Showing results: 2641 - 2655 of 8598 items found.
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Marvin Test Solutions, Inc.
High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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LTS8620 -
VX Instruments GmbH
The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Power 1600 Series -
Quantifi Photonics Inc.
Quantifi Photonics’ Power 1600 Series inline optical power meters provides quick and accurate inline power monitoring.Seamlessly integrate the power meter into your new or existing PXI test setup and save space, lower your costs and improve testing efficiency.
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PXIe-C1760 -
Avionics Interface Technologies
3U PXI form factor fits into PXIe or PXI hybrid slotTwo independent ports programmable as NC or NT(s) simultaneouslyTwo SFP sockets accepts FC-0 AS5653 or AS5625/AS5627 transceiversSupports NC-to-NT transfers, NT-to-NC Transfers, Mode Codes, and BroadcastFull control of sequence and exchange managementSupports large file exchangesFull Monitoring of all Bus TrafficTriggering and FilteringFull Error InjectionSupports DMA for high speed streaming of data to/from the boardIRIG-B Time Code Encoder/Decoder for Data CorrelationOptional Special FC-0 physical layer compliance with SAE AS5653Optional fcXplorer Analyzer for decoding HS1760 frames
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Marvin Test Solutions, Inc.
High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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PXIe-1553 -
Avionics Interface Technologies
1, 2, or 4 dual redundant MIL-STD-1553 bus interfaces Concurrent BC, multiple RT (31), and BM operations Full error injection and detection • Data capture filtering, 100% bus recording, and physical bus replay Multi-level Trigger for Capture/Filtering IRIG-B Time Encoder/Decoder Real-Time Recording and Physical Bus Replay Application interfaces supporting C, C++, C#, and .NET development Device Driver Support for: Windows, Linux, and LabVIEW Real Time (others provided on request) 10 high voltage (up to 30V) programmable DIO lines Flight Simulyzer GUI Analyzer software
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Marvin GBATS -
Terotest Systems Ltd.
GBATS (Basic Automated Test System) is a preconfigured, modular PXI test platform that addresses analogue, digital, mixed-signal and avionics test needs.
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NI-RFmx GSM/EDGE -
NI
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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BIRST -
Pickering Interfaces Ltd.
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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NX5300 -
Marvin Test Solutions, Inc.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems. Advanced capabilities include simultaneous support of up to 255 devices on a single scan chain, support of sixteen NX5300 systems controlled by single host machine and configurable JTAG/BDM clock rates up to 24 MHz. The NX5300 includes 16 high-speed measurement channels. Each channel can measure logic levels, frequency, count events and perform a CRC check at rates up to 100 MHz.
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41-650-001-S1 -
Pickering Interfaces Ltd.
A 5 channel voltage amplifier ideal for increasing the output voltage from other PXI modules, enabling users to easily generate the signal voltages commonly required in applications such as automotive test.
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Marvin Test Solutions, Inc.
High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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Marvin Test Solutions, Inc.
High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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GX1034 -
Terotest Systems Ltd.
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system’s source and measure baseband instrumentation – resulting in simplified support / maintenance logistics and improved system availability.
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Pickering Interfaces Ltd.
The Aerospace and Defense industries were early adopters of modular test platforms. One of the first successes was VXI test systems and VXI switching. They served these industries very well for more than 20 years. Now, as VXI test systems become obsolete, test systems developers are looking to PXI as the next generation modular test platform for their industries. We offer a few different references to help you in making a switch to PXI.