of sources. These solutions are especially useful in the air for flight-test and integration phases, as well as on the ground for pre-flight tests. The TDS is a complete solution for recording and analysis of telemetry data from multiple sources. Installed on a fighter jet's wingtip, in an air-to-air missile pod, the TDS's airborne unit is sealed and has a removable, solid-state Flash disk...show more -
product
Printed Circuit Board Inspection System
NIDEC-READ offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. They can be flexibly configured according to applications in terms of size, type, and the number of test pins required.
-
product
Spring Testing Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
Used to test the quality performance of springs and ensure that they meet the specified requirements.
-
product
Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications softwa...show more -
product
Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
-
product
PCI Programmable Resistor Card 4-Channel 2 Ohm To 63.7 Ohm - SPST
50-294-111
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
-
product
Portable Hardness Tester For cast/rough surface parts
PHT-1750
Loaded with features, this economically priced portable hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This portable hardness tester comes complete with the G impact device, calibrated test block and rugged carry case.
-
product
Quad 4x32 Reed Matrix for 34980A
34934A
The Keysight 34934A module for the 34980A Multifunction Switch/Measure Unit offers the highest density matrix for connecting paths between your device under test and your test equipment, allowing for multiple instrument connections to multiple points on your device under test at the same time.
-
product
1mV-300V / 2 CH. Milli-Voltmeter
MVT-172
*test frequency:5Hz-1MHz *dual needle,soley and tracking measure *AC voltage:1mV-300V, max. 500V *dB measure: -80dB~+50dB
-
product
EV& Charging Pile Test Set
AC Testing
With the Industrial development globally, Electric Cars is becoming more and more popular gradually in different countries. In the future, we can say that Electric Vehicles shall replace the ordinary cars soon and there are many charging piles, recharging station built up to meet the requirements to EV charging.
-
product
SMD Array Type LCR Test Fixture
16034H
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
-
product
Optical Test Optimization Solutions and N1002A for 800G and 1.6T
FlexOTO
Optimize test efficiency and increase DCA-M hardware utilization for high channel count testing in 400G/800G/1.6T and CPO/NPO applications.
-
product
LAN Packet Tester
LE-590TX
The LE-590TX is a LAN analyzer that connects to a PC's USB2.0 port. In TAP mode, you can capture full duplex data on 10/ 100Base-TX and transmit to the PC at 480Mbps via the USB2.0 interface. In PG mode, you can generate test packets at up to 100Mbps line rate.
-
product
Shock Test Machine
Guangdong ALI Testing Equipment Co,. Ltd
Shock Test Machine Special in shock test is used to accurately measure the product fragility and evaluate the protective ability of product packaging.
-
product
Brake Test Systems
GIANT Evo
The GIANT Evo is an extension of the well-proven GIANT product portfolio and has been developed to suit the growing demands and needs of the current and future brake markets. Covering the market segments from mini and compact cars to medium sized SUVs as well as large vehicles, this brake testing machine forms the base of HORIBA’s inertia brake dynamometers portfolio. All components are specifically tailored to the needs of the passenger car market segment.
-
product
Wire Damage Test Device For Pull Testing
IEC60884 FIG11
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
-
product
Advanced Test Platform
980 12G
The Teledyne LeCroy quantumdata 980 12G-SDI Video Generator / Analyzer module supports video and audio functional testing of next gen broadcast monitors, conversion devices and sources up to 12G-SDI. The module is equipped with four (4)12G-SDI-capable output ports. The output ports can be aggregated for Dual link HD-SDI and Quad link 3G-SDI operation. A genlock input supporting both SD analog black burst and HD tri-level to sync the output clocks with a "house sync" but the module can also run o...show more -
product
Electrostatic Discharge Test
The electrostatic discharge test is designed to determine the ability of equipment to perform its intended function without permanent degradation of performance as a result of an air discharged electrostatic pulse. Electrostatic discharge is the result of an unbalanced electrical charge. Typically, it is created by insulator surfaces rubbing together or pulling apart. A transfer of electrostatic charge between bodies (materials, components, etc.) at different electrostatic potentials is caused by direct contact.
-
product
Digital Multimeter
KU-1199
Auto-SCAN Measurement. No need for selectingDC/AC Voltages and Resistance ranges.Only 11mm thick and 72g in Weight.Easy-to-read largeLCD.Equipped with carrying case.Gold-plated Test Lead Pins.
-
product
PXIe-6591, 12.5 Gbps, 8-Channel PXI High-Speed Serial Instrument
783638-01
12.5 Gbps, 8-Channel PXI High-Speed Serial Instrument—The PXIe‑6591 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex‑7 FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe‑6591 takes advantage of FPGA multigigabit transceivers and up to eight TX and RX lanes. In addition to high-speed serial lanes, the PXIe‑6591 features digital I/O signals that support multiple logic families with per line, per cycle direction control.
-
product
Dynamometer Controls, Data Acquisition Systems and Instrumentation
Whether you want a basic engine dynamometer configuration that provides torque, rpm and power or need an advanced, full-featured test and measurement software package, Taylor has a data acquisition system that will serve your unique application without breaking your budget. Contact Taylor to discuss which instrumentation system and related accessories are right for you, and turn your testing challenges into success.
-
product
PMC Module With 2 Or 4 CAN Bus Nodes ARINC825 Compliant For Testing & Simulation Of Avionic CAN Bus Systems
AMC825-x
ARINC825 (CAN bus) Test & Simulation module for PMC with 2 or 4 electrically isolated CAN bus nodes operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s. The AMC825-x PCI Mezzanine Card (PMC) can work either with full functionality as an active CAN node for testing and simulating or in Listening Only mode for monitoring and recording purposes.
-
product
Brake Test Systems
Worldwide, high-speed transport is getting more important. Only through continued improvement and expansion of braking systems, will suppliers all around the world provide a solid foundation for safe traffic. HORIBA has been successfully making brake test stands for more than 90 years.
-
product
ATE Support
Partech´s talented ATE (Automatic Test Equipment) Support team can provide reliable in country support of ATE, ATE related hardware and fixtures and software.
-
product
Differential And I/Q Device Measurements
S97089B
The S97089B combines source-phase control of multiple internal or external sources with frequency-offset mode, enabling simplified test of I/Q modulators/converters, differential mixers, and harmonics or amplifiers
