Showing results: 5431 - 5445 of 7335 items found.
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Electrical Char -
Frontier Semiconductor, Inc,
Full line of front end electrical characterization tools: Sheet Resistance, leakage, and CV-IV measurements.
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VideometerSLS -
Videometer A/S
Measure graininess, viscosity and mouth-feel in yoghurt and other viscous products – in only 2 seconds. VideometerSLS is a fast, and non-contact measurement technology packaged for ease-of-use in the laboratory or at-line in production. It measures a number of parameters for efficient characterization of viscous products. VideometerSLS has a combination of 2 measurement principles and on top Videometer's advanced imaging software:
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Keysight Technologies
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Series provides a wide selection of IV analyzers suitable to your specific measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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FlowCam® Macro -
Fluid Imaging Technologies
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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Hinds Instruments, Inc.
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Spraytec -
Malvern Panalytical Ltd
Malvern Panalytical's Spraytec laser diffraction system allows measurement of spray particle and spray droplet size distributions in real-time for more efficient product development of sprays and aerosols. It has been specifically designed to address the unique requirements for spray characterization and deliver robust, reproducible droplet size data.
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AURIGA 4850 -
Focus Microwaves
Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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NED-LMD W-Series -
Gamma Scientific Inc.
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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2400 -
Photon Kinetics
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
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P104 -
Photon Kinetics
The P104 Preform Analyzer provides fast and repeatable measurement of the critical characteristics of optical fiber preform index profiles. Like the 2600 Preform Analyzer, measurements are automatic, reliable, and require a minimum of operator skill. However, the P104 also possesses unique capabilities that are highly beneficial for some specific preform types and processes. The P104's dynamic aperture option greatly improves the characterization of many finely structured preforms, and its patented silica measurement cell minimizes the thermal effects that plague some preform characterizations.
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NED-LMD WG Series -
Gamma Scientific Inc.
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Paios -
FLUXiM
Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
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MagCam NV
The fully digital and compact measurement system connects to a computer via a single USB cable, making the measurement data directly digitally available. The Magcam maps are analyzed in real time by the MagScope measurement & analysis software and its optional add-on software modules, which provide powerful measurement and analysis capabilities for a complete quality control and characterization of permanent magnets and magnet assemblies.
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TriboLab CMP -
Bruker Nano Surfaces
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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871 Series -
Bristol Instruments, Inc.
The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
