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Universal Test Machines
Single column test stands offer a wide range of materials testing possibilities no matter what your testing needs are.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Test Solution
Novus, Novus-M, & Novus-R 100/25GE Load Modules
Keysight Network Applications and Security
Novus, Novus-M, and Novus-R are Ixia’s next-generation architecture and test solutions that satisfy the test needs of both high-density, multi-rate switch/router makers and the organizations implementing the network equipment. Supporting eight native QSFP28 100GE ports and up to 32-ports for 25GE per load module, Novus load modules enable interoperability and functional testing, as well as high-port count performance testing.
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MM Fiber Test
KI-TK032
850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable SC & LC connectors
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Bench Top Test Set
WesTest-3000/BTTS
Communications & Power Industries
*PXI Based*Test Requirements Driven*Cost Capability Consistency*Software Standards- ATML, IEEE
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Agree Test Chambers
Agree test chamber are designed to perform specific temperature, humidity and vibration test to improve the quality and reliability of components. The Agree method of testing is an acronym for the Department of Defence Advisory Group Reliability of Electronics Equipments. This chamber also known as Temperature Humidity Vibration Test chamber and Stress Test Chamber
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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PC Based Comprehensive Test Setup for Luminaires
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Endurance Test Panel For Domestic Mixer
SCR ELEKTRONIKS have developed ENDURANCE TEST PANEL FOR MIXER for carrying out endurance test of mixer at final stage. It consists of Voltmeter, Ammeter, Wattmeter & Temperature Indicator for observing the values of different parameters. Output Socket is provided for quick connections and disconnections of the equipment to be tested. User friendly operations make the equipment to be handled easier for any operator.
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Motorized Test Stands
Imada offers basic and advanced motorized test stands that are available in Standard, High, and Low speeds.Use ZTS or ZTA force gauges with MX, MX2 or EMX Series test stands to enable force control and non destructive testing.
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PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Bump Test Machine
Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
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Vibration Test Equipment & Measuring Products
At MB Dynamics, we take great pride in our ability to serve clients in a wide range of industries with world-class vibration testing and vibration measurement and analysis products. MB’s family of products has grown over the years, beginning with electrodynamic shakers and developing into an extensive inventory which includes a variety of application-specific solutions.
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Test Package
Shenzhen Bonad Instrument Co., Ltd.
We can provide a variety of different specifications of freezing load test packages, including AHAMHRF-1 2007/ SASO 2664-2007 Sawdust freezing test package, AS1731.4-2003 Australian frozen Load Test Package, AS72-2005 North American Commercial Refrigeration Load Simulation Test Package, IEC 62552 Test Package for Freezing Load Testing in Refrigerators. In addition, we can also provide customization according to test requirements. For more information, please contact us, BONAD will provide you with professional technical advice and high-quality testing equipment.
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Communication Test Software for MODBUS RTU
ComTest Pro
ComTest Pro Communication Test Software for MODBUS RTU Devices via Serial and Ethernet. This complementary program allows users to test and troubleshoot MODBUS RTU communication by sending single or multiple read or write commands to the device. The software offers comprehensive data-logging, data-formatting and error checking features.
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Test & Measurement Cables
Our test & measurement cables provide customers with a competitive edge over ordinary cable designs by addressing three important criteria for testing electronic components and systems: phase stability, insertion loss stability and repeatable measurements for the cable’s useful life.
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Sand Dust Test Chamber
Guangdong Test EQ Equipment co., Ltd.
Multi-Scenario Simulation: Replicates desert storms, industrial dust ingress, and abrasive wear with programmable wind/sand profiles. Precision Particle Control: Cyclonic dispersion system ensures uniform particle distribution (ISO 12103-2025 certified). Durability: Hard-coated aluminum interior, wear-resistant seals, and self-cleaning filter traps. Smart Monitoring: Real-time particle counter, temperature/humidity logging, and AI-driven failure prediction. Energy Efficiency: Recirculating airflow design reduces energy use by 35% (ENERGY STAR® 2025 compliant).
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Portable Three Phase Electric Meter Test Bench
GF302D
Beijing GFUVE Electronics Co.,Ltd.
The Portable Three Phase electric Meter test bench is used for grid corporation to cablibrate 3 phase electric meter error. It can test three meters error at one time.
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VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Horizontal Vibration Test Systems
G-3 Series
This series was used for the special structure of airbearing guide of inspection for Seismic Detectors andcharacterized is large displacement and high-accuracywaveform. In addition, the use of the Windows seismicdetector controller is easy to operate it.
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Leak Test System
NorCom 2020
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Test Capabilities
Eltek International Laboratories
ELTEK Labs has conducted more Electrical Insulation Systems (EIS) and Component Compatibility Testing (CCT) than all other laboratories worldwide combined. ELTEK Labs is proud to be a Third-Party Testing Laboratory for internationally recognized certifying bodies.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Flexible Test Environments and Integration Services for your Integrated System Tests
TESTERLYZER® Frame 4.0
The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.
