Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Bluetooth Stack Analysis Tools
Bluetooth Explorer 400
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The Ellisys Bluetooth Explorer is a Bluetooth stack analysis tool for traffic monitoring, stacks and drivers debugging, interoperability verification and performance analysis.
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Audio Analysis
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The MCD AudioAnalyzer is used to test and calibrate analog and digital sound systems, or it can be used to convert analogue audio signals into digital form and vice versa. Also, the conversion of optical to electrical S / PDIF signals and vice versa can be done. The MCD AudioAnalyzer combines software (Toolmonitor MCD AudioAnalyzer) and hardware for the analysis and generation of analog and digital signals in the audio area.
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*Interferometer Fringe Analysis Software
IFA
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Optik Elektronik Gerätetechnik GmbH
IFA serves for the analysis of open interference fringes of interferograms. The system was developed as alternative of difficult and complicated solutions and is ideally suited for the employment in practice. IFA is a low-cost and easy to handle software, which includes all of the mostly used functions of data evaluation.
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04 With Pins For PCB | 3 Wafers | 24 Positions
04-3xx3-20/70-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Signal Analysis
Modal Analysis
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Modal Analysis is used for analyzing pulse and transition characteristics of signals coming from the input channels of FFT spectrum analyzers and seismic stations in real time or recorded time realization view mode.
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Water Fluoride Analysis
Aztec AFM631
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The Aztec 600 fluoride analyzer provides reliable and highly accurate measurement of fluoride concentrations to enable precise control of water fluoridation.
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Multiple Audio Tracks Analysis
Multi Pack
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Blue Cat's FreqAnalyst Multi plugin provide extremely smooth spectrum and frequency content analysis, the Blue Cat's StereoScope Multi analyzer let you visualize the stereo image of your audio content in details, and the Blue Cat's Oscilloscope Multi waveform viewer shows the waveform of audio signals as well as their phase relationship.
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Surface Analysis
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Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Town Gas Analysis
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Periodical monitoring of calorific values is necessary to ensure a stable supply of town gas. Since Shimadzu’s system GC is robust and designed for automated analysis, it is widely used for 24 hour/day online analysis in this field.
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Data Analysis Software
APP ClearView
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APP ClearView™ is the ideal data analysis software for engineeres and managers that need system information and answers quickly. It has a wide varity of graphics, math functions, reports, and file manipultion features that allow the user to easily navigate through their data. It supportsimporting of indisustry standrad formats such as COMTRADE (Common Data Transient Data Exchange) version 1996, 1997, and 1999.
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Enhanced Imagery Analysis
RVSAR™
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Textron Systems' RVSAR is an extension for our proven RemoteView™ software and provides capabilities to enhance the clarity of Synthetic-Aperture Radar (SAR) imagery. Users can employ an easy speckle suppression solution, allowing different filters to be applied either on a single page, or multiple polarization images on one page by using with MultiViews.
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Chemical Analysis
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Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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LED Type Wafer Alignment Sensor Controller
HD-T1
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Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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Mainframe Debugging and Analysis
Xpediter
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Xpediter is Compuware's mainframe application interactive debugging and code coverage solution. When an application experiences a problem, developers need to get into an interactive test session to solve the issue. However, complex setup procedures make this a time-consuming step and delay the resolution process.Compuware's mainframe debugging and analysis tool Xpediter enables developers to get into an interactive test session with minimal effort and quickly move applications into production with greater confidence.
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Bare Wafer Inspection System
LS-6700
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Hitachi High-Technologies Corp.
High sensitivity (50nm:Bare). High accuracy for COP/CMP discrimination (85%). High throughput (80 wph @300mm).High positioning accuracy (+/-30m). Wafer Size 300mm / 200mm.
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MPI PA Wafer Probers
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MPI Photonics Automation is the industry-leading provider of turnkey wafer test and measurement solutions. We offer a complete line of high-performance wafer probers designed to address the diverse and complex needs of the Photonics, Optoelectronic, Semiconductor, and Laser industries.
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Non-contact Inline P/N Checker Module For Solar Wafer
PN-100BI
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*Principle: Photovoltaic effect with the laser diode*Suitable for production line and tranceportation system*Connect to host PC by LAN to send measurement command and data
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Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Standard Modal Analysis
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EDM Modal Standard Modal Analysis provides the user with a complete arsenal of tools, from FRF data selection and parameter identification to results validation and mode shape animation.
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Video Quality Analysis Systems
ClearView Extreme 8K and 4K Systems
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Highest Resolution Video and Audio Quality Analyzers with 12G-SDI Interfaces and ST 2110 Networking Option
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Zero-footprint Timing Analysis For Critical Software
RapiTimeZero
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*Collect timing metrics from systems that produce branch traces* Identify code to optimize for worst-case behavior*Debug rare timing events*Simplify verification through integration with your CI tool*Analyze timing behavior of libraries without source code
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Complete Power Quality Analysis System
PK4564
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PK4564 complete Power Quality Analysis System includes PS4550 Power Quality Analyzer with extended memory, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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01 With Soldering Eyelets | 12 Positions | M10 | 2 Wafers
01-2xxx-00/30xx-12-N
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Multi wafer compact selector with 30° detent angle, 6 mm shaft diameter, 25'000 switching cycles and with up to 6 Ncm switching torque
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Aggregation Analysis System For Biopharmaceuticals
Aggregates Sizer
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The "Aggregates Sizer" aggregation analysis system enables the quantitative evaluation of particle amounts in the SVP range as a concentration (unit: μg/mL). Aggregations of biopharmaceuticals can be categorized into 3 ranges: IVP (In-visible Particle), SVP (Sub-visible Particle), and VP (Visible Particle), according to their particle size. Until now, no particle size analyzer could cover the SVP range with a single measurement. Therefore, multiple methods had to be used. Aggregates Sizer completely covers the SVP range.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
