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DUT Boards
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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DUT Resistance Tester
AllWin Instrument Science and Technology Co., Ltd.
1. This test verfies the integrity of DUT2. The resistance is measured by measuring voltage3. Current is made by distribution
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DUT Matrix 32 DUT Matrix Channels
40-530-021
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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Automatic Fixture Removal
S95007B
Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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Precision Capacitance Meter
TH2638C
Changzhou Tonghui Electronic Co., Ltd.
TH2638 series is a new precision capacitance meter with higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. With basic accuracy of ±0.07%, loss accuracy of 0.0005, test frequency up to 1MHz, 4.3-inch LCD screen, selectable Chinese-English operation interface, TH2638 series is easy to operate and provide fast and reliable test for ceramic capacitor production. Also, it can test all kinds of capacitors from low value to high value. The results of testing one capacitor for several times are quite stable and accurate, even for lower value capacitors. The tester is compatible with SCPI command set, and configured with manipulator and scanner interface, the scanner interface can scan the open/short/ load error calibration in each channel, 256 channels at most. In low frequency, there is signal level compensation function. When the impedance is very small, the internal resistance in signal source and test cable will cause the voltage on terminal of DUT lower than the set range, then this function will adjust the level to the set range.
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DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Plane Wave Converter
PWC200
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
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Electromagnetic Immunity Scanner
SmartScan BASIC
The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability. This system includes:1. Up to 8kV (optional. 4kV base) pulse generator for ESD susceptibility testing- Camera and camera shutter to take DUT picture and failing spots- Control computer2. Up to 8kV Probe Sets:- 1mm Hx/y Field Probe- 5mm Hx/y Field Probe- D=8mm Hz Field Probe- D=8mm Ez Field Probe- Contact API for custom design probes3. Manual input of testing location and failing condition over the DUT to be included in final report.
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Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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Cryogenic Applications
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Bidirectional DC Power Supply
62000D
Chroma 62000D programmable bidirectional DC power supplies provide both power source and load characteristics. These two quadrant power supplies allow power from the DUT to be converted back to the utility grid and so are ideal for testing renewable energy power systems such as PV, storage, and EV inverters as well as a wide range of bidirectional power conditioning system (PCS) and may also be used as a battery simulator.
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SLSC Cards
SET offers a variety of different signal conditioning cards for connecting DUTs. The platform is designed to allow additional cards to be developed effectively in terms of cost and time.
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Regenerative Power System 1000 V, ±90 A, 30 KW, 400/480 VAC
RP7982A
The RP7982A regenerative power system is a single output, bi-directional, regenerative DC power supply with safety features to protect your people and your DUT.
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Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
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Hardware Platform
SmartScan 3D
SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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Bit Error Rate Tester
100G NRZ BERT
The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
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RF-Antenna Communication Links Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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Network Emulation 100GE, 50GE, 40GE, 25GE, 10GE
Chimera by Xena is a network impairment emulator that makes it easy to introduce consistent, accurate, well-defined and repeatable impairments (e.g. packet manipulation, latency, jitter, bandwidth control and shaping) to traffic between DUTs in the lab. All rates from 10GE to 100GE are supported by a single 2-slot test module.
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Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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Power Module, 100V, 3A, 300W
N6776A
The Keysight N6776A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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35/50 GHz 2/4 Port TDR/TDT Remote Sampling Head for the 86100D DCA-X
N1055A
Bandwidth options: 35 or 50 GHz (upgradable)Edge speed (10-90%, typical): 18 ps (35 GHz) or 7 ps (50 GHz)Channel options: 2 or 4 per module (upgradable) with independent skew control and up to 16 channels per 86100D mainframe Ultra-thin remote head: 1.6 m phase-stable cable, 2.92 mm (35 GHz) or 1.85 mm (50 GHz) connectors, and integrated 67 GHz diode limiters for ESD/EOS protection TDR fixture de-embedding removes effects of fixtures, cables or probes connected between remote heads and DUT
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Test/Debug Bench Station
No. of Tahoe Drivers: 1 (1:1 Driver/BIB ratio)No. of Voltages available per BIB Slot: (16 (PS1…PS16)Same Dynamic Stimuli, DUT Monitoring and Sierra™ Software as the system.
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Vector Signal Generator
R&S®SMW200A
Performance and functionality requirements vary depending on test setup and application. The R&S®SMW200A is unrivaled in mastering this challenge and sets new standards for signal generators. When developing and verifying any type of DUT, including component, module and complete base stations – the R&S®SMW200A always easily generates the appropriate test signals with top performance. The flexible modular design of the R&S®SMW200A can be equipped with the exact options required for specific applications. Any configuration is possible, from a classic single-path vector signal generator to a multichannel MIMO receiver tester.
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PXI Multiplexer Switch Module
PXI Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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Shock Testing
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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VPC Receiver Frame
ABex REC21-84TE-EXT
Robust and flexible interconnect solution for test fixtures. Designed for the use with ABex PXIe Rack 18 it provides support to equip all 21 slots with VPC interconnect modules. In addition, it offers 6 more slots on the bottom, below the ABex rack to feed through signals from external measurement devices.The interface uses the well-known Virginia Panel connectors with more than 20.000 guaranteed mating cycles. To build DUT specific test fixture, we also provide the corresponding ITA mounting frame (ITA = Interchangable Test Adapter).
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Power Supplies And Loads
Power Supplies and Loads power devices under test (DUTs) such as RF power amplifiers and cellular handsets. The power supply takes in AC power and delivers DC voltage with a fixed polarity, either positive or negative, to its load.
