Showing results: 4261 - 4275 of 7326 items found.
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EC-80 -
NAPSON Corp.
*Easy operation and compact design*Auto-measurement start by inserting a wafer under the probe*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range
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PVE-80 -
NAPSON Corp.
*No damage measurement by non-contact Pulse-Voltage excitation method*Easy to measure & carry around, Removable stage plate*Easy operation and data processing by PC with Software*Measurement result can shown by 3 types of measurement unit (Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])*Pulse-Voltage excitation method : Pat. No.5386394 Joint development with Chiba Univ.
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EC-80P (Portable) -
NAPSON Corp.
*Auto-measurement start by probe head contacting to sample*3 measurement modes for wafer resistivity, bulk resistivity and sheet resistance*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range*Resistivity probe can be changed by sample’s resistivity range
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HF-100DCA -
NAPSON Corp.
*Global standard model for the lifetime test of silicon bulk*JIS direct current anodizing method*Data processing by digital oscilloscope and PC with software
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NC-110 (NC-110PV) -
NAPSON Corp.
*Possible to measure sheet resistance without contact by Max. 3 types of probes*Suitable for production line and tranceportation system*Connect to host PC by LAN to send measurement command and data
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HF-90R -
NAPSON Corp.
*Silicon bulk, Prismatic shape (JIS code), Ingot condition*Non-contact photoconduction vibration decay method*Data processing by digital oscilloscope and PC with software
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DUORES -
NAPSON Corp.
Easy to measure sheet resistance & carry aroundReplaceable hand-held probes for Non-destructive & Contact type
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NC-60F/RS-1300N -
NAPSON Corp.
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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WS-3000 -
NAPSON Corp.
*Automatic probe head selection(exchanger) among 4 kinds of probe head*[No need to exchange a probe head by each different sample measurement]*Edge 1mm measurement is available by dual meas. mode*High cost performance from high speed measurement*FOUP compatible, GEM / SECS compatible
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TCR-600 -
NAPSON Corp.
*Controlled Thermo-chuck (room temperature~600℃/less than 20 minutes)*600C compatible probe head with 1mm linear*Controlled with vacuum sensor, digital thermo-meter, vacuum gauge and gas flow meter*Temperature measuring accuracy:±(0.5% + 1℃)
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WS-8800 -
NAPSON Corp.
*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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Teledyne Marine Cormon
The Corrosion Sensor has been designed to the highest industry standards to provide customers with dependable and accurate measurement of metal loss within a high integrity mechanical package for subsea corrosion monitoring.
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Teledyne Marine Cormon
The Erosion sensor has been designed to the highest industry standards to provide customers with dependable and accurate measurement of metal loss through erosion within a high integrity mechanical package. Teledyne Marine can provide in-house turnkey systems including sensor, cable and interconnect.
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ML4039-JIT-BTP -
multiLane
The ML4039-JIT series is a state of the art 4 Lane Pulse Pattern Generator and Error Detector with Jitter Generator & Equalizer up to 30 Gbps. It is fully featured for lab and production testing of systems, components, and Electro-Optical Modules. It has low intrinsic jitter – typically 330 fs – and features built-in jitter and interference modulators specifically designed to enable easy CAUI4 compliance testing.
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multiLane
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.