Showing results: 9601 - 9615 of 9910 items found.
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TTTech Computertechnik AG
The TTEDevelopment System A664 supporting the ARINC 653 interface is an out-of-the box starter kit for integrating TTEthernet’s deterministic network technology with the time and space partitioned real-time operating system VxWorks 653. The easy-to-use and ready-to-run solution includes hardware and software as well as a Distributed IMA demo application showing deterministic communication among the different real-time operation system partitions. The system supports up to 1 Gbit/s speed, enables event-driven Ethernet (IEEE 802.3) as well as rate-constrained (ARINC 664 part 7) and hard real-time (Time-Triggered Ethernet SAE AS6802) communication on the same network with the option to synchronize IMA modules using the fault-tolerant TTEthernet network time base.
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eBOX560-900-FL -
Axiomtek Co., Ltd.
The eBOX560-900-FL employs a NVIDIA Jetson™ TX2 module which has a powerful 64-bit ARM A57 processor; a 256 CUDA cores with NVIDIA® Pascal™ GPU Architecture; 8GB of LPDDR4 memory; and 802.11ac Wi-Fi with Bluetooth. It also supports NVIDIA JetPack 3.2 SDK including TensorRT, cuDNN, CUDA Toolkit, VisionWorks, GStreamer, and OpenCV, all built on top of L4T with LTS Linux kernel. The extremely compact system is your superb choices for AI, deep learning, and edge computing. Its tough construction is IP40-rated, and it has an extended operating temperature range of -30°C to +60°C (-22°F to +140°F) and up to 3G vibration endurance.
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Panda Microwave Limited
Panda Microwave design, manufacture, and support a wide variety of Power Amplifier. RF amplifiers product line from Panda Microwave consists of low noise amplifiers, Power Amplifier Module and Solid State High Power Amplifier. Our Power amplifiers cover frequency range from 100MHz to 50GHz and used Thin-film Technology. Our low noise amplifiers have superior noise figure numbers and a variety of models. Gain block low noise amplifiers provide all around gain where noise is not critical. High power amplifiers system equipment is available with either manual or digital control interfaces, power capacities up to 100W pulse power.
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Model 27012 -
Chroma ATE Inc.
To meet the high accuracy and low price requirements for LCM TV test device, Chroma 27012 that integrates the signal and power source provide a complete test solution for LCD Module. Its LVDS, TTL (Option) signal source fully complies with the digital signal standard, meanwhile with the 24V, 12V, 5V, 3.3V DC source output it is able to supply power to VDD, Backlight for LCM test without obtaining external power source. Equipped with the interface of single key to switch the Timing, Pattern and Program rapidly for test in auto or manual mode, the 27012 is able to provide a direct and convenient test environment for LCM TV by its complete hardware configuration and easy operation.
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785621-02 -
NI
The cRIO-9047 is a rugged, high-performance, customizable embedded controller that offers Intel Atom quad-core processing, NI-DAQmx support, and an SD card slot for … data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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780319-02 -
NI
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-01 -
NI
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-03 -
NI
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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785680-01 -
NI
PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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W3301A -
Keysight Technologies
The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR3 178-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR3 signals.
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6212A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps) -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV, 3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV, 9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bargraph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present(>500Vac or Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.
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6212A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps) -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV, 3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV, 9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bargraph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present(>500Vac or Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.
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786457-01 -
NI
PCIe, Kintex-7 325T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device - The PCIe‑7858 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7858 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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786888-01 -
NI
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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786458-01 -
NI
PCIe, Kintex-7 160T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device - The PCIe‑7857 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7857 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
