Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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IC Side Channel Analysis
These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Signal Analysis Software
Signal analysis software solutions support a wide spectrum of applications ranging from manual signal processing and individual signal analysis to fully automated signal recognition and processing in wideband scenarios. The products are available as standalone units or as integrable subsystem solutions for R&S COMINT system software or third-party system software.
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Fluid Analysis Information Management System
LubeTrak
LubeTrak compiles individual MicroLab oil reports into a consolidated database of historical information. This allows fleet managers to view and manage their MicroLab oil analysis results across the entire fleet. This fleet-level view can be used to assess the health of the entire fleet to optimize maintenance program and practices.
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Test and Analysis
ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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LMK Image Capturing & Analysis Software
LMK LABSOFT
TechnoTeam Bildverarbeitung GmbH
The LabSoft image capturing and analysis software for the LMK offers a wide functionality for various photometric and colorimetric applications. We are continually expanding the software's functionality by an intensive exchange of experience with our customers. We are also constantly improving the usability of this intuitive software.
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Signal Analysis
Cross-Spectrum FFT Analysis
The program Cross narrow-band spectrum is used for evaluation of the interrelation between the signals’ parameters obtained from the two primary transducers installed at various parts of the controlled object. This program can be used for detection of noise source location, for sound absorption level evaluation and the researched object acoustic properties control, for evaluation of space-time distribution of the directional energy flux (Poynting vector), for the ground cross-section FR characteristic evaluation (Nakamura method), etc.
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Time Domain Analysis
S93010B
The S93010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on PNA/PNA-L/PNA-X Series B models.
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The DC System Analysis Module
Save time with intuitive scenario manager interface.• Communicate designs effectively with graphical and text base results.• Improve decisions by quickly comparing resulting curves from different scenarios.• Increase productivity by modeling both DC and AC systems in a single project.• Reduce mistakes by evaluating all loading conditions and duty cycle loads.
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Communication Analysis System
ACQUA
ACQUA is a dual channel analysis system for diagnosis of acoustic and/or electric transmission paths up to 24 kHz. By means of predefined modifiable measurement descriptors measurement data can be gathered and evaluated in a simple and quick manner. All telecom specific analyses comply with the international standards of ETSI, ITU, TIA, 3GPP, GCF, PTCRB, DECT Forum, GSMA, CTIA.
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Spectral analysis Automation Generator with 3D viewer
FreqAnalyst Pro
FreqAnalyst Pro is a real time spectrum analyzer with advanced functionalities. It uses the same smooth algorithms as its little brother (Blue Cat's FreqAnalyst free plug-in): it has been designed to provide extreme smoothness and high resolution for both time and frequency.
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Liquid Crystal Thermographic Analysis Tool
thermVIEW
Advanced Thermal Solutions, Inc.
thermVIEW is a high resolution liquid crystal thermography system for cost effective temperature measurement of electronic circuit boards, micro circuits, hybrid components and integrated circuits. One micron level* thermal mapping of electronic devices.
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Room Acoustics Analysis on iOS
RoomScope
RoomScope turns your iPad, iPhone, or iPod touch into a room acoustics measurement and analysis tool. With RoomScope, you can measure a room impulse response and then calculate reverberation time, early decay time, clarity, and definition, as defined in the ISO 3382 standard. RoomScope also allows you to adjust the Schroeder decay curve integration limits with the touch of your finger and plot the calculated room parameters versus whole or 1/3-octave band center frequency.
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Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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PCIe Exerciser & PCIe LTSSM Exerciser with L1 Substate Analysis
U4305B
Supports 2.5 GT/s (Gen1), 5.0 GT/s (Gen2) and 8.0 GT/s (Gen3) speeds Link width support x1 through x16 lanes Standard PCIe half-size card form factor to fit into most platforms Emulate Root Complex (RC) or Add-In-Card (AIC)
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C/C++ Source Code Analysis
CODECHECK
CodeCheck is a programmable tool for checking all C and C++ source code on a file or project basis. CodeCheck is input compatible with all variants of Standard K&R C, Standard ANSI-C/C++, and all C and C++ compiler vendors. We support GCC-GNU Open Source C/C++ compilers. CodeCheck is designed to solve all of your Portability, Maintainability, Complexity, Reusability, Quality Assurance, Style Analysis, Library/Class Management, Code Review, Software Metric, Standards Adherence, and C++ Corporate Compliance Problems.
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Pharmaceutical Analysis Contract Services
Specialist pharmaceutical analysis contract services to support development programs (R&D), regulatory submissions, GMP manufacturing and post-marketing requirements Pharmaceutical analysis contract services can play an important role in your the development process and GMP manufacturing. Concerns about drug safety, costly development programs, complex manufacturing, market demands for evidence-based data and increased regulatory requirements are all issues that can be addressed through a better understanding of your drug substance, drug product or manufacturing process which, in turn, can only be achieved through experienced analytical studies and robust analytical data.
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Green House Gas Analysis
Gas chromatographs help analyze green house gases in air and soil. In addition to nitrous oxide, which is known by its high global warming potential, CO and CH4 are measured by a single analysis.
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Sample Analysis Services
Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Spectrum Analysis For P50xxB Up To 20 GHz
S970904B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Software Tools for Efficient Code Development and Analysis
Specador Documentation Generator
Specador is a tool that automatically generates accurate HTML documentation from comments inserted in the source code. It works in batch mode (command line) and uses dedicated language parsers.
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Data Acquisition & Analysis
Avionics Interface Technologies
We provide fully integrated avionics data bus and high speed network analyzer and data acquisition systems. Combining our extensive product catalog of Avionics interface modules, and our easy to use Analyzer software applications, with our Engineering Expertise, we are able to satisfy a wide range of avionics network data capture and analysis requirements with our COTS products or with customized solutions.
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Wafer Inspection Machine
IV-W2000
The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
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Analysis and Visualization of Arbitrary Test Reports and Result Data
TEST-GUIDE
Test execution in development projects leads to the accumulation of various reports and data. Test automation intensifies this, producing very high numbers of test executions, which are distributed over several users and test environments. This multitude of test results from different sources can be efficiently managed and analysed using TEST-GUIDE.
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Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Arc Flash Analysis
ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Impact Analysis
MetaDex™
Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.





























