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Product
Adjustable Multisite Rail System™
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The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.
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Product
Bidirectional DC Power Supply + Regenerative Load
62000D
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Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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Product
P-Series Single Channel Power Meter
N1911A
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30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Product
End of Line Test System for Automotive Seats
AS519
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AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
Kelvin Test Contactor/Probe Head
Gemini
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At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Product
Sound Harmonics and Current Analyzer
H74050100
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This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
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Product
Precision Low-Loss Multiplexers
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Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
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The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Modulation Distortion For E5081A Up To 44 GHz
S960707B
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The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
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Product
Text-Based Way to Connect & Disconnect Relays on ABex Modules
ABex Switching
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The ABex Switching features a text-based way to connect and disconnect relays on ABex modules. Alias names for channels could be defined in a DUT specific topology file and then be used for text-based switching. These alias names are also shown in the Konrad System Manager allowing easy debugging of test sequences. The ABex Switching functionality could be either used out of NI Teststand with the provided test steps or via API from other programming languages.- Text-based switch routes- XML based topology for Alias mapping- Switch routes with support for Alias names- Seamless integration into Konrad System Manager
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Product
JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
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High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Product
Spring Probes
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An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
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The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Shield Boxes
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Concentric Technology Solutions, Inc.
CTS can provide a customized integrated RF Shield Box or RF Enclosure Test Solution for manual or automatic testing at an off-the-shelf solution price. Many companies make RF Shield boxes, RF Enclosures or DUT fixtures, but only CTS bridges the gap by providing a complete integrated RF Shield Box or RF Enclosure testing solution for providing the RF shielding needed for repeatability within your budget and schedule.
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Product
Regenerative Power System 1000 V, ±90 A, 30 KW, 400/480 VAC
RP7982A
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The RP7982A regenerative power system is a single output, bi-directional, regenerative DC power supply with safety features to protect your people and your DUT.
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Product
Detector And FPA Testing
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The FPA Test Set (FPATS) interface to the detectors under test (DUT’s) is via a custom pedestal plate which provides both a conductive heat path to both the individual DUT’s as well as the field of view limiting aperture plate. This custom pedestal plate protrudes through the customer provided DUT interface printed circuit board (PCB) and makes physical contact with the rear of the DUT packages and the aperture plate when the FPATS is in the closed position. The pedestal plate is mounted to the ambient source plate and its temperature is actively driven by this subsystem.
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Product
Semiconductor Testing
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The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Product
Four Channel Relay Board for Power Supply Isolation
FXA-113 PSU Relay 4CH
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The FXA-113 is a four-channel relay board designed as an output disconnect option for laboratory power supplies. Especially in ICT applications it’s important, that the power supply is completely isolated from the DUT during measurements. Therefor each channel features two high current relays for the power path and two reed relays for the sense path. All four channels are equipped with a status led and can be switched independently. In addition, it is delivered with an installed DIN rail carrier.
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Product
32Ch Isolated Input Card
SET-1310
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This card provides 32 optically isolated digital inputs. SET-1310 combines high-density IO with high isolation voltages and a wide input voltage range. It allows to break ground loops and protect your system from high-voltage spikes, but also to connect high voltage signals to standard logic level acquisition devices. The channel-to-channel isolation allows to connect signals from different DUTs to a single acquisition system without compromises.
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Product
Emulate Test in simulation
STIL-VT
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Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Product
Nonlinear Pulse-Envelope Domain
S94518B
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The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
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Product
Arbitrary Load Control For Modulation Distortion
S94570B
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Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
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Product
PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
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PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Qualification Tester
LQ404
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Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
DC Power Module, 5V, 20A, 100W
N6741B
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The Keysight N6741B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
