Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Wafer Thickness, TTV, Bow and Warpage
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ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
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Product
Wafer Auto Line Integration
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The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Product
Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
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Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Materials Analysis
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Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
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Chemical Analysis
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Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Failure Analysis Services
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BMP Testing and Calibration Services Inc.
Failure analysis plays a crucial role in product development that enables industries to prevent future product failures and improve them for the end-user. It’s a multi-faceted approach to finding how and why a product failed and involves an in-depth investigation of the circumstances surrounding the failure and discovery of relevant background information, including but not limited to the type of application, environmental factors, service life, and pertinent design information.
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Gasoline/Fuel Analysis
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A gas chromatograph is used for composition analysis of gasoline and its additives in order to improve fuels' performance. In addition to excellent performance, Shimadzu's GC systems improve productivity. For example, the Nexis GC-2030 system combines three standards into one to save analytical instrument and labor costs.
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Vibrational Analysis
GEMINI-2
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GEMINI-2 is the compact solution for HVSR, MASW and Vibrational Analysis: a single waterproof container with integrated high-performance 3D geophone and low resonance frequency (2Hz sensors, suitably coupled) and a powerful real 24-bit acquisition card with USB port for connection to an external PC.
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Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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VUV PIONA+ Analysis
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This high-speed gasoline PIONA analyzer is compliant with ASTM D8071. It supports simultaneous analysis of PIONA compounds, specific oxygenated compounds, and BTEX in gasoline, and can quickly analyze samples within 30 minutes by classifying compounds based on VUV absorption spectra. The simple system configuration provides broad applicability, including analyzing other petroleum products.
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Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Wafer Back Side Cooling System
GR-300 Series
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The GR-300 Series can control gases used to cool the back side of wafers that are fixed in position by an electrostatic chuck system.The stability and accuracy of the GR-300 makes it ideal for controlling the flow of Helium and Argon in wafer cooling systems.
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Product
Water Analysis Meter
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Shanghai Selon Scientific Instrument Co. Ltd.
A tool used to measure various physical and chemical properties of water to determine its quality.
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Chemical Analysis + Surface Analysis
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Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Datalogger for IAQ Analysis
HD37AB1347
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Datalogger for indoor air quality analysis (IAQ). Measurement of airspeed, temperature, relative humidity, atmospheric pressure, CO² and CO.
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Inline Wafer Testing
IL-800
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Multi-Track Spectral Analysis
FreqAnalyst Multi
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FreqAnalyst Multi is a unique multiple tracks real time spectrum analyzer: it lets you visualize the spectral content of several audio tracks on the same screen with extreme smoothness and high resolution for both time and frequency. It is the ideal solution for mixing: you can use it as a frequency overlap detector and actually see which part of the spectrum every single instrument uses.
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Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Wafer Inspection Machine
IV-W2000
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The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
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Gas Analysis
QGA
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Hiden Analytical supplies precise and user-friendly tools for quantitative gas and vapour analysis. Our compact Hiden QGA system is a high performance gas analyser configured for real-time continuous monitoring of multiple species with an extremely wide dynamic range.
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Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
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The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Failure Analysis And Magnetic Imaging Services
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Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Chemical Testing and Analysis
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Chemical testing and analysis is vital for regulatory compliance and to understand the quality and composition of chemical substances and materials that are used in products, industrial processes and manufacturing. Specialist industry knowledge, and expertise in applying the most relevant methodology are the keys to successful chemical testing. Advanced analytical instrumentation or a combination of techniques is necessary to solve problems or determine composition.
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*Structural Analysis
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Guangzhou Amittari Instruments Co.Ltd
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Ultrasonic Wafer Scanner
AutoWafer
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Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
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Mercury Porosimetry Analysis
AutoPore V
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The AutoPore V Series Mercury Porosimeters can determine a broader pore size distribution more quickly and accurately than other methods. This instrument also features enhanced safety features and offers new data reduction and reporting characteristics of your material.
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Standard Modal Analysis
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EDM Modal Standard Modal Analysis provides the user with a complete arsenal of tools, from FRF data selection and parameter identification to results validation and mode shape animation.
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Impedance Analysis
S96041B
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Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
