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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Kelvin Contact Test
C.C.P. Contact Probes Co., LTD.
We offer different tip types for low resistance testing.
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PXI Voltage Amplifier 10K Ohm, D Type
41-650-011
A 5 channel voltage amplifier ideal for increasing the output voltage from other PXI modules, enabling users to easily generate the signal voltages commonly required in applications such as automotive test.
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3D Motion and Deformation Sensor
ARAMIS
ARAMIS is a non-contact and material-independent measuring system based on digital image correlation (DIC). It offers a stable solution for full-field and point-based analyses of test objects of just a few millimeters up to structural components of several meters in size. The system performs high-precision measurements with a 3D image resolution in the submicrometer range, regardless of the specimen’s geometry and temperature. There is no need for a time-consuming and expensive preparation. For statically or dynamically loaded specimens and components, ARAMIS provides accurate
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Test system software
CITE
CITE (Computer Integrated Test Environment) is the software platform for all Digitaltest test systems. It is a real-time system offering a vast number of tools to ensure high test quality and shortening testing time. The software also provides you with several different programming languages that you can choose from.
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Test Automation System for Emission Testing
STARS VETS
STARS VETS is a Vehicle Emission Test System application available with the STARS Automation platform for chassis, engine and powertrain dynamometers. The application provides test cycle execution, emissions equipment control, results calculation and reporting in compliance with the different legislative standards throughout the global regions. Its flexible design offers a wide range a customization, and it addresses the various requirements for R&D, COP and certification testing.
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Gen-Z
Gen-Z is a data-access technology designed to provide high-speed, low-latency, memory-semantic access to data and devices via direct-attached, switched or fabric topologies. Gen-Z components use low-latency read and write operations to directly access data and use a variety of advanced operations to move data with minimal application or processor involvement. Gen-Z fabric utilizes memory-semantic communications to move data between memories on different components with minimal overhead. Memory-s...show more -
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Air Permeability Tester
TF164B
TESTEX Testing Equipment Systems Ltd.
Our Air Permeability Tester determines the resistance of fabrics (woven, knitted and non-woven textile materials) to the passage of air (air flow) under constant pre-set air pressure while firmly clamped in the test rig of selected test head/area.The specimen is loaded to the test area of the instrument easily by means of a pneumatic holder. By pressing down the holder to start the test. The air permeability tester is equipped with a vacuum pump to draw air through an automatic interchangeable t...show more -
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Electric Servomotor Threaded Impact Tester
This equipment is a new type of impact test equipment that uses the uniquely developed servomotor with ultra-low inertia and high torque that is used in our vibration.
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NI-9218, 51.2 kS/s/ch, 2-Channel C Series Universal Analog Input Module
783362-01
51.2 kS/s/ch, 2-Channel C Series Universal Analog Input Module - The NI‑9218 is designed for multipurpose measurements. It offers built-in support for accelerometer, powered sensor, full-bridge, and voltage measurements as well as quarter-bridge, half-bridge, 60 V, and current measurements using measurement-specific adapters. Each channel is individually selectable, so you can perform different measurements on each channel. The NI‑9218 is ideal for creating universal test systems for automotive, off-highway, and data-logging systems.
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Electric Motor Test Systems
Electric Motor Test Systems feature our highly successful water brake dynamometer which is used as an electric motor loading device.
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File Import Tool For Importing And Converting STIL, WGL, VCD/EVCD Vectors
DIOEasy-FIT
Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.
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OTDR Tester
M-OTDR-502
Fuzhou Metricu Technology Co Ltd
Optical Time Domain Reflectometer Wavelength 1310 / 1550nm, max test range 150KM, Dynamic range 28 / 26dB, SOR standard data saving, create PDF/EXCEL format report, stable laser source, support CW/270/330/1000/2000Hz, Test fiber's length, loss, attenuation parameters and event map, locate connection point/fusion point, Automatic analysis of various linkers/fusion points, easy analyze of various events,Support saving curves number ≥30000pcs, loss test, detect the optical or optical components loss value, etc. Test IP camera, optical power meter, visual fault locator, RJ45 cable TDR test, cable tester, cable tracer, etc.
