Showing results: 8176 - 8190 of 8598 items found.
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4152A -
Astronics Corporation
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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855 -
TEGAM Inc.
The ideal solution for anyone that needs a hand held, multi-purpose calibrator to perform field or lab tests on temperature probes or thermometers. The 855 meter will simulate, source, measure and record the same thermocouple types as the 850, K-J-T-E, and adds N-B-R-S-G-C-D types. The meter also supports 1000, 100k, 100 RTD''s but does not support thermistor''s.
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AccuDrop 500 -
L. A. B. Equipment, Inc.
Model AD-500 is 1 of 3 models in the ACCUDROPTM Series. It helps determine the ruggedness of packagesand the effectiveness of their interior cushioning when exposed to impact during material handling. Theeffects of dropping are easily duplicated in your laboratory using the controlled and precise flat, corner, andedge drop tests.
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AutoShock-II Test System -
L. A. B. Equipment, Inc.
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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AccuDrop 160A -
L. A. B. Equipment, Inc.
Model AD-160A is 1 of 3 models in the ACCUDROPTM Series. It helps determine the ruggedness of packagesand the effectiveness of their interior cushioning when exposed to impact during material handling. Theeffects of dropping are easily duplicated in your laboratory using the controlled and precise flat, corner, andedge drop tests.
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AccuDrop 125 -
L. A. B. Equipment, Inc.
Model AD-125 is 1 of 3 models in the ACCUDROPTM Series. It helps determine the ruggedness of packagesand the effectiveness of their interior cushioning when exposed to impact during material handling. Theeffects of dropping are easily duplicated in your laboratory using the controlled and precise flat, corner, andedge drop tests.
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Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.
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TetraMAX® -
Synopsys, Inc.
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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T5835 -
Advantest Corp.
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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K8220A -
Keysight Technologies
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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T5830 -
Advantest Corp.
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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T5230 -
Advantest Corp.
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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SANBlaze Technology, Inc.
SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.
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Environment Associates Inc.
When you want to test your product for extreme space conditions, that include temperatures from 155°C to -175°C at space vacuum altitudes, Environment Associates is your solution. Using this test to determine the unique failures of space mechanisms that orbit the earth is key in improving system reliability. Thermal vacuum testing is similar to thermal cycling but adds deep space vacuums for detecting corona/arcing and intermittence and increases a product’s out-gassing. The key failure modes found during this test are: 1) electrical iIntermittence, 2) thermal control issues, 3) arcing, 4) corona, 5) material out-gassing, and more, to determine a product’s flight-worthiness for workmanship and processing issues.
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Environment Associates Inc.
Today’s products are very complex and designed to minimize costs with the use of FEA software that can project fatigue hot spots. Using your analysis results, we can create a test plan that includes mechanical cyclic durability and environments that will best test your design.
