- Pickering Interfaces Inc.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-253-014
The 40-253-014 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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DDR4 Pro Memory Test Adapter
This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Hydrostatic Test Chambers
Test chambers are available to protect personnel during proof or burst testing. A few samples are pictured below. Chambers are manufactured in polished stainless steel with a clear polycarbonate door(s) for visibility during testing. Fluid port(s) are provided inside the enclosure, while all controls remain outside the enclosure for operator safety. In a hurry? Choose from our selection of Quick Ship Test Systems. basic units can ship within 24 hours or less and chamber systems within 2-3 days...show more -
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Vacuum Discharge Test Equipment
DAC-VD-1
DAC-VD-1 can locate defective points such as scars or pinholes on stator coils and wires easily.By applying voltage in a vacuum chamber, the electric arcing from a defective part can be discoveredvisually in a short time. DAC-VD-1 can be used widely in variety of applications from product developments to outgoing inspections.
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Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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802.11a,b,g Dual RF Shielded Test Enclosure
JRE 0814-2R-A
Containing all the capability of the larger JRE enclosures, the rack mounted 0814-2R-A is ideal for testing IEEE 802.11 a,b,g devices such as; WLAN, VoIP, access points and other RF devices. Two independent 0814 series enclosures are mounted in one 19 inch rack. Two shielded vents provide excellent cooling and optional fan(s) are available for those hot products. Tough 'honeycomb' vents maintain shielding effectiveness throughout the frequency range. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness.
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PCI Express 4 CEM Receiver Test Automation
N5991PC4A
The N5991PC4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 4.0 CEM Add-In Cards and systems
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APU Test Cells
Atec is a leader in test cell design and construction for aircraft auxiliary power units (APUs). We are licensed and experienced for work with all major OEMs, DoD, and US Allies. Our Phoenix™ APU Cells feature common configuration, modular utilities, and fast installation and startup.
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NFC Physical Layer Test System
IQnfc+
LitePoint provides turn-key software that facilitates test coil calibration, executes test plan and provides detailed waveform analysis and flexible APIs to customize test flow in the labs.
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Indicators - Test
Measures the deflection of the arm, the probe does not retract but swings in an arc around its hinge point.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Meter Test Benches
Test Station
The meter test station allows simultaneous testing of 3, 5, 10 or 20 induction or static electricity meters. The test station could be constructed for single-phase electricity meters or for three-phase meters.
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Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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Solar Spectrum Test Chamber / Solar Radiation Test Chamber
WEIBER Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instrum...show more -
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MASTER FUEL PRESSURE TEST KIT
FIT550
*Performs running, residual, rail and flow rate pressure tests*Large, easy-to-read 3-1/2" dual-scale gauge reads 0-100psi and 0-700 kPa*Kit includes: 50+ adapters, fittings, 48" hose, pressure relief and fuel discharge hose to test most domestic and foreign fuel injection systems*Also includes quick release couplers and adapters to fit other fuel injection test kits*For use with gas engines only
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IEC60950 Ball Drop Impact Test Apparatus
Shenzhen Chuangxin Instruments Co., Ltd.
It is mainly used for mechanical strength testing equipment enclosure, test equipment enclosure should be able to ensure that the structure can be expected to withstand the operation does not produce within the provisions of the standard risk for damage to the outer surface of the enclosure will touch dangerous parts of the apparatus.
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ScanWorks IJTAG Test
ScanWorks IJTAG Test
The ScanWorks Internal JTAG (IJTAG) tools allow system-on-a-chip (SoC) designers, DFT engineers and validation engineers a new and simpler way to access, control and run any embedded instrument designed into chips. When the IEEE ratifies the IEEE 1687 IJTAG standard in 2013, it will enable easy access to run any functional type of IJTAG instrument. ASSET is the first tool supplier with development tools available today for the early adopters of this important new technology.
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Tensile Test Chambers
Tensile strength tests are an integral part of material development. Materials that require this test include various metals, plastics, paper, fabrics, fibers, composites, and films for many industries. ESPEC tensile test chambers are designed to work with any tension apparatus and can be customized to meet unique application needs.
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Turnkey Data Acquisition Systems
Series 6800
Based completely on the Series 6000 hardware and software platform, Series 6800 is a turnkey system configured for specific measurement types and environments. Systems are available for Strain/Bridge, Voltage/IEPE, Thermocouple and packaged for laboratory or portable applications. Systems range in channel count from 8 to 128 channels and can be easily expanded, should test requirements change. Included turnkey software helps facilities focus on testing, not developing software. If you don’t see a configuration that fits your application, we can likely build a system specific to your needs.
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Load Pull Test Fixtures
Low Insertion Loss for High VSWR TuningMultiple Connector Configurations50Ω and Transformers (Klopfenstein, Quarter-wave) AvailableHeatsinks and Fans AvailableCooling (Water cooling, Forced air cooling) AvailableIntegrated Biasing Available
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Three Phase Energy Meter Test Bench Type KP-S3000-A
Bofa Instrument & Equipment Co., Ltd
Three phase energy meter test bench, type KP-S3016-A, is a new generation, high precision calibration equipment to test three phase energy meters. It is an ideal testing equipment for energy meter factory or R&D institute. All the testing procedures can be automatically operated by PC or by Keyboard manually.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more -
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High Voltage Porosity Detection
High Voltage Technique: The high voltage, or porosity technique, can be used to test coatings up to 25mm (1”) thick and is ideal for inspecting pipelines and other protective coatings. Coatings on concrete can also be tested using this method.
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Seam Fold Test Device
FFR1000
This equipment is designed to bend a flexible printed circuit board, which has a high degree of freedom and versatility, and at that time, apply a load to the bending point at the initial stage or each time, and repeat bending and unfolding to confirm the durability.
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PCI Precision Resistor Card 18-Channel, 1Ω To 62.1Ω
50-297-011
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
