Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Gas Analysis
QGA
Hiden Analytical supplies precise and user-friendly tools for quantitative gas and vapour analysis. Our compact Hiden QGA system is a high performance gas analyser configured for real-time continuous monitoring of multiple species with an extremely wide dynamic range.
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Mainframe Debugging and Analysis
Xpediter
Xpediter is Compuware's mainframe application interactive debugging and code coverage solution. When an application experiences a problem, developers need to get into an interactive test session to solve the issue. However, complex setup procedures make this a time-consuming step and delay the resolution process.Compuware's mainframe debugging and analysis tool Xpediter enables developers to get into an interactive test session with minimal effort and quickly move applications into production with greater confidence.
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Quantitative Analysis Program
AutoQuant Pro
AutoQuant Pro is a powerful new automated, multi-component, quantitative analysis program for analyzing gas phase mixtures in real time. The program provides a comfortable user interface for operating a MIDAC FTIR analyzer, defining analytical methods for computing concentrations of compounds, displaying and outputting results, and automating data collection for multiple sample stream installations.
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Wafer Test
Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Wafer Inspection System
INSPECTRA® Series
INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Multi-Track Spectral Analysis
FreqAnalyst Multi
FreqAnalyst Multi is a unique multiple tracks real time spectrum analyzer: it lets you visualize the spectral content of several audio tracks on the same screen with extreme smoothness and high resolution for both time and frequency. It is the ideal solution for mixing: you can use it as a frequency overlap detector and actually see which part of the spectrum every single instrument uses.
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MultiSite Test sockets and Wafer Level
multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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Wafer Prober
Prexa MS
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Signal Analysis
Histograph
The Histograph software is used for statistical signal analysis: finding the statistical values characterizing the signal and building the theoretic histograms based on the data obtained.
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Wafer Thickness Measuring System
WT-425
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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CS/ONH-Analysis
G4 PHOENIX DH
The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Battery Analysis Software
Battery characteristics vary over time and depend very much on maintenance and the environmental conditions of the specific application. Each installation tends to have its own 'fingerprint'. Capturing and managing this critical operational data has always presented a challenge to facilities managers. Recording and analysing data using traditional pencil and paper methods is both time consuming and prone to error.
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Harmonic Analysis Software
HI_WAVE
HI_WAVE simulates resonance and harmonic distortion in industrial, commercial, and utility power systems.
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In-Process Wafer Inspection System
7945
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Analysis In Real Time
Live Analyzer
Vibration Research Corporation
With Live Analyzer, you don’t have to wait until post-process to begin data analysis. View data in real-time and then pause the live stream to select, analyze, and export a section of the time waveform. Access the ObserVIEW graphing packages, employ averaging, analyze tachometer channels, and more.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Wafer Inspection System
JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Elemental Analysis Instruments
Chongqing TOP Oil Purifier Co., LTD
Your product description goes here.
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Analysis Software
We offer comprehensive software solutions for analyzing sound and vibration as well as communication and audio quality. Thanks to a modular structure, users can tailor specific solutions to their individual requirements.
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Catalysis and Thermal Analysis
A system for catalyst characterisation, reaction testing, kinetic and thermodynamic measurements.
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Spectrum Analysis
S96090B
The spectrum analyzer (SA) application adds high-performance microwave spectrum analysis to the analyzer. With fast stepped-FFT sweeps, the SA application provides quick spurious searches over broad frequency ranges.
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Image Processing and Analysis Software
ENVI
L3Harris Geospatial Solutions, Inc
ENVI is the industry standard for image processing and analysis software. It is used by image analysts, GIS professionals and scientists to extract timely, reliable and accurate information from geospatial imagery. It is scientifically proven, easy to use and tightly integrated with Esri’s ArcGIS platform.ENVI has remained on the cutting edge of innovation for more than three decades due in part to its support of all types of data including multispectral, hyperspectral, thermal, LiDAR and SAR. ENVI makes deep learning accessible to people through intuitive tools and workflows that don’t require programming. ENVI geospatial image analysis can also be customized through an API and visual programming environment to meet specific project requirements.
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Material Analysis Instrument
Thermogravimetric Analysis measures the amount and rate of change in the weight of a material as a function of temperature or time in a controlled atmosphere.
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Mercury Porosimetry Analysis
AutoPore V
The AutoPore V Series Mercury Porosimeters can determine a broader pore size distribution more quickly and accurately than other methods. This instrument also features enhanced safety features and offers new data reduction and reporting characteristics of your material.
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Time Domain Analysis
S96010B
The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Portable Wafer Probe Station
PS-5026B
High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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SF6 Gas Analysis Systems
Weshine Electric Manufacturing Co., Ltd
Discharges during switching operations in SF6 gas-filled plant lead, over time, to increased concentrations of toxic and highly corrosive decomposition products. The use of gas analysis instruments is absolutely necessary to monitor the concentration of harmful decomposition products, thus ensuring long-term plant safety.
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