Showing results: 661 - 675 of 8598 items found.
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DMM 8007 -
Tecpel Co., Ltd.
1.999 count LCD display. Resistance to 2000 M£[. Frequency to 20MHz. Capacitance measurement. Inductance measurement. Logic Test. Transistor hFE test. Audible continuity test
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's battery impact tester tests the safety of the battery through different weights, different heights and different impact areas. After a series of tests on this battery impact tester, the battery must not have flame or explosion.
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KD-500 -
King Design Industrial Co., Ltd.
*To evaluate impact effects of shock, drop and tumble encountered in repair and handling process, so do the safety strength assessment. *The general drop test is against bottom, angle, edge and tumble. According to related specifications you can lift one side of the product by angle to make it drop freely.
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UI-FT49 -
Unuo Instruments
Heel Fatigue Tester is used to test lady shoe heel withstand repeated impacts in daily walking. This heel tester is suitable to test plastic heel and steel heel dowels. Heel Fatigue Test Method includes BS 5131-4.9, ISO 19956, SATRA TM21, QB/T2864
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Kleinwächter GmbH
ESD protection measures must be performed in a work environment with increased sensitivity for electrostatic charging and discharging.In order to ensure effective protection, as required by EN 61340,Our devices offer you an easy way to check and monitor the wrist straps, dissipative shoes or the whole workplace.
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HH2109 -
Colluck Company Limited
High Accuracy (Basic Accuracy 0.7%). LCD display 2000 count, 12.8mm figure height. Manual Ranging at your choice (19 Range). Higher Voltage test up to AC 750V and DC 1000V. Higher Current test up to 10A
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LMS-3000 -
Lisun Electronics Inc.
• Measure and display the relative spectral power distribution (UV-VIS-NIR) P(λ), chromaticity coordinate, correlated color temperature, rending index, color difference, peak wavelength, luminous flux, luminous flux efficiency and photometry parameters of light source and light material under the control of general PC. • Automatically adjust high-voltage, it not only shortens the measurement time, but also reduces the wear and tear of the instrument • Simultaneously measure the temperature in both environment and integrating sphere to make the data more visually and reliably • Figure of chroma and color difference in test report can be exchanged freely • Color display and print. The relative spectral power distribution (UV-VIS-NIR) P(λ), reports both in English. RS-232-C interface, compatible with all kinds of computer • LSP-500 AC Power source PC RS-232-C interface. compatible with all kinds of computer • Range of wavelength: 380nm~780nm(Special:200nm~780nm) • Accuracy of wavelength: ±0.2nm • Repeatability of wavelength: ±0.1nm • Accuracy of chromaticity coordinate: ±0.0003(under standard illuminate A) • Spectrum sample interval: 5nm(Special order:1nm) • Luminosity linearity: 0.3% • Accuracy of luminosity: 1 class • Correlated color temperature measure range: 1500K~25000K • Accuracy of CCT: ±0.3%(under standard illuminate A) • Accuracy of rending index: ±(0.3%rd±0.3) • Environment temperature measure range: -10℃~80℃ • Temperature measure range(In sphere): -10℃~100℃
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HLST-500D -
Lisun Electronics Inc.
The specimen is placed in test chamber specimen which cannot be placed in high temperature chamber or low temperature chamber. High temperature chamber pre-heats the air and low temperature air chamber pre-cools the air. When doing the test of temperature changing from high to low, the low temperature chamber will blow the pre-cooled air to the test chamber. Then, the air in test chamber will reach your target temperature in several minutes (“recover time”). When doing the test of temperature changing from low to high, the high temperature chamber will blow the pre-heated air to the test chamber. Then the air in test chamber will reach your target temperature within the recover time.
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GSS6450 -
Spirent Federal Systems
The Spirent GSS6450 offers the flexibility, control and high dynamic range required to test the most challenging applications.
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AXC7583 -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 1000 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.ven Bauteilen.
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AXC7585 -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 1600 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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AXC757x -
VX Instruments GmbH
Generate extremely short, fully regulated current pulses from 300 µs up to 250 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.