Showing product results. 1 - 15 of 68 products found.
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Teradyne, Inc.
A digital device processes electronic signals that represent either a one (on) or a zero (off). The ‘ones’ and ‘zeros’ represent data. Each one or zero is referred to as a bit and a group of 8 bits equals a byte
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Di-Series™ - Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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EDigital-Series™ - Teradyne, Inc.
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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ETS-800 - Teradyne, Inc.
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Spectrum BT™ - Teradyne, Inc.
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Spectrum HS™ - Teradyne, Inc.
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Spectrum-9100™ - Teradyne, Inc.
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Teradyne, Inc.
Teradyne's TestStation High-Speed Inline Automated Handler is compatible with TestStation Multi-Site Inline configurations designed for the most productive and lowest cost in-circuit test package.
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UltraFLEX-M - Teradyne, Inc.
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Teradyne, Inc.
HSSub is a software-defined family of PXIe Instrumentation that can be integrated and scaled to support digital test applications throughout the product life cycle from design verification to production and sustainment.
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TestStation LX - Teradyne, Inc.
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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J750 - Teradyne, Inc.
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Magnum VUx - Teradyne, Inc.
Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.
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J750Ex-HD - Teradyne, Inc.
Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.
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Teradyne, Inc.
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.