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MCB Magnetic (Instantaneous) Trip Test Bench
The test bench is specially built for low voltage- B, C & D curve MCBs. Specially designed custom built jigs are able to accommodate single, double, three and four pole MCBs. Decades of experience has helped us to design current source (transformer) in a special way such that good current regulation and high accuracy is ensured with a variable range without the use of any variable transformer in the system. The product is better than the competition with conventional technology at a lesser price!
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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ARINC 429 PXI Express Test & Simulation Instrument
PXIe-C429
Avionics Interface Technologies
16, 32, or 64 ARINC 429 Channels (up to 32 Tx & 32 Rx) - Programmable Tx channel output amplitude - Programmable High/Low Speed Operation - Eight (8) Discrete I/O (Four (4) inputs, and four (4) outputs) - Concurrent operation of all Tx/Rx Channels at high data rates - Full error injection and detection • Data capture filtering, 100% bus recording, and physical bus replay - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B time code encoder/decoder with free-wheeling mode - Application Interface supporting C/C++, C# and VB.NET Development - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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Test Automation
TetraMAX®
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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MIL-STD-1553 A / B Test And Simulation 3U PXI Module
PXI-C1553
*Dual redundant*1, 2 or 4 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*PXI trigger on 1553 bus events*10 programmable, discrete I / O (up to 30V)*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems
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Bite Test Clamp
G201A29-30
Simulates a child biting the accessible area of child-related products. The part of the child-related products being tested is placed in a bite test clamp & a specified force is applied for a specified period. The child-related products is then tested to ascertain whether or not any hazards result from the bite test such as sharp points/sharp edges/small parts.
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Mechanical Test Service
The mechanical properties of an electronic system enclosure have to be stressed in order to determine the robustness of the total system. The multiple electrical interconnections have our special attention.
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ARINC 429 USB & LAN Test & Simulation Module
UXI-429
Avionics Interface Technologies
8 Channel (4Tx/4Rx) & 16 Channel (8 Tx/8 Rx) models available - Programmable Tx channel output amplitude - Programmable high/low speed operation - Concurrent operation of all Tx/Rx channels at high speed rates - Full error injection & detection - Rate-oriented label transmission - Label selective trigger for capture/filtering - Real-time recording & post analysis of multiple channels - Physical Bus Replay - Onboard IRIG-B time code encoder/decoder for Synchronization - Time Synchronization to IEEE 1588 via Ethernet LAN port - 10 Discrete I/O Interfaces (5 Outputs / 5 Inputs)
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HF test adapter
High-frequency test adapters (HF adapters) from INGUN are designed as a replacement set system, consisting of a manual test adapter (MA 21xx and 32xx series) and a high-frequency shielded replacement set from the ATS MAxx/HF series.
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Test System
2000/DATS
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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DOC Drawout Case Test Plug
The DOC Drawout Case Test Plug provides an easy way to measure current and provide test access to GE style drawout case relays and meters.The DOC features normally-closed internal contacts. Upon insertion into the case, it brings the internal drawout case contacts out for easier access. Current Measurement Probes serve to redirect current circuits without disturbing them. Disconnect pins can be used to disable specific contacts and short-circuit currents.
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Line / Hood Test Equipment
The units will test any length, class, or style of hose in today's market.
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160MHz Test System
IQxel-MW 7G
Platform solution for 802.11 a/b/g/n/ 802.11ac, 802.11ax, and 802.11be testing in the 2.4 and 5 GHz and 6 GHz bands and the most popular wireless connectivity standards (Bluetooth®, Bluetooth® 5, Bluetooth® 5.1, Bluetooth® 5.2, Zigbee, Z-Wave) as well as LPWAN technologies (Sigfox, LoRa).
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Manual Test Stands
The Chatillon manual test stands are easy-to-use solutions for force measurement applications.
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Test Fixtures-Assemblies
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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ARINC 664 Part 7 Test & Simulation Interface for PCI
PCI-C664-V2
Avionics Interface Technologies
Supports IEEE 802.3 10/100/1000 Mbit/s Full-Duplex Ethernet links - Utilizes SFPs to support both copper and optical interfacesSimulates multiple ARINC 664 End Systems - VL traffic shaping and input VL redundancy management - Supports up to 4K Output VLs and 4K Input VLs - Supports up to 16K Sampling & Queuing output message ports and up to 16K input Sampling & Queuing message ports - ARINC 653, UDP, IP protocols managed onboard - IRIG-B time code encoder/decoder - Automatic message sequencing & periodic data generated onboardError Injection including Runt Frames, Short IFG, and Invalid MAC FCS - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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Accessibility Test Probes
TF-24 Series
Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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ATPG with Embedded Compression
TestKompress
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
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802.1 Core Test Software
IOL vIOLett®
The same tool used for testing everyday in the UNH-IOL Ethernet Switching Protocols (ESP) Testing Services is now available to use in your own labs. See the below list of available testing packages. Each test package contains a complete set of tests for use with IOL vIOLett® Software, which is included with any test package license.
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Multi-channel Optical Power Meter For Swept Test System
MPM-210HMPM-211, 212, 213, 215
Our MPM-210H is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings（AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210H allows the user to complete real-time high precision IL measurements.
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Test a Service
Enabling the automation of regression testing, verification, and validation within a functional safety environment
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Engineering Test & Development Tools
Besides DG’s aftermarket diagnostic tools, DG Technologies also offers several engineering tools for vehicle network development. DG’s hardware and software products are used by a variety of engineering customers such as test engineers, production engineers, and fiber optic testers. Our customers use DG interfaces for manipulating messages, datalogging, and ECU end-of-line testing over various multiplex networks.
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Dust Test Chamber
CX-S56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and Dust Test Chamber Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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Environmental Test Chambers
A system that enables users to manipulate the environmental conditions of an enclosed space to run controlled tests on a subject.
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AI-based Test Generation
Our AI-based test generator can automatically automate your tests. Using recheck-web, these tests not only detect functional differences, but also visual differences.
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Manual Test Adapter With Rigid Needles
Frequently, manual test adapters are required for the functional and IC test. In order to contact the test subject, spring contact probes are often installed in the adapter, but the pitch of the spring contact probes is approx. 1.27 mm and thus too great for certain applications.
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Test Automation Platform Deployment System
KS8000A
TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Handover Test Systems
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
