Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Stand Alone Wafer Sorter
MicroSORT
The Microtronic MicroSORT semiconductor wafer sorter is designed to maximize throughput while minimizing wafer handling in a user-friendly operating environment. This stand-alone semiconductor wafer sorter enables sophisticated semiconductor wafer sorter routines for up to 4 wafer-cassette platforms. MicroSORT semiconductor wafer sorter reads OCR scribes from the top, bottom, or simultaneously, allowing for enhanced semiconductor wafer tracking and sorting. The MicroSORT semiconductor wafer sorter’s basic functions include the ability to move, compress, randomize, find, align, verify, and split semiconductor wafer lots. With our virtual tweezer mode, an operator can click on wafer icons to move wafers between cassettes, read semiconductor wafers, and swap wafer positions.
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In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Wafer Thickness, TTV, Bow and Warpage
ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
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Acoustic Analysis
Includes cursor readout of dB bands, max & min lines, noise curve overlays, pink noise generator, and optional STC Transmission Loss.
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On-line FT-NIR Analysis
MATRIX-F
The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Data Acquistion & Analysis Software
NextView 4
One software for everything. NextView®4 covers the entire world of PC measurement data acquisition: displaying live data, recording measured values, analyzing your measurement applications - and much more.
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Data Acquisition & Analysis
FlowCam 5000
Yokogawa Fluid Imaging Technologies, Inc.
FlowCam 5000 is our most affordable instrument. Streamlined for rapid data acquisition and analysis, it quickly and easily images, measures, analyzes, and counts microparticles suspended in a fluid medium.
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Blade Timing Analysis Software
Blade Timing BT
APEX Turbine Testing Technologies
BT is a data analysis software product for post-processing tiptiming data from laser-based and capacitance-based tiptiming systems (also known as NSMS).
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Data Acquisition & Analysis
American Environments Co., Inc.
American Environments facilities are equipped with automated data acquisition systems.
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Probing & Analysis Adapters
No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Enhanced Analysis Module
DR YIELD software & solutions GmbH
The YieldWatchDog Enhanced Analysis Module (EAM) provides additional options for data visualization and correlation analyses. It transforms your YieldWatchDog client into a fully-functional Yield Management System (YMS).
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Structural Analysis
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Circuit Breaker Analysis System
Weshine Electric Manufacturing Co., Ltd
1. Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Nucleic Acid Analysis And Protein Characterization
Utilizing automated microfluidic capillary electrophoresis (micro-CE) technology, our instruments enable the user to simplify the process of traditional gel separations, resulting in even more accurate and reproducible data in a fraction of the time. Separate, identify and analyze genomic and protein samples in seconds and visualize your data as an electropherogram, virtual gel, or tabular report.
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Professional Audio Test And Analysis Software
AudioExpress
Guangzhou Jumho Electric Co., Ltd.
AudioExpress contains a full range of audio solutions, including acoustic experiment, electro-acoustic analysis, environmental test, advanced signal processing, report generation, and data sharing. Electro-acoustic product test: amplifier, headset, cell phone, speaker, microphone, MP3
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Data Analysis Software
PV II
Software to communicate and display data from PQPro™ Power Quality Analyzer.Can connect wirelessly (Bluetooth) to multiple instruments.View real time data numerically, vector diagrams and analog meter format.View downloaded data in graphical form.Multiple graphical pages can be open at the same time.Graphs can be annotated with data boxes and text bubbles.Graphs can be pasted in to Word or Excel files.Export data in CSV format.Export data in PQDIF format.Export section of data file to PV II format.Generate reports with both graphical and tabular data.
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Inline Wafer Testing
IL-800
Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Seismic Analysis Software
GeoSonics announces our latest software suite. AnalysisNET is the most comprehensive and advanced software for GeoSonics 3000 Series seismograph. The software combines Seismic Analysis and Event Manager software in a single package that employs the .NET framework. AnalysisNET allows easier access to data files provides multiple report combinations and gives you the ability to manage your data.
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Software Composition Analysis
SCA
Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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WAFER MVM-SEM
E3300 Family
The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Static Analysis Tool
CodeSonar
Automated static analysis designed for zero-tolerance defect environments. CodeSonar, GrammaTech''s flagship static analysis software, identifies programming bugs that can result in system crashes, memory corruption, leaks, data races, and security vulnerabilities. By analyzing both source code and binaries, CodeSonar empowers developers to eliminate the most costly and hard-to-find defects early in the application development lifecycle.
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Material Analysis Laboratory
Trialon’s world class Material Analysis Laboratory consists of state-of-the-art equipment and experienced staff. Our specialty is to determine failure analysis of design, material, process and root cause in both current and future products across multiple industries.
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Analysis Software
Analysis software that can streamline how you collect, analyse and report your bat call data.
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Portable Fuel Analysis
MINISCAN IR Vision
The MINISCAN IR VISION is a high speed, compact and robust FTIR fuel analyzer for the comprehensive and automatic measurement of gasoline, jet and diesel fuels. The analyzer is configured to measure more than 100 fuel parameters and components for fuel blending, for quality inspection and to check compliance with fuel specifications directly at the point of sale.
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Silicon & Compound Wafers
Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Static Image Analysis System Particle Size
PSA300
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Big Data Analysis Platform
Essentia
Essentia is a highly efficient and highly scalable solution for managing, processing and analyzing vast amounts of unstructured, semi-structured and structured data stored in cloud data lakes. This can be categorized as big data and/or complex data.
