-
Product
RF Device Tester
RF ITS
-
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
-
Product
DSR Pattern Editor Software
M9192A
-
The Keysight M9192A DSR Pattern Editor Software adds additional advanced capability to the Keysight M9195A/B PXIe digital stimulus/response (PXI DSR) modules by providing a graphical user interface for the development system. M9195A/B error log files can be dragged-and-dropped into waveform editor which speeds up the debugging of tests; this gives immediate visibility of discrepancies between the expected state in the ATE patterns with that of the DUT.
-
Product
Solar Array Simulator
Simulator
Among other things, solar array simulators are required for testing satellite power supplies. An SAS (Solar Array Simulator), consisting of an interconnection of several Solar Array Simulator modules, maps the solar panels and displays the individual strings connected in parallel. Optionally, the individual SAS modules are monitored by a Second Level Protection, so that the test object is not damaged in case of errors with the voltage sources. Additional circuitry is implemented via project-specific test modules. The signal path to the DUT can be separated, e.g. for dynamic current measurements.The Keysight Solar Array Simulators used were specially developed for satellite applications and cover the significantly higher requirements regarding the control speed of MPP tracking compared to terrestrial applications.
-
Product
Test Contactor/Probe Head
cBoa
-
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
-
Product
DC Power Module, 35V, 1.5A, 50W
N6734B
Power Module
The Keysight N6734B is a 52.5 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
Product
4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
Matrix Switch Module
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
-
Product
Bit Error Rate Tester
100G NRZ BERT
-
The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
-
Product
Power Supplies
-
AC and DC power supplies are used for providing the power required for energising the trip and close coils of the breaker and for running the spring charging motor. The appropriate AC or DC configuration of the power supplies can be selected, depending on the DUT specifications of the manufacturer. Dual-mode AC/DC power supplies capable of providing AC and DC outputs from the same power supply are also available, if required by the user.
-
Product
Low Voltage Burn-in and Test System
Max 450
-
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
-
Product
Power Management & MMI Module
H73000700
Interface
This module, named “6TL-MMI”, is designed to be the interface between an operator and a SYSTEM as well as being a metered power distribution unit (PDU) for it. The module is providing also safety controls, data bus interfaces, temperature control and timers. The 6TL-MMI is suitable for any ATE, and specially for those based on CAN bus controlled devices, because in addition to the above functionalities, this module is also providing galvanic isolation up to 1500V for the CAN bus. This isolation will block potential disturbance towards the DUT.
-
Product
Railway and Traffic Engineering Solutions
-
In the past, LXinstruments has already implemented a number of application-specific system solutions which cater for these special requirements. These solutions are often used to replace systems which have been in production for many decades. Our systems are not only employed for testing signal box technology modules, but also for testing train control system which are installed in the track bed. Due to the strong magnetic fields which occur at the DUT in combination with high voltages, the test systems require specific technical safeguards.
-
Product
1-Port 6 GHz Analyzer
R60
-
R60 Vector Network Analyzer (cable and antenna analyzer) delivers lab grade performance in a handheld device. This patented (US Patent 9,291,657) analyzer can be connected directly to the antenna or other DUT without the need for a test cable, eliminating measurement uncertainties inherent to cables. Resulting in highly dependable performance and calibration stability. The 1-Port VNA comes with all the features engineers have come to expect included standard in our software.
-
Product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
Noise Source
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
-
Product
Breakout Box for Easy Access to PXI-501 Functions
PXI-501 ACS-001
Breakout Module
The PXI-501 ACS-001 is an extension for the PXI-501. It provides 4mm sockets do directly connect a DUT to the PXI-501 source and measurement functionallity. It’s especially recommended for laboratory environments and debugging purpose.
-
Product
Vector Network Analyzer
ZNBT
Vector Network Analyzer
The R&S®ZNBT is a multiport vector network analyzer offering up to 24 fully integrated test ports. The instrument can simultaneously test multiple DUTs or measure one DUT with up to 24 ports. The fully integrated test ports make the R&S®ZNBT a true multiport vector network analyzer, which includes a wide dynamic range, high output power levels and fast measurements. Frequency ranges up to 40 GHz are avalailable.
-
Product
TVAC CalPod, 20 GHz
85532B
-
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button, and without removing the DUT or re-connecting standards. Very useful in thermal-vacuum chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the testing to perform a normal re-calibration.
-
Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
Pulse Generator
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
-
Product
Electromagnetic Immunity Scanner
SmartScan BASIC
-
The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability. This system includes:1. Up to 8kV (optional. 4kV base) pulse generator for ESD susceptibility testing- Camera and camera shutter to take DUT picture and failing spots- Control computer2. Up to 8kV Probe Sets:- 1mm Hx/y Field Probe- 5mm Hx/y Field Probe- D=8mm Hz Field Probe- D=8mm Ez Field Probe- Contact API for custom design probes3. Manual input of testing location and failing condition over the DUT to be included in final report.
-
Product
Assay System (Rest System for Longevity)
-
New polymers are constantly being developed and component manufacturing techniques appear, allowing the gradual replacement of metallic materials by plastics or composites, in various fields of application, in different industries. In particular, in the air conditioning, heating and water supply sector, plastic components are subject to the aging process due to the temperature to which they are subjected or due to the amount of oxygen in the fluids. The Test System for Longevity and Accelerated Aging Tests developed by Controlar allows to foresee, in accelerated test, the wear throughout the life of the plastic components of the hydraulic systems, in order to prevent eventual failures during the useful life cycle of the DUT.
-
Product
MIPI Receiver Test Solution
M8085A
-
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
-
Product
Safety Tester
-
Designed to ensure safe operation of DUTs under various operating conditions and environment.
-
Product
DC Power Module, 5V, 20A, 100W
N6741B
Power Module
The Keysight N6741B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
-
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
-
Product
Mass Interconnect
-
Mass interconnect is a way of connecting test instrumentation to a device under test (DUT). To put it simply, mass interconnect is a very large plug and socket which connects your device under test to your test instrumentation without the mess and hassle of having to connect each signal separately.
-
Product
High-Performance Autoranging DC Power Module, 60V, 17A, 500W
N6756A
Power Module
The Keysight N6756A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
Product
Custom Vibration Testing Fixtures
-
Paragon Systems is unique in being able to not only perform your vibration test, but also to design, fabricate and qualify your vibration testing fixtures. Usually all we need from a client is their vibration test profile, a CAD model and the GD&T of the DUT.
-
Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
-
Product
Transformer Turns Ratio Meter
TTRM 101
-
SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 101 measures only turns ratio where as TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
-
Product
Solar Array Simulator
G5.SAS
-
The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
-
Product
Arbitrary Load Control For Modulation Distortion
S94570B
-
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
