Teradyne, Inc.

World's largest supplier of Automatic Test Equipment and is a leading supplier of interconnection systems.

  • +1 800-837-2396
    978 370-2700
  • 978 370-1100
  • customercare@teradyne.com
  • 600 Riverpark Drive
    North Reading, MA 01864
    United States

Filter Results By:



Showing recent results 1 - 15 of 31 products found.

  • SoC Device Test Platform

    UltraFLEXplus - Teradyne, Inc.

    The UltraFLEXplus combines new instrument and software capability with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s 15 year history .

  • Test System

    ETS-88TH - Teradyne, Inc.

    Teradyne, Inc. introduces the ETS-88TH, the latest addition to the ETS-88 product line designed to test IGBT, MOSFET, and power module devices. The ETS-88TH provides an overall lower cost of test with the ability to combine AC and DC testing in a single device insertion. "The ETS-88TH has proven superior AC test performance for discrete and power module devices while lowering the cost of test for customers,” said Steve Price, Business Development Manager for Teradyne’s Consumer Power Business Unit. “With the AC-2500 instruments, the low inductance path and fast waveform transfer, customers benefit by providing higher device specifications, greater test coverage, and higher throughput.”

  • Affordable In-Circuit Test

    TestStation LH - Teradyne, Inc.

    The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.

  • Asynchronous System Level Test Platform

    Titan - Teradyne, Inc.

    The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.

  • Fastest In-Circuit Test Platform

    TestStation - Teradyne, Inc.

    Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.

  • High Speed Automation for TestStation

    Teradyne, Inc.

    Teradyne's TestStation High-Speed Inline Automated Handler is compatible with TestStation Multi-Site Inline configurations designed for the most productive and lowest cost in-circuit test package.

  • High-Speed Memory Test Solution

    UltraFLEX-M - Teradyne, Inc.

    The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.

  • Image Sensor Testing

    IP750Ex-HD Family - Teradyne, Inc.

    The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.

  • in-circuit test system

    TestStation LX - Teradyne, Inc.

    TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.

  • Magnum Memory Test System

    Teradyne, Inc.

    Teradyne's Magnum test system delivers high throughput and high parallel test efficiency for non-volatile memories, static RAM memories and logic devices. Magnum's largest configuration provides up to 5120 digital channels and all Magnum configurations provide a 50MHz pattern rate and 100Mbps DDR rate on each channel.

  • MCU Test Solution

    J750Ex-HD Family - Teradyne, Inc.

    Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them.  With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.

  • performance test

    8862 - Teradyne, Inc.

    Teradyne’s Spectrum™ 8862 (TSSE) is a unique combinational in-circuit (ICT)/ functional test system that can lower overall costs and test times for manufacturers that prefer to combine functional and ICT test capabilities on a single system. Spectrum test systems provide electronics manufacturers with reliable high-quality performance test and product validation.

  • Production Board Test

    Teradyne, Inc.

    Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.

  • PXI Express-based High Speed Subsystem

    HSSub - Teradyne, Inc.

    The Teradyne PXI Express-based High Speed Subsystem (HSSub) addresses defense and aerospace ATE requirements that are common to most recent designs including buses with increasing speeds, protocol complexity, big data handling and processing demands. HSSub further accommodates the need for lower latency interaction with the unit under test. HSSub is designed for integration into existing or future test systems with the ease of a single LXI instrument. For serial or parallel, standardized or custom, and protocol-based buses of any speed including: LVDS, LVTTL, M-LVDS, Fibre Channel, FireWire, Ethernet, Serial RapidIO, PCI Express and Infiniband.

  • RF Test System

    J750-LitePoint - Teradyne, Inc.

    With the proliferation of RF into microcontrollers and other stand-alone wireless SoC devices, the introduction of LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity and cellular standards. The J750-LitePoint provides dedicated on-instrument DSP for high-throughput RF signal processing, an extensive wireless software library and a comprehensive debug tool suite. Now, the J750 can test an even broader range of applications while continuing to deliver superior cost efficient and rapid time-to-market.