Showing results: 1876 - 1890 of 7326 items found.
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Kreon Technologies
Our 3D scanners are equipped with a probe, which means that there is no need to disconnect your scanner when changing from scanning to probing and vace versa. the flexability of our scanners saves time and ensures reliable 3D measurements.
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920D -
CH Instruments, Inc.
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Verios G4 XHR SEM -
Thermo Fisher Scientific Inc.
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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KP Technology
Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Renishaw Inc.
Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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SICK Sensor Intelligence
The reliable way to detect low dust concentrationsLight scattering by dust particles is a measurement principle that allows even very low concentrations of dust to be detected. Depending on the system-specific requirements, either forward scattering or backward scattering can be used in this context. Both measurement principles return stable and reproducible measurement results, regardless of the gas velocity, humidity, or dust particle charges.
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G-Explorer -
ROM-Elektronik GmbH
Highly sensitive, reliable and innovative radiation measurement technology. Explore and discover radioactive radiation in the environment with reliable accuracy! Use the graphical data preparation to find underground mineral deposits, such as water, caves and geological disturbances, even on large areas.
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Yokogawa Test & Measurement Corp.
ScopeCorder product family provides flexible and high-performance multi-channel test instruments by combining the benefits of a mixed signal oscilloscope and traditional data acquisition recorder. The ScopeCorder delivers high signal fidelity and long term recording for both high speed transients and low speed trends to meet the most stringent measurement requirements.
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Yokogawa Test & Measurement Corp.
ScopeCorder product family provides flexible and high-performance multi-channel test instruments by combining the benefits of a mixed signal oscilloscope and traditional data acquisition recorder. The ScopeCorder delivers high signal fidelity and long term recording for both high speed transients and low speed trends to meet the most stringent measurement requirements.
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Guangzhou Amittari Instruments Co.Ltd
Screen Tension Tester applicable to general wire mesh tension and steel mesh tension measurement. Suitable for screen printing and screen stencil measurement, high accuracy. The ideal and necessary tool for production of precise screen and steel mesh.
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BCO, Inc.
SDAP-Torque has detailed instructions and pictures for each step; the process includes assembly instructions, incremental inspection, and limit values for the torque to be applied at mechanical fasteners. Commercial torque sensor instrumentation was combined with unique LabVIEW software developed by BCO to cue the operator, provide real-time visual feedback of each torque measurement, assure and report every step in the assembly process, evaluate torque compliance and produce a QC Report.
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SGDK350A (SD card / eMMC tester) -
TDK SolidGear Corporation
This product is compatible with SD Memory Card Physical Layer Specification Version 3.01. Supports UHS-I interfaces (SDR12,25,50,104,DDR50). There is a SpeedClass measurement mode that measures SpeedClass that supports SDXC, and a simple performance measurement mode that performs sequential / random access to any address. In addition, the SD card access library (for Visual Studio) is open to the public, and any command can be executed on the SD card in any pattern.
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LV 7390 -
Leader Electronics Corp.
The LV 7390 is a rasterizer that can measure up to four SDI signals simultaneously.It supports 3G-SDI, HD-SDI, and SD-SDI input signals.The measurement screen can be output at full HD resolution to SDI and DVI-I. The SDI output supports 3G-SDI and HD-SDI.The LV 7390 is equipped with a free layout function that enables the displayed screens to be arranged freely. It can be customized according to your application. An enhanced layout function, which is an advanced version of the free layout function, comes standard.Further, the new operation keys allow quick operation.Additional options are available for 4K formats and loudness display.
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SIGLENT Technologies
SDM3045X is a 4½ digit digital (66,000 count) multimeter incorporating a dual-display and is especially well suited for the needs of high-precision, multifunction and automatic measurement.
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Analysis Tech Inc.
Analysis Tech Semiconductor Thermal Analyzers measure semiconductor junction temperatures using the electric method of junction temperature measurement on all types of semiconductor devices.