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Product
Electrical Safety Testers- Hipots
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Safety testers (also named hi-pot tester/hipot tester/hipot test) are designed to ensure safe operation of DUTs under various operating conditions and environment.GW Instek’s GPT-9900/GPT-9800/9600 series safety testers(hipot test) provide safe and quick measurement tools for AC/DC withstanding voltage tests, insulation resistance tests, and AC ground bond tests. Those tests are required by many international safety regulations such as CE, UL, VDE, and etc. We also have leakage current tester, GLC-9000, which supports all the major leakage current test standards for medical and general electronic equipment.
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Product
Pneumatic Test Pump Kit
700HPPK
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The Fluke Calibration 700HPPK Pneumatic Test Pump Kit generates and adjusts pneumatic pressures up to 21 MPa (3000 psi), without requiring a nitrogen bottle or other external pressure supply. It supplies pressure to devices under test (DUTs) that include transmitters, controllers, pilots, digital and analog gauges, and more. It’s the perfect solution for generating high pressure in the field, where conditions and operating surfaces can vary. The 700HPPK is the ideal choice for calibration technicians, test engineers, and instrument technicians working in industries like natural gas transmission and distribution, process, aerospace and defense, who need a simple-to-use, safe and portable pressure source that they can depend on in a wide variety of conditions.
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Product
Automated Measurement Expert (AMX), VNA Plugin
S94702A
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The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller according to the optimized test sequence files generated by the AMX test plan builder. Other instrument plugins allow you to control the DUT mode, expand the number of test ports with the PXI switches or multiport test set, and use external instruments such as a DC power supply and a digital multimeter. The AMX backend software also provides step-by-step calibration wizard for full multiport calibration using the 4-port ECal module.
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Product
Safety Testers
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Safety testers (also named hi-pot tester/hipot tester/hipot test) are designed to ensure safe operation of DUTs under various operating conditions and environment.
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Product
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
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The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
Test Connector Components
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Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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Product
Bidirectional DC Power Supply
62000D
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Chroma 62000D programmable bidirectional DC power supplies provide both power source and load characteristics. These two quadrant power supplies allow power from the DUT to be converted back to the utility grid and so are ideal for testing renewable energy power systems such as PV, storage, and EV inverters as well as a wide range of bidirectional power conditioning system (PCS) and may also be used as a battery simulator.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
RF Shield Box
CMW-Z10
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The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
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Product
Cryogenic 4K Probe Cards
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Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Product
Pump Test System
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This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Product
PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
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PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
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The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others.
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Product
Multisite Testing – Rail System
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Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.
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Product
Time Domain Reflectometers
T3SP Series
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Teledyne Test Tools T3SP15D stimulates the DUT with true differential signals. The T3SP15D offers fast rise times of 35 ps for spatial impedance resolution (in FR4) of 3 mm, at DUT lengths up to 40 meters and TDR repetition rates up to 10 MHz and uses the same open short load thru (OSLT) calibration standards as vector network analyzers. With their small form factors, light weight, and optional internal batteries, the instruments go anywhere in test labs or in the field at an affordable price.
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Product
TVAC CalPod, 20 GHz
85532B
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CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button, and without removing the DUT or re-connecting standards. Very useful in thermal-vacuum chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the testing to perform a normal re-calibration.
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Product
Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
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The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
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Product
Custom Pogo Pin Rings & Blocks
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Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
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Product
Universal Function Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Hand Held Test Fixtures
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Manual, or semi-automated mechanical devices designed to secure a Device Under Test (DUT) and provide a stable interface for electrical testing, inspection, or programming.
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Product
Regenerative Power System 1000 V, ±90 A, 30 KW, 400/480 VAC
RP7982A
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The RP7982A regenerative power system is a single output, bi-directional, regenerative DC power supply with safety features to protect your people and your DUT.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
SNR Noise Generator
CNG-EbNo
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The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
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Product
Ambient Temperature CalPod Module, 20 GHz
85530B
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CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards.
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Product
SLSC Cards
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SET offers a variety of different signal conditioning cards for connecting DUTs. The platform is designed to allow additional cards to be developed effectively in terms of cost and time.
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Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
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Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
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High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
