Showing results: 4246 - 4260 of 7326 items found.
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PD-LT -
ndb Technologies Inc.
The PD-LT allows online partial discharge detection on cable accessories such as cable head for safety and maintenance purposes.The PD-LT indicates the intensity of the partial discharges, converting the electrical charge units (pC) into decibels (dB). Thus the reading is kept as a simple intensity level indication, proportional to the probability of a fault's presence in the tested medium voltage accessory.The remote display gives a dB value of the probe's measurement. The dB value will vary along with the discharges indicators on the PD-LT probe. The measurement range is from 0 to 65dB and the display will show ''OL'' if the reading is over 65dB.
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LRM-10 -
ndb Technologies Inc.
The LRM-10 is a 10A micro-ohmmeter kit designed to measure low resistance for electrical interconnections integrity testing. The LRM-10 has a range from 0.01µΩ to 200Ω. It comes with heavy duty four points probes and it is compatible with a great variety of optional accessories.
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CAEN S.p.A.
CAEN SyS is the new Systems & Spectroscopy Division of CAEN Spa. Such Division relies upon an extremely strong foundational knowledge of nuclear measurement instrumentation in developing Radiation Measurements Systems and Spectroscopy Solutions. These systems and solutions are perfectly suited to operations involving Nuclear Fuel Facilities, Nuclear Power Plants, Measurements Laboratories, and Security Applications.
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742 Family -
CAEN S.p.A.
The 742 is the Switched Capacitor Digitizer family, based on the DRS4 chip by PSI, with the highest sampling frequency (5GS/s) and channel density. It can record very fast signals from scintillators coupled to PMTs, Silicon Photomultipliers, APD, Diamond detectors and others, and save them with high efficiency and precision for advanced timing analysis. The 742 family has an additional channel (two channels in case of VME boards) which can be used as time reference for time of fight measurements. The resolution of this kind of measurements can reach up to 50 ps.
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µsprint -
NanoFocus, Inc.
With an unparalleled scanning rate, the µsprint sensors are the ideal tool for quality and process control with high throughput rates and precise measurements. As a standalone solution for laboratories, with machine safety enclosure for industrial production environments, or as an OEM solution – the μsprint technology can be inegrated flexibly everywhere.
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CRESBOX -
NAPSON Corp.
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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FLA-200 -
NAPSON Corp.
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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RG-100PV -
NAPSON Corp.
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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CRN-100 -
NAPSON Corp.
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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NC-10 (NC-20) -
NAPSON Corp.
*Easy operation and data processing by PC*No damage measurement by non-contact eddy current method*Replaceable probes by meas. range (*Second or more probe is for the option)*1 point measurement of center position*5 types of model for each measuring range*Temperature correction for silicon wafer function
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NC-6800 -
NAPSON Corp.
*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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NC-3000R -
NAPSON Corp.
*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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NC-700 -
NAPSON Corp.
*Inline measurement module for moving substrates such as PET film, glass or paper*Continuous measurement(~24h) in Roll to Roll with OFF-SET FREE capability system*Various applications from the research and development to the production line
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NC-600 -
NAPSON Corp.
*Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer*1 to 10 number of probe by sizes of glass is attachable*Glass collision prevention function*Continuous test data report to the host computer
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NC-80MAP -
NAPSON Corp.
*Possible to measure wide range of sheet resistance by installing Max. 4 probes*Min. 7 mm position from edge can be measured*User programable measurement pattern & programmable measuring pattern