Showing results: 5206 - 5220 of 7326 items found.
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G440XE -
Elmika
The G440XE Sweep Generators are portable powerful wideband general-purpose sources for swept and CW microwave measurements in local or remote operation modes. It incorporates the efficiency of micro-processing control with state-of-the-art BWO oscillator to produce a high performance sweep generator system suited for either manual or automated measurements.
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Bruker AXS GmbH
Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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OMDVD Version 1 -
Dayton Audio
The Dayton Audio OMDVD Test DVD brings the ease of the OmniMic V2 system to measurements of 5.1-channel audio systems. It’s the essential tool for professional installers and home theater enthusiasts to ensure proper audio calibration and optimization of a home theater or multichannel music system for the highest possible performance. The full functionality of the OmniMic V2 measurement system is now available through every channel of a 5.1-channel audio system thanks to the OMDVD Test DVD’s suite of high-quality test tones, and an intuitive menu structure that has been optimized for ease of use.
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TM400 -
Lectrosonics, Inc.
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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Tropel® FlatMaster® -
Corning Inc.
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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6360-HR-CD -
MicroSense, LLC
The Model 6360-HR-CD Stamper Thickness Measurement System is a semi-automated thickness gauging platform and data analysis system for the measurement of optical media stampers. Patented non-contact capacitive sensors determine the stamper thickness without any damage to the stamper. A personal computer is provided to run the gauging platform, acquire measurement data and display results.
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ModuLab XM ECS -
Ametek Scientific Instruments
ModuLab XM has modularity at the center of its design. Each system can be configured for electrochemical, materials, and photoelectrochemistry measurements. At the core of each of these is the Frequency Response Analyzer. The accuracy from design to calibration is at the heart of Solartron's success and reputation for impedance measurements.
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SF 105 -
LMT Lichtmesstechnik GmbH
Computer controlled measurement equipment to measure the time response of illuminance or luminous intensity when illuminated with rapidly changing values, e.g. flashes.
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NFC Xplorer -
CISC Semiconductor GmbH
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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3938 -
TSI Inc.
TSI''s newest Scanning Mobility Particle Sizer SMPS™ spectrometer is widely used as the standard for measuring airborne particle size distributions. This system is also routinely used to make accurate nanoparticle size measurements of particles suspended in liquids. The National Institute of Standards and Technology (NIST) uses a TSI DMA to size 60 nm and 100 nm standard size reference materials. SMPS spectrometer sizing is a discreet technique in which number concentrations are measured directly without assuming the shape of the particle size distribution. The method is independent of the refractive index of the particle or fluid, and has a high degree of absolute sizing accuracy and measurement repeatability. TSI''s Model 3938 is the 3rd generation of SMP, trusted by researchers for over 30 years.
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831C SoundAdvisor -
Larson Davis, Inc.
The SoundAdvisor Model 831C Sound Level Meter is designed to make noise measurement easy. Due to its color display, connectivity, extensive software features and small form factor the SoundAdvisor is an ideal choice for handheld operation. Attended measurements are simplified, with the ability to control and monitor data via any PC or mobile device with a standard web interface. Designed with the acoustic professional in mind, the SoundAdvisor offers an elegant solution for complex needs in an easy to use system.
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S3088 ultra -
Viscom AG
*Extremely fast AOI camera system.*Scalable, modular camera technology with 3D measuring function.*Greatest inspection depth: reliable inspection of 03015 und fine-pitch components.*Maximum fault coverage - 9 views plus 3D measurement.*Best resolution at angled views.*Height measurement of components.*Extremely high throughput due to FastFlow Handling.*Revolutionary simplicity in AOI operation with vVision.*Fast program generation with vVision/EasyPro.*Reading DataMatrix code, bottom up.
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Gooch & Housego PLC
Our family of extremely versatile, turn-key spectroradiometric measurement systems is capable of performing highly sensitive measurements to satisfy the most demanding industrial and scientific applications. An extensive variety of accessories coupled with powerful software ensures these systems can be tailored to suit your requirements as well as assure the expandability of the system for future needs.
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Gemini Series -
n&k Technology, Inc.
The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates. These tools are used extensively for solar cell, flat panel and photomask applications. The tools belonging to the Gemini-TF Series are based on unpolarized Reflectance (R) and unpolarized Transmittance (T) measurements, with a 50μm spot size for both R and T. R and T are simultaneously measured to determine film thickness and n and k spectra from 190nm – 1000nm
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Ametek Brookfield
The difficulty with viscosity measurements of hot melts and liquids at elevated temperatures has been in maintaining accurate temperature control that is consistent from sample to sample so that meaningful data could be obtained. The Brookfield Thermosel solves this problem by providing a stable, precisely controlled sample environment. This, together with the inherent accuracy of the Brookfield Viscometers, is fundamental to the Thermosel System, which produces viscosity measurements that are not only accurate but entirely reproducible.
