Showing results: 4141 - 4155 of 8764 items found.
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Moog Inc.
Multi-axis test systems can refer to simple or complex test configurations depending on the test articles, the test environment and the number of axes created.In most cases, multi-axis test systems are used for structural testing applications that require higher performance in both acceleration and frequency response.
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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MEDTEQ
The MEDTEQ facility has a medium range of test equipment as detailed below for testing to various standards. MEDTEQ reports have the equivalent status of a manufacturer's report, which is acceptable under medical device regulations for many regions, such as US, Europe, Canada and Australia. The reports contain a cover page, general description, sample identification (including photos), clause list (core evaluation), and test data. Unlike CB scheme reports, the test data section is a self contained record for all items inspected, measured or tested, with full details such as test engineer, sample identification, testing dates, environment, test equipment and methods used. This detail provides confidence for regulatory auditors.
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Alfamation S.p.A
Optical components such as micro-lenses, diffractive optical elements (DOE), meta optical elements (MOE) and micro lens arrays (MLA) are now largely used on consumer electronics and even more optical elements need to be integrated into smaller and smaller packages. Nowadays mass-production industries key to success lies in increasing the yield by means of strongly automatized testing machines, with statistical analysis.
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TX-MT-100 SERES -
Test-X Fixture Products
Test-X MT-100 Series mechanical kits are an inexpensive solution for testing smaller printed circuit boards and other devices.The MT-100 Series features a 1/2" thick FR4 probe plate and a 3/8" thick Lexan top plate. Precision alignment is assured through tooling holes in both the probe and top plates. Units are available with a 2-1/2" pan or an upper head assembly
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Dongguan Amade Instruments Technology Co., Ltd
Ozone aging test chamber is also called as ozone climate simulator or ozone aging tester. It is one of climatic testing instruments, which is to simulate and intensify the ozone condition for determining the cracking resistance of vulcanized or thermoplastic rubbers when subjected to dynamic or static tensile strain exposed at a man-made constant temperature to atmosphere containing given concentration of ozone in conformance with relevant specification. Ozone test is an indispensable method for people to research effects and mechanisms of ozone on rubbers, quick identify and evaluate anti-aging performance of rubbers and find solutions for improvement of quality and lifespan.
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BTT-02 -
Hangzhou Xun Anda Electrical Co., Ltd.
Passive testing method is safe.Never discharges or drain the battery.Able to test condition of discharged battery.Consistent and repeatable results.
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Cohu, Inc.
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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IMADA, Incorporated
Manual test stands offer basic force testing and economy.Lever models enable rapid testing of compression or tension, up to 220 lbf.Wheel-operated test stands enable precise control for either compression or tension and the force gauge remains in position when the wheel is released. Wheel stands are offered in a wide range of capacities from the 11 lbf capacity micro-movement stand up to 750 lbf models.
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Washington Laboratories LTD.
There are several reasons to perform product compliance testing at specific location, rather than at a test laboratory. A major reason is that the equipment may be physically too large for a test laboratory. The other reason is that special support equipment or infrastructure is needed to operate the equipment. For example, the electricity supply may have specific voltage or amperage requirements that cannot be accommodated in the laboratory. Other operational needs may include mechanical services such as air-handling, chemical requirements, other support equipment. Other reasons may include security issues or other special access issues relating to sensitive equipment and/or intellectual property.
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Inframet
Night vision devices are one of crucial surveillance technologies for defense/security sector. NVDs have also found mass applications outside defense sector. Testing NVDs is needed for both manufacturers, maintenance workshops and final users for a set of different and important reasons. Hi-tech test equipment can help significantly in manufacturing, maintenance, training, purchase optimization, and optimal use of night vision devices.
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OctoPerf -
OctoPerf
Use auto-correlations rules and frameworks as well as test validation to quickly create virtual users.
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Semco Machine Corp.
Semco specializes in manufacturing products for the electronic industry. Our Mechanical Test Fixture and CAM-TRAC© Test System Kits provide customers with cost-effective solutions for testing printed circuit boards and assemblies.
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T5833/T5833ES -
Advantest Corp.
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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AR RF/Microwave Instrumentation
AR’s state-of-the-art multi-tone systems are designed to test RF Radiated and Conducted Immunity faster than ever before. Both the MT2IEC10V3M and MT4IEC10V3M fully comply with IEC 61000-4-3:2020 Edition 4, allowing for multiple tone testing, reducing test time by up to 74%. Commercial, aviation, and automotive industries, will perform RF radiated and conducted immunity testing faster, more accurately, more efficiently, and more closely to a real-world environment.
