- Pickering Interfaces Inc.
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PXI Resistor Module 2-Channel 2R to 16.3k with SPDT
40-293-131
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Test Sockets
MEMS Device
Patented MEMS Sockets from Ardent Concepts use a unique scrubbing action contact set which is ideal for today’s sensitive MEMS devices, including accelerometers, gyroscopes, MEMS microphones and other specialized devices used in mobile electronics applications
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N-Male to F-Male Test Cable
C75NMFM
The C75NMFM is a high performance 75 Ohm test cable that is ideal for performing lab grade measurements 75 Ohm environments. It supports high accuracy testing with low insertion and excellent return loss up to 3GHz as well as outstanding mechanical durability.
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Primary Injection Test Systems
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Test Port Cable, 1 Mm
11500I
Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
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Universal Test Machines
Single column test stands offer a wide range of materials testing possibilities no matter what your testing needs are.
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Miscellaneous Test Instruments
*Measures cable sag, height and clearance of overhead conductors via ultrasonic signal*Alternative to telescopic measuring poles*No physical connection to cables or wires required*Simple, three-button operation ensures fast, effective measurements
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Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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CTEK MUS 4.3 TEST&CHARGE Battery Charger and Tester
56-959
The MUS 4.3 TEST&CHARGE combines an advanced micro-processor controlled battery charger with a battery and alternator test function to provide the ultimate in battery testing, charging and maintenance.
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Motor Stator Test System
Chroma 1920
Chroma Systems Solutions, Inc.
For electrical safety and quality testing functions of motor stator coils
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Battery Test Equipment
KV Hipot Power Test Equipment Co.,Ltd
Battery testers are the class of instruments designed to assess the condition—the charge, impedance, ripple current, or other measurement—of batteries to ensure they are working as required. Just as batteries have a very wide range of sizes and uses, so do battery testers.
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Coil Test System
CTS
International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
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Waterproof Test Chamber
JL-XC
JL-XC series waterproof test chamber is mainly used for small electronic and electrical products. Such as lamps, electrical cabinets, electrical components and so one. The products are tested for physical and other related properties under simulated climatic conditions. After the test, it is judged whether the performance of the product meets the requirements by verification, so as to be used in the design, improvement, verification and factory inspection of the product. Comply with IEC60529:2001 《Degrees of protection provided by enclosures (IP Code)》, GB4208-2008 《Shell Protection Grade (IP Code)》 14.2.8 Terms and GB7000.1 《Lamps Part 1: General Requirements and Tests》 9.2.9 Terms.
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Meter Test Systems
We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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In-Service Electrical Continuity Test Card
Cisco ONS 15454
The Cisco ONS 15454 In-service Electrical Continuity Test Card is a solution for confirming proper DS-1 and DS-3/EC-1 cabling between the Cisco ONS 15454 shelf assembly electrical interface adapter (EIA) panels and the user's patch panels. The solution is designed for shelf installations that are presently carrying traffic and tests for common wiring errors including electrical shorts, opens, wrong connections, and tip/ring reversals.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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AC Load Bank (Resistive)
K-1000 Resisitive
Kongter Test & Measurement Co., Limited
The kW of a resistive load bank is “real” power in electrical terms. When a resistive AC load bank is used to test an engine generator set the engine will produce its full horsepower rating, dissipate engine exhaust gases, and produce thermal energy into the engine cooling system. The resistive load bank in fact, will completely test the engine and its various systems.
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6000 Series Digital I/O Modules
Series 6000 digital I/O modules record signals from frequency counters, flow meters, encoders, discrete transducers, IRIG time, etc. which are often part of the test environment. These digital signals are time aligned and recorded alongside the system’s analog measurements. High density digital inputs provide an opportunity to easily include facility controls like switches, valve positions, relays, lights, etc. along with the test data. Series 6000 digital I/O modules also provide outputs genera...show more -
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Diagnostic Test Tools For Switching Systems
You know that verification and diagnosis of complex switching operation in a test system has always been an issue. Two of our latest offerings in diagnostic test tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 22.3MΩ
40-251-154
The 40-251-154 is a programmable resistor module with 1 channel which can be set between 3Ω and 22.3MΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Visual Fault Locator ( VFL)
TM315N
The TM315N Economical VFL is an efficient and low cost basic fiber test tool, it provides a visible way to find fiber faults and identify fibers in an optical network during and after installation.
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Relay and Protection Testing
HAOMAI Electric Test Equipment Co., Ltd.
These tests are done to show that protection relays are free from defects during manufacturing process.
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Impedance Analyzer 10MHz-20Hz
IA1021
Feature Specifications: Dual test mode: Analyzer(frequency sweep) and LCR(single frequency).Measurement frequency: 20Hz to 10MHz, 6 digitsFrequency resolution: 0.001% in all frequency rangeFrequency accuracy: 0.01%.DC bias(program): -10V ~ +10V, 0.005V resolution, accuracy 0.5%.Measurement basic accuracy: Impedance +-0.2%, phase: +-0.1°.Display Range: Z: 0.0000Ω-99.999MΩ.
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Universal ADI Tester with Rate Drive
TA-400
A Universal ADI Test Panel built to test one of the Astronautics indicators. Panel includes meter drive capability and a specific synchro auto-rate transmitter circuit that allows rates of up to 355 deg/sec. The standard ARINC capabilities make this a universal type tester.
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MIL-STD-1553 Test & Simulation Instrument for VXI
VXI-1553
Avionics Interface Technologies
Dual redundant, multi stream configurations availableSoftware selectable Transformer, Direct, and Bus Stub Coupling Modes - Concurrent Bus Controller, 31 Remote Terminals, & Bus Monitor operation - Full error injection and detection - Multi-level trigger for capture and filtering - IRIG-B time code encoder/decoder - Real-Time recording and physical bus replayANSI Application interface supporting C, C++, C#, and .NET development - VISA based VXI “Plug & Play’ Device driver provided
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Mini Burst Field Generators
Mini burst field generators are small and handy burst generators used to detect weak spots in the device under test.
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FPGA Testing
Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
