Showing results: 1606 - 1620 of 14433 items found.
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T5835 -
Advantest Corp.
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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RT-500 -
Lumetronics
An Integrating Sphere is a hollow sphere which has its interior coated with a paint that is nearly perfectly diffuse or Lambertian and which has extremely high reflectance. Light energy introduced in an integrating sphere is reflected from the wall and distributed uniformly around the interior. A detector which is placed at a hole or 'Port' in the sphere wall sees an output which is completely independent of the angularproperties of the input light. The independence of the output of a sphere from the angular properties of the input and the uniform internal distribution of light make integrating spheres ideal for many uses.
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T5503HS2 -
Advantest Corp.
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Studio Six Digital
Measure the dB level and frequency of the iAudioInterface2 line input or line output (also works with any dock input audio source).
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Spectrum HS -
Teradyne, Inc.
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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ACMAS Technologies Pvt. Ltd.
WEIBER Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. Weiber provide Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Weiber provide Solar Simulation Test Chamber.
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CVCT-S20 -
Vasavi Electronics
Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.
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69-3165BC-TC -
ELMA Electronic, Inc.
VITA 46.11 compliant IPMC test board verifies communication across the IPMB
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JRE 1720 -
JRE Test, LLC
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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ECU-TEST -
Softing Automotive Electronics GmbH
Automotive Electronics - ECU-TEST is the universal test automation ECU-TEST was designed for test automation and for the validation of ECUs. Standard test tools are already integrated and can be used together in tests. ECU-TEST is used to design, realize, run and evaluate tests.
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UTP Automated Test -
NOFFZ Computer Technik GmbH
Increasing product complexity, centralized test data management and different hardware platforms from different manufacturers – these are typical challenges of test software developers for which we offer specific solutions.Our test software solution is based on certified development environments such as NI TestStand, NI LabVIEW and .NET. Thanks to our expertise based on more than 30 years of experience, we have managed to create a hardware abstraction layer that serves hardware and software developers alike and improves their collaboration. At the same time, it also covers all the needs of maintenance engineers and operators.The UTP Suite for Automated Testing includes a wide range of tools for configuring, developing, analyzing, debugging, and executing test sequences. It helps you speed up your developments while maintaining a consistently high quality standard.
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AutoShock-II Test System -
L. A. B. Equipment, Inc.
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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OPTOWERE-S100 (Fiber Optic Test System) -
Notice
The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component. And the modular architecture of FOTS allows for customized configuration so that the slot of LD Driver, 2 channel VOA, 1 X 4 switch, WDM EDFA and C + L – Band ASE Source can be chosen according to user’s necessities. Main control part and each function module are run by effective and multi-functioned system control program in the base of high speed remote interface, GUI display and the discriminative high speed driving of module and system. This system can provide variety manufacturing and laboratory applications such as general quality test and reliability test of optical component and optical signal transmission test through efficient linkage with other system.
