Olympus Corp.
Manufacture and sales of precision machineries and instruments.
- (81) 3-3340-2111
- Shinjuku Monolith, 3-1 Nishi-Shinjuku
2-chome
Shinjuku-ku, Tokyo 163-0914
Japan
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Inspection System
CIX100
The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
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Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Benchtop XRD System
BTX
The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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XRF and XRD Analyzers
Vanta
The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high t...show more -
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Portable XRF Analyzer
GoldXpert
XRF is a widely used, proven, and accepted method of chemistry analysis and determination of purity and fineness of precious metals. XRF analysis is a multielemental testing alternative that is quicker and less expensive than fire assay and chemical tests. XRF provides on-the-spot analysis of your silver, platinum, and PGM metals and impurities, making it an easy way to boost customer confidence and ensure dealer reliability.
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Portable XRF Analyzer
X-5000
The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Normal Incidence Shear Wave Transducers
Single element normal incidence Shear Wave Transducers contact transducers introduce shear waves directly into the test piece without the use of refracted wave mode conversion. We recommend the use of our SWC shear wave couplant for general purpose testing.
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Videoscope
IPLEX G Lite
The IPLEX G Lite industrial videoscope packs powerful imaging capabilities into a small, rugged body. Lightweight and able to go almost anywhere, users working in challenging applications have a remote visual inspection tool with the image quality and ease of use to get the job done.
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Portable XRD System
TERRA
The TERRA Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portable XRD, provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-field analysis.
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Micro Spectrophotometer
USPM-RU III
The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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Digital Color Camera for Microscopy
LC30
The LC30 is a 3.1 megapixel digital color camera for microscopy that combines versatility with performance. The LC30 is the ideal entry-level microscope camera for quality bright-field imaging - suitable for material science applications. The Olympus LC30 color camera for microscopy combines versatility with performance. With up to 37 frames per second (fps), faithful color reproduction, full integration into Olympus imaging platforms, and an excellent cost-performance ratio, the LC30 is the ide...show more -
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Precious Metals Handheld XRF Analyzer
The DELTA Precious Metals XRF Analyzer provides fast, accurate alloy chemistry and karat classification with one nondestructive, non intrusive test. Whether importing precious metals, selling or producing jewelry, or processing scrap metal, Innov-X XRF is the ideal choice.
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Cleanliness Inspection System / Microscope
CIX90
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.