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PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Custom Pogo Pin Rings & Blocks
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
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Signal Analyzer
bsw TestSystems & Consulting AG
The simplest way to measure the phase noise is to compare the Device-Under-Test (DUT) to the source of a spectrum analyzer. With the SA set at the same frequency as the OUT, you see the sum of the SA's and DUT's sideband-power spectrum on the SA display. It is a simple and straight forward method well suited for free running VCO's where the SA is easily an order better.You can improve on this method by establishing a Phase Lock (PLL) between the DUT and the Local Oscillator and create a zero-IF or base-band spectrum analyzer system.
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Automated Test Interface
ATI-100
Matrix Test Equipment Incorporated
Now, with our ?New? Model ATI-100 you can turn your existing Matrix Signal Generator and Switchable Filter Bank into a full-blown DTS (Distortion Test System). Plug and play is the word, just plug in your Multiple Frequency Signal Generator, Switchable Filter Bank, Spectrum Analyzer, Oscilloscope, Power Meter, Frequency Counter, etc. to allow the following automatic testing with a single insertion of DUT (device under test
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
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Network Analyzer Test Setup Assistant (NTSA)
S94605B
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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External Frontend
FE50DTR
The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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Dial Strain Gauge
DRK8093
Shandong Drick Instruments Co., Ltd.
This stress (birefringence) sources are due to uneven cooling or external causes such as mechanical action, which directly affect the optical glass, glass products, quality transparent plastic products. Therefore, stress control is optical glass, glass products, plastic products, such as transparency in the production process extremely important part. The strain gauge can be qualitatively or quantitatively by observing stress to identify products (DUT) quality, are widely used in optical glass, glass, transparent plastics industry for fast, a lot of testing. In fact, it can not be solved by math the complex problems.
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Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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PXI Multiplexer Switch Module
PXI Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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DC Power Module, 150V, 2A, 300W
N6777A
The Keysight N6777A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.














