CSE Co.,Ltd

We pursue customer satisfaction. As you know, the Wafer Probing Machine is to test electric characteristics of each chip created on a wafer. The test is made by a probe of the probe card, attached to a wafer prober and connected to a tester, contacting to a pad of each chip of a wafer on the stage of the wafer prober. In testing this way, chips are sorted into either good or defective chips.