Test

Test Port Adapter Set, 2.4 Mm To 3.5 Mm

The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.

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Integrated Development Environment for the Creation and Execution of IEEE1641 Test Programs

SigBase - Spherea Technology Ltd.

SigBase is an Integrated Development Environment for the creation and execution of IEEE 1641 test programs. It supports the development of tests using flow-charting techniques and the graphical design of signals using newWaveX. It includes fully integrated compilation and signal path allocation software that determines the appropriate instrument and switch path for each signal and test. The run-time system, which is also available as a separate product for use on multiple test stations, controls the operation of the ATS and can provide test results in ATML format.

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Manual Dielectric Constant, Tan Delta & Resistivity Test Set

Eltel Industries

*AC and DC test Voltages switched internally.*Direct digital display of test voltages.*Auto ranging and direct read out of volume resistivity.*Cell constant adjustment and Tan Delta zero correction.*Built-in protection for test sample flash over.

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PCI Express 6 Base Specification Receiver Test Automation

N5991PB6A - Keysight Technologies

The N5991PB6A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 6.0 ASICs

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PCI Express 5 Base Specification Receiver Test Automation

N5991PB5A - Keysight Technologies

The N5991PB5A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 5.0 ASICs

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PCI Express 4 Base Specification Receiver Test Automation

N5991PB4A - Keysight Technologies

The N5991PB4A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 4.0 ASICs.

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In-Line 2-Module In-Circuit Test System; i337x, Series 5i

E9988E - Keysight Technologies

Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.

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CTEK MUS 4.3 TEST&CHARGE Battery Charger and Tester

56-959 - CTEK Power USA

The MUS 4.3 TEST&CHARGE combines an advanced micro-processor controlled battery charger with a battery and alternator test function to provide the ultimate in battery testing, charging and maintenance.

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JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test

StarTest

The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):

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PCI Express 4 U.2 Receiver Test Automation

N5991PU4A - Keysight Technologies

The N5991PU4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express U.2 devices and hosts at 8 GT/s.

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PCI Express 4 M.2 Receiver Test Automation

N5991PM4A - Keysight Technologies

The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.

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IEC60558 Insulation Material Layer Abrasion Resistant Test Device

CX-J16 - Shenzhen Chuangxin Instruments Co., Ltd.

This test is conforms to IEC60558-1 Fig6 and IEC60065 Fig14--16.The test shall be performed by fixing the specimens of thin sheets on a mandrel made of nickel plated steel or brass with smooth surface finish.

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Full Turnkey NVMe 2.5″ SSD Validation Test System

SBExpress-RM - SANBlaze Technology, Inc.

The SANBlaze SBExpress-RM is a complete turnkey PCIe Gen 3 NVMe SSD validation test system. The SBExpress-RM feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives. The hardware can be easily daisy chained for maximum scalability.

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28 Days Test Bench (Single Phase & Three Phase)

SCR ELEKTRONIKS

The SCR Elektroniks 3 station MCB 28 Days and Temperature Rise Test Bench is economically designed to verify the 28 Days Test (21 hr ON, 3 hr OFF Test) as per clause 9.9 of IEC 60898-1 and Temperature Rise of the parts of a Circuit Breaker specified in Table 6 of clause 8.4.1 measured under the conditions specified in clause 9.8.2 of IEC 60898-1.

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Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC

XMC-DCE - Avionics Interface Technologies

Dual channel, high precision Ethernet Test Instrument

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Test Port Adapter Set, 2.4 Mm To 3.5 Mm

Integrated Development Environment for the Creation and Execution of IEEE1641 Test Programs

Manual Dielectric Constant, Tan Delta & Resistivity Test Set

PCI Express 6 Base Specification Receiver Test Automation

PCI Express 5 Base Specification Receiver Test Automation

PCI Express 4 Base Specification Receiver Test Automation

In-Line 2-Module In-Circuit Test System; i337x, Series 5i

CTEK MUS 4.3 TEST&CHARGE Battery Charger and Tester

JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test

PCI Express 4 U.2 Receiver Test Automation

PCI Express 4 M.2 Receiver Test Automation

IEC60558 Insulation Material Layer Abrasion Resistant Test Device

Full Turnkey NVMe 2.5″ SSD Validation Test System

28 Days Test Bench (Single Phase & Three Phase)

Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC