Celadon

Celadon Systems is a well-established 20 year old US based company known for providing “Peace of Mind” Probing Solutions to the semiconductor industry. Celadon’s probe cards are known for thriving in temperature extremes while still delivering accurate and precise test results. Expect Millions of Touchdowns with Celadon. Celadon delivers the Lowest Cost of Test in the industry. Celadon is an industry leader in parametric probe both in production and in the lab, device test, burn-in, modeling & characterization, and wafer level reliability.

  • 952.232.1700
  • 952.997.6225
  • salesteam@celadonsystems.com
  • 13795 Frontier Court
    Burnsville,, MN 55337
    United States

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Showing results: 1 - 15 of 19 items found.

  • High Performance Cables And Accessories

    Celadon

    Cables are designed and manufactured by Celadon. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sheath may be used to prevent wire wear.

  • Multisite Probe Card

    T300 ButtonTile™  - Celadon

    The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.

  • Patch Panels

    Celadon

    For maximum channel flexibility, Celadon can design and build custom patch panels to meet your WLR requirements.

  • Probe Card

    VersaTile™ - Celadon

    Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.

  • Probe Card

    Indexer™ - Celadon

    The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.

  • Production Wafer Level Burn-in

    Celadon

    TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.

  • 3KV High Voltage Test

    Celadon

    45EHV/VC20EHV: 4.5inch High Voltage Motherboard for Celadon Element™ 20mm VC20EHV VersaCore™ and VersaJet™ System

  • Adjustable Multisite Rail System™

    Celadon

    The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.

  • Cryogenic Applications

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

  • Cryogenic 4K Probe Cards

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

  • Multisite Testing – Rail System

    Celadon

    Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.

  • Probe Card

    VC43™/VC43EAF™ - Celadon

    VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.

  • Probe Card

    T90™ Series - Celadon

    The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • Diagnostic Cores

    Diagnostic VersaCore™ - Celadon

    The diagnostic cores are uniquely designed in the VC20™ with Advanced Cantilever™ technology format. Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system*Test SMUs*Test Motherboard*Test Pogo pins*Test Relay matrix

  • Probe Cards

    Minitile™ with Advanced Cantilever™ technology and WedgeTile™ - Celadon

    Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.

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