Showing results: 1246 - 1260 of 7335 items found.
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Audiomatica
MIC-01, MIC-02 and MIC-03 are low cost precision condenser electret microphones perfectly suited for laboratory and on-field acoustical measurements. They have identical performances but differ for their physical size; MIC-01 is preferable for fixed laboratory installations while MIC-02 is highly manageable due to its short length; MIC-03 is the best where space saving is a must. Their frequency response is individually tested against specifications and the sensitivity value is supplied. MIC-01 & MIC-02 & MIC-03 can be directly connected to your CLIO system's input.
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Dr-Jordan-Design
All these measurement microphones have a XLR connector and require a phantom power. They can be connected to specially equipped soundcards or pre-amplifiers, only.
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MPD-100 -
R&J Measurement
Mobile meter designed to continuous measurement of ferrite contain during displacement of the sensor along the tested object. The meter contain the measurements memory and all obtained date could be display on LCD.The meter contain also RS232 interface which allow the data transmittion to PC.
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MP-100 -
R&J Measurement
Mobile meter designed to measuring the magnetic permeability lower as 3 and allows to control the elements with small overall dimensions and the elements with complex shapes as well as it allows the evaluations of heterogeneity of the elements with big overall dimensions. The meter contain the measurements memory and all obtained date could be display on LCD. The meter contain also RS232 interface which allow the data transmittion to PC.
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M300 -
CAPRES A/S
The semi-automatic microRSP-M300 by CAPRES A/S is a unique R&D tool for sheet resistance measurements of conductive surfaces in micro scale. Like the automatic microRSP by CAPRES A/S the semi-automatic microRSP makes use of the micro 4 point probe characterised by having a probe pitch of 1000 times smaller pin spacing/pitch than that of conventional probes.
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M200 -
CAPRES A/S
The window of acceptable sheet resistance is shrinking with each technology node resulting in increasingly more rigorous standards for scale and accuracy of metrology tools. The shortcomings of traditional types of 4 point probes are becoming more and more evident. By developing the microRSP-M200, a unique tool for measuring the sheet resistance of conducting films, hereunder ultra shallow junctions (USJ’s), CAPRES A/S has responded to the growing need for reliable sheet resistance measurements on micro scale.
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Biophotonics Solutions Inc.
The Microscope Detection Unit (MDU) is designed to facilitate femtosecond pulse compression and measurement directly at the focal plane of a microscope, inverted or upright. It contains a nonlinear crystal for second harmonic generation (SHG) as well as other optical elements to separate SHG photons from the laser light and to couple the SHG light into a compact spectrometer via SMA-connected fiber.
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Flex One -
ZOLIX
Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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508 PV -
CRAIC Technologies
The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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USPM-RU III -
Olympus Corp.
The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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MCA3000 -
Tektronix, Inc.
Offering up to 40 GHz measurements, the Tektronix MCA3000 Microwave Analyzer Series packs many different functions into one feature-rich instrument. The integrated power meter and two additional timer/counter channels offer you even more test functionality than other microwave analyzers on the market. With unprecedented resolution, you can capture very small frequency and time changes. And with the industry's most comprehensive analysis modes, including measurement statistics, histograms, and trend plots, you have the tools you need to quickly and accurately analyze your signal.
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Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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AET Associates, Inc.
This system enables fast and non-destructive measurements of materials having various shapes, including thin films. Enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.
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D-Probe -
PacketMicro Inc.
With only two signal pins, D-Probes can perform accurate measurements without the need of nearby ground pads.
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GL840 Series -
Graphtec Corporation
Modules allow wide range of measurements. Suitable for a variety of measurements due to flexible combinations