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Product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
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Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Product
DC Power Module, 8 V, 6.25 A, 50 W
N6732B
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The Keysight N6732B 50 W basic DC power module provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power your DUT or ATE system resources, such as fixture control.
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Product
SNR Noise Generator
CNG-EbNo
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The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
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Product
CTL503
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The CTL503 Curve Tracer is a low-cost transistor (BJT and FET) computer controller curve tracer. Unlike other simple curve tracing units the CTL503 is designed to measure devices to 100V and upto 3A. Four collector resistors (relay selected) allow the user to test the smallest of BJT’s and FET’s as well as extracting meaningful curves from larger TO3/TO247 packaged devices. Limits on both peak test voltage and peak test current can be easily set to prevent exceeding device parameters.Pulse testing (80us/300us) is used to minimise device heating and to ensure the CTL503 can be powered via USB. This may be disabled for smaller parts.Connected and powered via USB and running our own free software the CTL503 is easily configured using a built in wizard (for quick results), or the user can adjust every instrument parameter to suit. Works with EPIC 21.010 and above.Users can save data from runs, as well simply grab images directly from EPIC.Connections are made to the DUT (device-under-test) with the built-in colour coded test leads with crocodile clips.
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
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PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Multi-DUT Mobile & IoT Test System
IQxstream-M
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Its ultra-compact design and flexible architecture makes it highly suitable for high volume manufacturing of smartphones, tablets and cellular IoT modules.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Vector Signal Generator
R&S®SMW200A
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Performance and functionality requirements vary depending on test setup and application. The R&S®SMW200A is unrivaled in mastering this challenge and sets new standards for signal generators. When developing and verifying any type of DUT, including component, module and complete base stations – the R&S®SMW200A always easily generates the appropriate test signals with top performance. The flexible modular design of the R&S®SMW200A can be equipped with the exact options required for specific applications. Any configuration is possible, from a classic single-path vector signal generator to a multichannel MIMO receiver tester.
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Product
Mass Interconnect
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Mass interconnect is a way of connecting test instrumentation to a device under test (DUT). To put it simply, mass interconnect is a very large plug and socket which connects your device under test to your test instrumentation without the mess and hassle of having to connect each signal separately.
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Product
Drive Controller Function Test
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
BIB Loading
FALCON Series
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The Falcon Series is an automated BIB loading and unloading machine. It is designed to provide precise high-speed loading of DUTs from Trays/Tube to Burn-in boards and precise high-speed unloading of DUTs from Burn-in boards to Trays/Tube for different device packages. The Falcon Series also has a simple conversion kit which allows end-users to re-configure the equipment for different types of sockets and package combinations.
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Product
PathWave Lab Operations For Battery Test
EP1150A
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PathWave Lab Operations for Battery Test enables efficient planning and coordination of your entire battery test laboratory. It manages all resources, including test fields, test systems, and your device under test (DUT). PathWave provides an integrated, web-based lab management platform that helps you modernize your test workflows, eliminating legacy paper-based processes, and increasing data integrity and traceability.
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Graphical Waveform Editor and Instrument
PI-PAT
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Much more than just a visualization tool, PI-PAT is a full-fledged graphical waveform editor that allows you to spend more time testing and less time programming. PI-PAT doesn't require any programming experience or complicated syntax. Just draw or type patterns directly into the pattern window. Move a clock edge by dragging it. Adjust integration times by entering a single number. Change the output to your DUT by clicking the Update button. You'll never have to wrangle DSP or FPGA code with PI-PAT.
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Product
Test Connector Components
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Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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Product
VPC Receiver Frame
ABex REC21-84TE-EXT
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Robust and flexible interconnect solution for test fixtures. Designed for the use with ABex PXIe Rack 18 it provides support to equip all 21 slots with VPC interconnect modules. In addition, it offers 6 more slots on the bottom, below the ABex rack to feed through signals from external measurement devices.The interface uses the well-known Virginia Panel connectors with more than 20.000 guaranteed mating cycles. To build DUT specific test fixture, we also provide the corresponding ITA mounting frame (ITA = Interchangable Test Adapter).
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Product
PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
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The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Flexible Cable Set, 2.4 Mm To 7 Mm
85135F
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Achieve phase stability with these 62.9-cm cables when a DUT is connected between cable ends
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Product
Cryogenic 4K Probe Cards
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Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Product
Bit Error Rate Tester
100G NRZ BERT
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The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
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Product
DC Power Module, 5V, 20A, 100W
N6741B
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The Keysight N6741B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Product
Emulate Test in simulation
STIL-VT
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Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Product
Bidirectional DC Power Supply + Regenerative Load
62000D
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Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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Product
Other Passive Probes
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Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Product
Milliohm Meters
Chroma 16502
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Chroma Systems Solutions, Inc.
With a basic accuracy of 0.05%, Chroma 16502 offers a 0.001mΩ ~1.9999MΩ wide measurement range. It provides measurement range with 4 1/2 digits resolution. The fast measurement time is 65 ms. It suits component evaluation on production line. Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurement. DC test current output mode is used to fasten measurement speed for inductive DUT. Dry-circuit test current output mode is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 20mV.
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Product
TVAC CalPod, 20 GHz
85532B
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CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button, and without removing the DUT or re-connecting standards. Very useful in thermal-vacuum chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the testing to perform a normal re-calibration.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Hardware Platform
SmartScan 3D
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SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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Product
High Current SMU 600/1200/2400 A
AXC85xx
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Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
