Showing results: 5701 - 5715 of 8598 items found.
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STAr Technologies, Inc.
STAr is the leading parametric test system integrator, with over 20 years of experience and many successes for total parametric test solutions serving customers within the semiconductor wafer fabs, flat panel display, LED and PCB industries.
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EN62471-C -
Lisun Electronics Inc.
IEC62471-2006(CIE S009) Photobiological Safety of Lamps and Lamp System and IEC TR62471-2(2009) Guidance on Manufacturing Requirements Relating to Non-laser Optical Radiation Safety have be published addressing hazard to human (mostly eye and skin), and are completely suitable to assess the optical radiation safety of non-laser sources, such as LED products, UV radiation in general lighting products and etc.
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Santec Corporation
We offer a range of complete systems for measuring optical properties by combining our tunable lasers, optical switches, polarization controller, power meter and software. Please feel free to contact us for customization according to your needs.
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TestBuilder -
elowerk Testsystems
elowerk TestBuilder is the operating software for elowerk test systems. TestBuilder is based on the Microsoft .Net Framework and runs on Windows Vista and Windows XP. Test programs can be created by CAD data import. The comfortable graphical user interface allows a straightforward editing of test programs. Customized applications can be programmed using a programming interface.
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MPM-210HMPM-211, 212, 213, 215 -
Santec Corporation
Our MPM-210H is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings(AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210H allows the user to complete real-time high precision IL measurements.
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SMTS -
MB Dynamics Inc.
The Steering Module Test Simulator (SMTS) from MB Dynamics is a non-hydraulic turnkey lab test system, offering accurate, reliable and repeatable in-laboratory simulations of driver, road & vehicle inputs acting on a steering system, and their associated effects on steering system performance and annoying noises. Supports troubleshooting, identification, diagnosis, and resolution of root causes of unwanted noise and other performance issues common to EPS, EPHS, EPAS, MDPS, and HPS steering systems.
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RAM-AUTO -
The Modal Shop, Inc.
Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition.
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Femto 2000 -
Guide Technology, Inc.
The Femto 2000 Multi-Site Time Instrument is a multi-channel Continuous Time Interval Analyzer (CTIA) designed to 'fill the gap' in ATE performance for high speed, precision timing measurements. Integration of the Femto 2000 with any ATE system extends the life of existing ATE or enhances the performance of new testers.
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Conductor Analysis Technologies, Inc
The OM Thermal Stress System is a cost-effective performance based reliability test methodology which performs convection reflow assembly simulation and air-to-air thermal cycling. The methodology is utilized by both the IPC PCQR and the IPC 6012-QLM programs. OM systems are available for sale or lease, and test services are provided from both CAT and our service partners.
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SBExpress-RM4 -
SANBlaze Technology, Inc.
The SANBlaze SBExpress-RM4 is a complete turnkey PCIe® Gen4 NVMe SSD Drive validation test system. The SBExpress-RM4 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen4 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM hardware provides a rackmount chasis with sixteen dual or single port front-accessible drives. The hardware can be easily daisy chained for maximum scaleability.
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W.L. Gore & Associates
For test applications that require consistent and highly repeatable measurements, GORE® Microwave/RF Assemblies for general purpose test applications provide reliable electrical performance with proven phase and amplitude stability. The smaller diameter and highly flexible, yet durable construction simplify the routing process while ensuring long-lasting electrical performance after installation, particularly in board-to-board and inside-the-box systems.
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BK9024 -
BaKo Co., Ltd
If you need to test cellphones, the BaKo Type BK9024 is fast and switches between up to 8 phone chambers at once, making it a great choice for quality control on your production line.
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AD-7100 -
ADEX Urzadzenia Pomiarowe
4 Connectors measurement method, Max measurement time 10 sec Indicator of right connect test cables, Lock of test current connectors, Graphical backlight LCD display (240 x 128), True test current indicator, Temperature control of test current stability system,
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Summit Z516 -
Teledyne LeCroy
The Summit Z516 is a PCIe 5.0 and CXL protocol traffic generation test tool used for critical test and verification intended to assist engineers in developing and improving the reliability of their systems. The Summit Z516 can emulate PCI Express 5.0 and CXL root complexes or device endpoints, allowing new designs to be tested against corner case issues.
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Rosenberger Hochfrequenztechnik GmbH & Co. KG
For microwave measurements and VNA calibrations, Rosenberger develops, manufactures, and provides test & measurement products which meet the highest demands of industrial test applications. These include high-performance VNA test cableswith outstanding phase and amplitude stability, a variety of test port adaptors for VNA applications up to 110 GHz, very robust interchangeable high mating cycle port connector systems, and test devices – from low-frequency devices for simple measurements to components permitting high-precision broadband measurements.