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PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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High-Performance Autoranging DC Power Module, 60V, 17A, 500W
N6756A
The Keysight N6756A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Accelerated Stress Test Chamber
CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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Transformer Resistance Testing
Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the WESHINE Transformer Ohmmeter (VS-3110 series) of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
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Testing Solutions
FEV has been globally recognized for its flexibility and innovative ideas. In the Testing Solutions division, FEV continues this tradition, providing its customers with intelligent and innovative test cell solutions that meet their needs. From the earliest stages in the development of a project, FEV uses its experience gained from the operation of more than 150 test cells to ensure that newly planned facilities / installations are cost effective, modular and provide high utilization.
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Equipment Monitoring Module
DR YIELD software & solutions GmbH
The Equipment Monitoring Module (EMM) allows the control of specific tools using product test data.
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PCB paperless repair with multi-format CAD viewer
GRS500 CADView
GRS500 CADView multi-format CAD viewer includes over 30 popular CAD formatsGRS500 CADView enables you to test and fault-find assembled PCBs using CAD data
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CATV & RF Signal Products
Wuhan Sunma Technology Co., Ltd.
SunmaFiber is a worldwide leading provider for fiber optic equipment, fiber optic test instruments and other data network & telecom products of communications, commercial, and consumer markets. The Company offers test and measurement systems and services to telecommunications service providers, cable operators, and network equipment manufacturers. In addition, the Company offers components, modules, and subsystems for Wireless, Telecommunication, Datacom, Power, Cable TV measurement instruments and utilities applications.
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Integrating Spheres
IS-*M
• Diameter: IS-0.3M (φ0.3m)、IS-0.5M (φ0.5m)、IS-1.0M (φ1.0m)、IS-1.5M (φ1.5m)、IS-1.75M (φ1.75m)、IS-2.0M (φ2.0m). Other sizes can be designed according to the customer’s request. • The painting of integrating spheres is according to CIE Pub.No.84 (1989) • Material: Pure barium soleplate (BaSO4) • BaSO4 coating: ρ(λ)≥0.96 (450nm~800nm) and ρ(λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectanceρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in lighting holder posit...show more -
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PCI Precision Resistor Card 6-Channel, 3Ω To 1.51MΩ
50-297-050
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Axis Play Tester
PMS 3.5 | VP 225012
Maschinenbau Haldenwang GmbH & Co. KG.
The axis play tester PMS 3.5 is used to reliably determine defects and wear on steering parts, wheel bearings, suspension and suspension by counter-rotating transverse and longitudinal movement of the test plates. The built-in hydraulic drive ensures a powerful and even movement of the test plates. An automatic mode and other different operating modes make the PMS 3.5 easy to use.
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USB-6356, 8 AI (16-Bit, 1.25 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device
781444-02
8 AI (16-Bit, 1.25 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6356 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6356 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Test Analyzer
ST2302
Shenzhen Star Instrument Co., Ltd.
The ST2302 three-phase energy meter field test analyzer reaches accuracy class 0.02. Its stable performance comes from the embedding technology and digital signal processing. It is Windows CE-based and provides 7 inches color LCD display.
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Hybrid Verification Platform
HES-DVM
HES-DVM™ is a fully automated and scalable hybrid verification environment for SoC and ASIC designs. Utilizing the latest co-emulation standards like SCE-MI or TLM and newest FPGA technology, hardware and software design teams obtain early access to the hardware prototype of the design. Working concurrently with one another they develop and verify high-level code with RTL accuracy and speed-effective SoC emulation or prototyping models reducing test time and a risk of silicon re-spins.
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Short Test Pin Probe 13
CX-13
Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards.
