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Showing results: 2461 - 2475 of 2629 items found.

  • Adjustable Press Plate Bed of Nails Testers

    Protector Adjustable Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Advanced Primary Injection Test Set

    PI-2500 - ETI Precision

    The PI-2500 is a versatile and technologically advanced primary injection tester capable of testing circuit breakers up to 2000 amperes frame size. It incorporates a low-impedance output transformer with dual secondaries to provide optimal impedance matching to a wide range of breaker sizes. High-capacity internal fan cooling allows maximum utilization of the output transformer and faster recovery after overload conditions. It is housed in a rugged aluminum frame enclosure with removable sides allowing easy access to all internal components to facilitate ease of service and maintenance. The output of the test set is controlled by means of a proven SCR controller. This provides precise initial phase angle control to reduce DC offset for inductive loads and more consistent pulse currents.

  • Edge Press Technology Bed of Nails Testers

    Protector Edge Press Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • PXI 1A Fault Insertion Switch 22-Channel

    40-195-001 - Pickering Interfaces Ltd.

    The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.

  • PXI 1A Fault Insertion Switch 11-Channel

    40-195-101 - Pickering Interfaces Ltd.

    The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.

  • GAOTek Portable H/L Voltage Clamp Current Leaker

    GT00YA00ZX - GAO Tek Inc.

    The GAOTek Portable H/L Voltage Clamp Current Leaker measures high voltage current with a 12.5 in (32 cm) insulating rod, adopting the latest CT technology and integrating mask digital technology. This instrument provides high precision, reliability, and stability with its integrated design between transducer clamp and domain. This leaker can be used to measure any wire with or without the insulation layer where the voltage is below 10 kV. The insulating rod is portable, moisture resistant, heat resistant, shock resistant, and insulating. It provides additional functionalities such as online current testing, peak and data holding, data storage, detection of high and low current in primary and secondary circuits separately, and provision of suitable calculations to conclude change in high and low pressure.

  • High Voltage Switching Test System

    Accel-RF Corporation

    The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.

  • Press Down Rods Bed of Nails Testers

    Protector Press Rods Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Reliability Testing

    ELES Semiconductor Equipment SpA

    ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests,  or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes  and during lifetime (often these defects escape ATE).  The improvements to products and processes needed to arrive at zero defects  cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.

  • Flying Probe Test System

    A8a - atg Luther & Maelzer

    The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.

  • 15 Amp 120 VAC Filter and Surge Arrestor

    AS-AC15 - Array Solutions

    - 15 amp 120VAC quad outlet for high power devices- Resettable circuit breaker protection, easy to use and reset- I EA standard input plug and #14 GA AC line cord for USA - standard interface- MOV surge arrestors included - for even more protection- High level of common mode and differential mode filtering digital noise and RF filtering eliminates- digital artifacts and RF interference - See chart- Front Panel Neon Blue AC ON indicator - just plain cool to look at, not too bright!- Double shielded box inside - for optimum filtering operation- Size 6W X 4H X 4 3/4 D in inches approx 3 lbs

  • Pulse Laser

    Optilab, LLC.

    Is a variable, pulsed high power laser source, a building block ideal for MOPA, LIDAR, OTDR laser systems development and applications. This fully integrated compact module contains a Distributed Feedback (DFB) laser and built-in optical amplifier stage, and a variable nanosecond pulse generation circuits. It provides up to 200 mW optical peak power in 1064 nm wavelength region, with a programmable pulse width from 10 ns to 1000 ns, and a selectable pulse repetition rate from 100 Hz to 1 MHz The optical pulse generation can alternatively be controlled via an external electrical trigger. In a compact design, NPL-CWDM-M is applicable for OEM integration or as a stand alone pulsed laser source. Contact Optilab for more information.

  • Functional Systems

    PTE-100 - SEICA SpA

    The PTE-100 gives test personnel access to electrical signals for probing, voltage injection, isolation checks, voltage/current and time/frequency measurements, and it offers the ability to analyze hot and loaded circuits, verifying missing, corrupted or present valid signals. Furthermore, the PTE-100 offers the ability to make electrical verification activities more efficient, repeatable and safe, by introducing software controlled test sequences to reduce human errors and guide diagnostic resolution. Break Out Boxes are commonly made in-house and are often specific to a particular project. They are simply designed to multiplex connections between two units and use external instrumentation for signal injection or measurement. The end result is a multitude of tools, difficult to maintain, with limited transportability, providing costly and inefficient operations at the factory or in the field.

  • Stand Alone/ Bench Top Load Cell Amplifier/ Conditioner Module

    MODEL TMO-2A - Transducer Techniques, Inc

    The TMO-2A Transducer Modules is a complete differential amplifier/signal conditioners with self contained power. The unit provide excitation, balance and span adjustment via precision 10 turn pots, and shunt calibration necessary to couple a user supplied bridge type transducer to an indicating instrument. Zero to full scale output is specified at 4-20 mA. The TMO-2A provides a floating shunt calibration circuit which applies calibration at the transducer, thereby eliminating errors due to line losses. The excitation supply incorporates a Wagner Ground to greatly improve Common Mode Rejection. The factory set bandwidth of the module is narrow to improve stability. The removal of a single capacitor will increase the frequency response DC to 60K Hz for dynamic data applications.

  • AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems

    Chroma Systems Solutions, Inc.

    Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.

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