Showing results: 4276 - 4290 of 8598 items found.
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Dongguan Amade Instruments Technology Co., Ltd
Steam aging test chamber is a climatic test machine used to judge the products performance to resist extreme circumstance under high temperature, high humidity and high pressure during the transportation, storage and usage. The principle is very simple, water in the tank is heated turning into steam to form a simulated test environment under specified temperature and humidity. Specimens are placed into the drawers of machine to carry out test lasting for preselected time. It is applicable to electronic connectors, semiconductor IC, transistor, LCD, diodes, resistances etc.
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ShibaSoku Co., Ltd.
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Wewon Environmental Chambers Co, Ltd.
IC welding to PCB, IC is integrated in the chip general purpose circuit, it is a whole. Once the inside is damaged, the chip will be damaged. The goal of printed circuit boards (pcbs) is to connect IC and discrete components to form a larger working circuit. Thermal cycling equipment can detect the defects and hidden dangers of welding components in the production process, decreasing failure rate. When it fails, components can be replaced in timehttps://www.wewontech.com/thermal-cycling-test-equipment/
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Cohu, Inc.
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Chroma ATE Inc.
Adivic/Chroma Group has been in the development of RF & WIreless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Toyota, Mitsubishi, Honda, Hyundai, Daewoo...etc., most of the global IC design houses with DTV chips such as Broadcom, Marvell, MTK...etc., and also defense entities around the world.
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LogicVision, Inc.
Mentor’s comprehensive solution for IC test, including best-in-class design-for-test tools and test data analytics that help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
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3680 -
Chroma ATE Inc.
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Amkor Technology, Inc.
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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MicroContact AG
Frequently, manual test adapters are required for the functional and IC test. In order to contact the test subject, spring contact probes are often installed in the adapter, but the pitch of the spring contact probes is approx. 1.27 mm and thus too great for certain applications.