Non-contact Sheet Resistance/resistivity Measurement Instrument With PC

NC-10 (NC-20) - NAPSON Corp.

*Easy operation and data processing by PC
*No damage measurement by non-contact eddy current method
*Replaceable probes by meas. range (*Second or more probe is for the option)
*1 point measurement of center position
*5 types of model for each measuring range
*Temperature correction for silicon wafer function

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Topics

Measurement
PC
Instruments
Current Probes
Wafer Probes
Data Center
Non-contact Temperature
Eddy Current
Probes
Current