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PCI to PCI Express Adapter
SKU-011-01
The PCI to PCI Express Adapter simply turns your computer’s existing PCI slot into a PCI Express slot. This provides a seamless interface for older PCI systems to accept new PCI Express devices – making it possible to utilize old test equipment (computers, PCI extenders, PCI bus analyzers etc.) during migration from PCI to the PCI Express interface.There is no need to purchase additional software or to install new device drivers; simply plug & play!
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USB-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device
779959-01
80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6255 offers analog I/O, digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Corrosion (Salt Spray Tester)
This device is used to test the surface treatment of various materials.
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Wafer Level Test
Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Signal Path Analyzers
HL2200 Series
HYPERLABS HL2200 Series Signal Path Analyzers™ provide high-performance test and measurement capabilities for a fraction of the cost of traditional benchtop systems. These differential, multi-channel instruments are ideal for interconnect characterization, debugging cable assemblies, coupon testing, controlled impedance analysis, and other applications requiring a fast rise time.
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Low-leakage Switch Matrix Family
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wa...show more -
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AVL Battery Test Systems
Supplied as either a free-standing test rig or as a containerized solution, the battery test system supports the evaluation and life-time investigation of electrochemical energy storage systems used in hybrid and electric vehicles.
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Insulating Oil Testers
US, A, AD Series
UDEYRAJ ELECTRICALS PRIVATE LIMITED
Confirms to IS 6792, IEC 156 • Tests insulating oils to IS, IEC, ASTM, etc.• Test voltage to 100kV• Motorized rise of test voltage: 2kV/sec • One piece construction with safety interlocked transparent hood covering test cell• Test voltage can be held at any desired level• kV meter continues to indicate breakdown voltage even after breakdown• Light weight: 36 kg only• Portable, rugged and with cover.
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High Performance High Power DC Electronic Load
IT8900 Series
IT8900 series of high performance high power dc electronic loads provide three voltage ranges 150V/600V/1200V. The power expands to 600kW by master-slave paralleling, and maintains stand-alone functions. 50kHz high speed measurement, six working modes, transient over-power loading capability, CV loop speed adjustment, Measurement function, 25kHz dynamic test and other multiple accurate testing functions make IT8900 series well-suited for types of high power applications.
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Rebound Hammer
Schmidt OS-120PM
The Schmidt OS-120 Pendulum Hammers are designed to test on softer material such as light weight concrete, gypsum boards, fresh concrete and the mortar of joints in brickwork. Their unique design allows easy to handle measurements on vertical and horizontal surfaces.
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High-Speed Laser Mark Handler
MCT MH-3300
MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.
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Oxygen Sensor Tester and Simulator
ST05
The sensor signal output is shown in real time on the bar graph, while a 2 digit alphanumeric display shows the sensor output cross count per second. By pressing the ?Test? button and performing a snap throttle acceleration of the engine, it tests the response time of the sensor and shows a pass or fail result within seconds. Two buttons allows for simulation of rich or lean conditions to monitor response of the engine control module.
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PXIe-1082, 8-Slot, Up to 8 GB/s PXI Chassis
780321-01
PXIe, 8-Slot, Up to 8 GB/s PXI Chassis—The PXIe‑1082 features a high-bandwidth backplane to meet a wide range of high-performance test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to four slots. The chassis features an extended operating temperature range for applications needing cooling performance.
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Force Gauges
A digital force gauge, often called a push pull force gauge or tension and compression force gauge, is used in material testing, quality control and assurance, research, development, product testing, laboratory and educational applications. PCE Instruments' (PCE) digital force gauge products are the benchmark of quality and performance. PCE digital force gauge devices provide measurements in kilograms (kg), grams (g), ounces (oz), pounds (lbs) and Newtons (N) of force (f), depending on the force...show more -
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10-GHz Split Cylinder Resonator
85072A
The Keysight 85072A 10-GHz split cylinder resonator measures permittivity and loss tangent of thin film, un-clad substrates and low loss sheet materials according to the IPC TM-650 2.5.5.13 test method. Designed for robustness and ease of use, it features precision cylinders to ensure high Q factor and loss tangent resolution. Compatible with the Keysight 85071E-300 materials measurement software, the 85072A and can be purchased separately or as part of a complete turn-key solution.
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Raptor SL Primary Test Current Booster
The slave Raptor is visually identical to the master unit but lacks the amplifier, the handheld controller and the auxiliary input/output panels.
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UXA In-band 5G NR/MIMO OTA Testing up to 50 GHz
N9040BM
The N9040BM UXA bundle solution for in-band 5G NR/MIMO OTA testing allows you to make worry-free measurements up to 50 GHz with included 5G measurement apps. Achieve a full 5G NR test setup complete with software, hardware options, and accessories for increased accuracy and precision.
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 1.51MΩ
50-298-144
The 50-298-144 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 1.51MΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Multi-IDE Bundle
The Multi-IDE Bundle provides a LabVIEW and C solution to build applications using multiple development environments. The bundle includes LabVIEW Professional Development System, LabWindows/CVI Full Development System, and Measurement Studio Enterprise Edition. LabVIEW NXG 1.0 the next generation of LabVIEW is included with your purchase of the Multi-IDE Bundle. It minimizes time to measurement with your data acquisition devices and benchtop instruments with engineering workflows for acquiring and visualizing data sets - programming optional. When needed, you can transition to a development approach to customize your test and measurement system.
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End of Line Test System for Automotive Seats
AS519
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Axle Load Simulators
In case vehicles need to perform a brake test in laden condition, one could consider to use a load simulator. In that case the vehicles can come to the brake test unladen; the load simulator will add the required load to the axles.
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Premium Automotive DMM
597
*CATIII 1000 Volt / CATIV 600 Volt Approved & Safety Rated *Safe For Use on Hybrids and EV's *Highest Quality Auto-Ranging DMM Designed for Automotive Trouble Shooting *18 Test Functions, 48 Test Ranges *Peak Min/Max records transient voltages as fast as 1 millisecond *Min/Max Mode records variations in all functions *Also measures Temperature via Temp Probe in Both F and C *Milliseconds Pulse Width Measures Fuel Injector ON-TIME *Inductive RPM Readings for both DIS and Conventional Ignition...show more -
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PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and d...show more -
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SSFDR Software Integration Rig
MS 1112
Software Integration Rig (SIR) is an Industrial PC based system is used to test the SSFDR (Solid State Flight Data Recorder) of SU30 Aircraft. SIR is a PXI based test platform and it is used to test independent and integrated software tests of the SSFDR.
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CMP Mechanical Kits (120x138mm)
230197 – CMP-150-HP
The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.
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Test adapter LRM-LR (Type F)
MA-LML01D
Hachmann Innovative Elektronik
Our test adapter MA-LML01F connects LR measuring devices to standardized LRM string parts. Due to small dimensions and skid-proof design it's easy for him to catch up with everything.
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Test Fixtures
Pneumatically actuated Kelvin connection to custom manufactured device inserts either to complement ART's wide range of precision parametric test equipment or for use with third party measurement hardware.
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True RMS Digital Multimeter
MM68
The MM68 is a True RMS digital multimeter which measures AC voltage up to 750V, DC voltage up to 1000V and both AC and DC current up to 10A.
It measures frequency, capacitance, resistance, and also has duty cycle, diode test and an audible continuity test which sounds at less than 100Ω. The 4½ digit LCD screen displays the results as values and on a 22 segment analogue bar graph. The MM68 also has an auto-power off feature and on screen low battery indication.
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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Semiconductor Package Inspection System
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
