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Solar PV Test Equipment
Di-log offer a comprehensive range of Solar PV test equipment and tools to service the renewable industry. The range offers irradiance meters, DC current clamp , meters, crimp tools, roof surveying and protective gloves.
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Coax, Contact, Receiver, 20/26 GHz, SF142B, 90 Series modules only
610102109
Primary mating contact 610102110. (May mate with other ITA contacts, as well.)Mechanical SpecificationsDurability 20,000 cyclesContact Material Shield – BrassCenter Conductor – BeCuContact Plating 30µ" Au over 100µ" NiContact Termination Shield – Crimp/ClampInsulator PTFEMating Force 3.0 lbs max [1.36 kg]Electrical SpecificationsCharacteristic Impedance 50 OhmsFrequency Range DC to 26 GHzVSWR 1.15 + .01 (f) GHz w/ SF142 (20 GHz)Insertion Loss .06 x√f(GHz) dBDWV 800 V RMS Shield to cen...show more -
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3U And 6U CPCI CARRIER Board
MS 1715
*Bus Interface:- 32 Bit/64 bit PCI Bus with cPCI Interface*Two slots of 32/64 bit PMC connector interface*Speed of operation up to 66MHz*64 bit, 66MHz PCI Bridge based design*Self Test future
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Digital Input Board
VME-1128
VME-1128 is a 128-bit High-Voltage Digital Input Board with Built-in-Test. This product complies with the VMEbus specification (ANSI/IEEE STD 1014-1987, IEC 821 and 297) with the following mnemonics: A24:A16:D32/D16/D08 (EO): Slave: 39/3D:29/2D Form factor: 6U
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HALT – Highly Accelerated Life Test
HALT is a process used on electronic assemblies and modules to determine weaknesses and the stress limits of a product by temperature cycling and omni-axial random vibration step stress. Inherent weaknesses in a products design and build are stimulated by applying increasing levels of mechanical stress. Within an accelerated timescale, faults in a product can be realised prior to product release and preventing failures occurring during after-sale user operation, very often during the warranty period.
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Active Hot Parameters, Restricted To 50 GHz
S93111B
S93111B active hot parameters available on PNA-X Series network analyzers (N524xB) and provides more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Automated Hipot Accessory Device
CX-K12
Shenzhen Chuangxin Instruments Co., Ltd.
Purpose, To test thin insulating materials for dielectric voltage withstand strength when connected to a hipot tester.
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Sound Level Meters & Calibrators
A sound level meter, also known as sound pressure level (SPL), decibel (DB) meter, noise meter or noise dosimeter is mainly used for measuring sounds travelling through air. It is used to test noise or sound levels by evaluating sound pressure. It uses a microphone to capture sound and the sound is then evaluated in the device. It is commonly used to prevent loud noises to create a better work environment.
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RF Conducted Immunity Test System
RFCI61000-4-6
RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal ...show more -
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Test Services
Our services cover all aspects of test, from test plan generation; to hardware and software development; to validation, correlation, ramp and production. Our experts have deep experience in digital, memory, mixed-signal and RF applications. We also specialize in secured applications that require personalization/root of trust during backend production.
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Probe/SMA
WPRB-8CPGS
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Infusion Device Analyzers
Dual Channel with unique "Synchro-Start" function optimize IV Pump and Analyzer accuracyTest all types of pumps dual-rate, pulsatile flow, and PCA infusion pumpsAutosequence editing, plus test results
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Digital Multimeter
DM3058/E
DM3058 / DM3058E is an economical 5.5-digit digital multimeter. It is designed for the test requirements of high accuracy, multi-function and automatic measurement. It integrates the functions of automatic measurement, multiple mathematical transformations and any sensor measurement. It provides USB, GPIB (DM3058 only), LAN (DM3058 only) and RS232 interfaces.
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Dielectric Material Test Fixture
16453A
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Test Fixtures
Canadian Microelectronics Corp.
This fixture clamps to microstrip or CPW lines at the edge of an RF board and is usable at any position without limit on size of circuit. The base is magnetic and it can be locked and released by a knob to accommodate any kinds of circuit configuration. Available for frequency ranges up to 40 GHz.
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PCI-4461, 204.8 kS/s, 118 dB, 3.4 Hz AC/DC Coupled, 2-Input/2-Output Sound and Vibration Device
779307-01
The PCI‑4461 is a high-accuracy data acquisition module specifically designed for sound and vibration applications. It provides simultaneous two-channel dynamic signal generation and simultaneous two-channel dynamic signal acquisition with six gain settings to configure the input range. The PCI‑4461 also includes software-configurable AC/DC coupling and integrated electronic piezoelectric (IEPE) conditioning to ensure precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. Common applications include audio test; automotive test; noise, vibration, and harshness (NVH) analysis; and machine condition monitoring.
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PXI Resistor Module 2-Channel 2R to 32.7k with SPDT
40-293-132
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI-6122, 4 AI (16-Bit, 500 kS/s/ch), 8 DIO, PXI Multifunction I/O Module
779179-01
4 AI (16-Bit, 500 kS/s/ch), 8 DIO, PXI Multifunction I/O Module—The PXI‑6122 is a simultaneous-sampling, multifunction data acquisition device. It offers analog input, digital I/O, two 24‑bit counters, and digital triggering. The PXI‑6122 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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NIBP Simulator
vPad-BP
vPad-BP, part of the vPad-A1 family, is a NIBP (non invasive blood pressure) simulator designed to test the accuracy and repeatability of the NIBP function on Patient Monitors. User programmable settings allow for easy on site configuration to accommodate new models of NIBP devices.
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Formaldehyde Emission Climatic Test Chamber
TESTEX Testing Equipment Systems Ltd.
The internal test room is made by high quality SUS304 stainless steel; heat insulating material: high density fiberglass wool; insulation material thickness: 80mm.The heat inside the internal room may not be conducted.
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VoLTE Battery Test, Reference Solution
The VoLTE Battery Test, Reference Solution is a fully automated test solution for chipset vendors and device makers who need to follow operators’ VoLTE battery acceptance test plans.
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Regenerative AC Emulator, 600 VAC, 63 A, 45 KVA, 3‑Phase
SL1202A
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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VG Receivers
*ECT offers the widest variety of the VG series style interconnect solutions in the industry.*From Bench Top test applications to complete rack and stack solutions, the VG Series receivers offer the most reliable and economical test based mass interconnect in the world.
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E1/Datacom Transmission Analyzer
DTA-BERT
DTA-BERT E1/Datacom Transmission Analyzer can perform E1 transmission performance test (BERT) and status monitoring on data link (V.35, V.24/RS232, RS449, RS530, X.21). Model T can also perform G.703-64K bit error test, PCM31/30 test and Jitter test. Featuring comprehensive functions, easy operation and compact design, DTA-BERT provides total solutions for E1 line analysis and maintenance.
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Electrical Testing Services
Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)
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Particle Impact Noise Detection (PIND) Test
This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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Package Drop Tester
The Package Drop Tester - PDT-II Series simulates the drop/fall of the packaged finished products to evaluate their damages. All the rhombohedrons, angles and faces of the package container can be tested. so that the manufacturer can know how to take measures effectively to protect Its products against damage during transportation. During dropping, the carrier will rotate to allow the packed products to fall freely.lt can test the faces, edges and corners of the product, with small vibration, and stable and reliable operation.
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Software Capabilities
In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
