Showing results: 706 - 720 of 8764 items found.
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HLST-500D -
Lisun Electronics Inc.
The specimen is placed in test chamber specimen which cannot be placed in high temperature chamber or low temperature chamber. High temperature chamber pre-heats the air and low temperature air chamber pre-cools the air. When doing the test of temperature changing from high to low, the low temperature chamber will blow the pre-cooled air to the test chamber. Then, the air in test chamber will reach your target temperature in several minutes (“recover time”). When doing the test of temperature changing from low to high, the high temperature chamber will blow the pre-heated air to the test chamber. Then the air in test chamber will reach your target temperature within the recover time.
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GSS6450 -
Spirent Federal Systems
The Spirent GSS6450 offers the flexibility, control and high dynamic range required to test the most challenging applications.
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AXC7583 -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 1000 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.ven Bauteilen.
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AXC7585 -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 1600 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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AXC757x -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 250 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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AXC755x -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 500 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Hilkar
High Current Transformer is designed to elevate and check the temperature of the conductors at high current levels, in order to simulate the current loading conditions found in electrical circuits. High Current Transformer is designed as an open type transformer that uses the test object as its secondary coil or has 1 or 2-turn self secondary winding. The conductors cores' temperature depends on the short-circuit high current caused by the test object. According to the current going through the test object, the test temperature of the conductor will change. The loop temperature is measured by a thermocouple probe which is directly connected to conductor.
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FLIR X8580™ -
Teledyne FLIR
The FLIR X8580 midwave IR camera is designed for scientists and engineers who need to capture detailed imagery of high-speed events, perform custom radiometric measurements, or detect points of failure in composites, solar cells, and electronics. This thermal imaging camera combines 1280 × 1024 HD resolution with fast frame rates and integration times, allowing researchers to record stop motion on fast-moving subjects or rapid temperature changes—whether in the lab or on the test range. With a four-position motorized filter wheel and support for FLIR motorized focus lenses, the X8580 will provide higher quality recordings, save time, and mitigate frustration in dynamic acquisition environments.
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Ismeca NY32 -
Cohu, Inc.
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.
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Ismeca NY20 -
Cohu, Inc.
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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HFCT Ø 140mm -
Techimp HQ S.r.L
Techimp Clamp High Frequency Current Transformer model 140 is an inductive sensor for partial discharge measurements. It is suitable for online /off line PD tests on : large diameter cables ; grounding rod bar ; etc. A TNC termination is available to connect the Clamp HFCT 140 to the TechImp PD analyzer : PDCheck , PDBase etc. The arrow indicates the requested input current (Iin) direction to get coherent output voltage (Vout) polarity respect to ground. When the sensor is installed with the arrow directed to ground, the detected voltage signal (Vout) has the same phase of the input current (Iin).
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6565 SERIES -
Wayne Kerr Electronics, Ltd.
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.