Showing product results. 1 - 15 of 157 products found.
-
MTS-209 - Marvin Test Solutions, Inc.
The MTS-209 is a state-of-the-art portable test set for various armament systems used on the F-16, F-15, F-18, TA-50, FA-50 and additional aircraft. The MTS-209 supports a wide range of Alternate Mission Equipment (AME) including launchers, pylons, and racks. It combines the test capabilities of an I-Level test set in a compact, rugged, flight-line qualified enclosure. The MTS-209 performs parametric functional tests on AME components including Launchers (LAU-117, 16S210, LAU-127,, LAU-128, LAU-129, LAU-7,etc.), bomb racks (MAU-12, MAU-50, SUU-20, TER-9, etc.), Remote Interface Units (RIUs) and Pylons. The MTS-209 can also test MIL-STD-1760 aircraft stations and weapon systems.
-
ICEasy Test Suite - Marvin Test Solutions, Inc.
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
-
DIOEasy - Marvin Test Solutions, Inc.
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
-
GP1552A Series - Marvin Test Solutions, Inc.
The GP1552A Series are stand-alone pulse generators that can be used as direct replacements for the obsolete HP 8160/8160A (GP1552AH) and Wavetek 859 (GP1552AW) instruments. When used as a replacement for one of these obsolete products, existing test software does not need to be modified as the GP1552A operates and responds exactly as the product it replaces. The GP1552A supports both single and dual channel configurations for the HP8160/8160A and Wavetek 859 pulse generators.
-
GtDio6x-FIT - Marvin Test Solutions, Inc.
Marvin Test Solutions' GtDio6x-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD and ATP files to a Marvin Test Solutions' digital instrument file format. GtDio6x-FIT works in conjunction with Marvin Test Solutions' GtDio6x function library software which provides an efficient tool set for developing, debugging, and executing digital test vectors for MTS' GX5296 digital instrument.
-
DIOEasy-FIT - Marvin Test Solutions, Inc.
Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.
-
GX6032 - Marvin Test Solutions, Inc.
The GX6032 provides access to external analog instrumentation which can be routed to the internal 16-wire analog bus via the module's 32 x 16 matrix. This module is installed in the rear of the GENASYS chassis. Up to 4 GX6032 cards can be installed in a GX7016 chassis. Two cards can be accommodated in a GX7017 chassis.
-
Marvin Test Solutions, Inc.
Marvin Test Solutions offers new Form-Fit-Function replacements for GPIB instrumentation products from HP and Wavetek
-
Marvin Test Solutions, Inc.
Our legacy products include ISA, PCI and GTXI product lines. In addition, we offer a line of GPIB instruments which are 100% form-fit-function replacements for pulse, function, and arbitrary waveform generators originally supplied by HP and Wavetek.
-
TS-201B - Marvin Test Solutions, Inc.
The TS-201 is a state-of-the-art I-Level and Depot level test set for MIL-STD-1760 and legacy armament systems including launchers and bomb racks.
-
-
GP1665W - Marvin Test Solutions, Inc.
The GP1665W is a direct drop-in replacement solution for the obsolete Wavetek 178 waveform synthesizer. The GP1665W is a programmable instrument capable of generating sine, square, triangle, ramps, pulse, and haverwaves from 1 µHz to 50 MHz. The firmware is customized for the Wavetek 178 command set. Test applications using the Wavetek 178 require no code modification when upgrading to the GP1665W.
-
GP1665H Series - Marvin Test Solutions, Inc.
The GP1665H function generator is a programmable instrument capable of generating predefined sine, square, triangle, sawtooth, and DC waveforms. The firmware is customized for the HP 8165/8165A GPIB command set. Software test procedures using the original HP8165/8165A instrument require no code modification when upgrading to the GP1665H.
-
GP1616H Series - Marvin Test Solutions, Inc.
The GP1616H function generator is a programmable instrument capable of generating predefined Sine, Square, Triangle, Ramp, Haversine, Haver triangle and Pulse waveforms as well as a programmable DC output. The firmware is customized to be fully compatible with the HP 8116A GPIB command set. Software test procedures using the original HP8116A instrument require no code modification when upgrading to the GP1616H.
-
ATEasy - Marvin Test Solutions, Inc.
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
