Showing results: 5131 - 5145 of 7336 items found.
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tec5 AG
The tec5 UV systems offer fast and reliable measurements starting from 190 nm. The modular system platform enables multiple integration options for easy and efficient handling of various measurement tasks in research and production applications. Due to the system’s dedicated design for industrial processes, even applications in harsh environments are possible without any difficulties, including simple and safe connection to process control systems utilizing common interface concepts established on the market.
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USonic-R -
AMETEK Drexelbrook
The Drexelbrook family of ultrasonic technology products offers a line powered version for non-contact level measurement of liquids and slurries for level, distance, volume and open channel flow.The USonic-R multifunctional level measurement system can be used for a wide range of applications ranging from simple indication of level to more demanding two channel inputs such as differential level and submerged flow.This ultrasonic level transmitter is easy to use. Simply set the measurement range directly in inches, feet, millimeters, centimeters or meters via the menu driven display.
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TM400 Compact -
Lectrosonics, Inc.
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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FAMS-R5 -
Ono Sokki
FAMS-R5 uses the system with high-speed communication, FAMS High-Speed Link2, to share data with each unit.Sensors can be directly connected to the measurement unit in a laboratory.Simple wiring and highly accurate measurement can be achieved.By adding the MCU that can calculate the control model with MATLAB/Simulink, it also supports the simulation bench.
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NI
The USB Temperature Measurement Bundle includes a CompactDAQ Chassis with the C Series Temperature Input Module for temperature measurements. The USB Temperature Measurement provides a portable, USB-based sensor measurement system with features such as anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements.
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MD Series -
Ono Sokki
The MD series torque detector is designed to measure the torque output from compact & precision type motors used in the electric & electronics industry, the automotive industries and so on, featuring outstanding low inertia and low starting torque. With the phase differential system, it can realize low capacity torque measurement as small as 0.001mNm.
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T24-PA -
Mantracourt Electronics Ltd
The T24-PA transmitter module collects and processes pulse related measurements, such as speed of rotation, proximity, flow and count, forming part of the T24 modular telemetry system. The data transmitted by the T24-PA can be received by multiple T24 receivers that include displays, handheld readers, analogue outputs, relay modules and computer interfaces.
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E + E Elektronik Ges.m.b.H
The wireless transmitters in the EE240 series combine state-of-the-art sensor technology with excellent transmission reliability. Installing the wireless measurement system is very easy and one network can contain up to 500 transmitters. Wireless transmitters EE244 and EE245 are ideally suited for wireless, high-quality measurement of humidity and temperature.
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E3310 -
Advantest Corp.
The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Bunkoukeiki Co., Ltd
As a spectrometer, we have been manufacturing various vacuum ultraviolet spectroscopy systems mainly based on the Seya Hokaoka type spectrometer since 1977 when the company was established.The newly developed KV series is a system that can measure up to 120 nm with a nitrogen gas purge only by using a special optical element and a spectroscope of newly developed optical arrangement, eliminating the need for a vacuum pump and the like.
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SiTek Electro Optics AB
Functions according to the Lateral Effect Photodiode principle. It is an analogue device and therefore displays excellent position resolution. The resolution is determined by the system signal-to-noise ratio. It is operated in the biased mode. Typical applications include: distance andheight measurement, alignment, position and motion measurements and vibration studies
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KPM Analytics
Vision inspection systems use a series of high-speed cameras and imaging software to detect and measure random objects as they move along a conveyor belt. Custom software and measurement algorithms can determine the size, shape, color or composite measurement of any object and convert this into standard units for quality control. Bench, over-line, and in-line systems are available and provide real-time 100% inspection and rejection of any production line.
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Ono Sokki
This system measures fuel consumption of an engine operated in steady state with high accuracy.•0.02 to 90L/h and 4500:1 wide range measurement (H type)•Keep the temperature change of the circulation flow passage in the device within ±0.1℃ (variation per 1 minutes) to provide stable measurement.•Pipe arrangement which minimizes air bubbles that enter the system reduced the factor error causes.•Resolution has been improved by using an encoder with 1200P/R (Ten times of number of pulses to the existing model.)
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WT-425 -
Tosei Engineering Corp.
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Automation Products, Inc.
Viscometer utilizes a unique vibratory principle to provide continuous measurement at on-line process conditions. This eliminates the need for sampling and provides exceptional accuracy.