Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Universal Analysis Tool
CANalyzer
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CANalyzer is the universal analysis tool for ECU networks and distributed systems. CANalyzer makes it easy to observe, analyze, and supplement data traffic in CAN, LIN, MOST, or FlexRay systems. With powerful functions and user-programmability, all needs are covered from simple network analysis to advanced troubleshooting of complex problems.
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Product
Single or Multi-track Spectrum Analysis
FreqAnalyst Pack
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Get all you need to analyze the spectrum of your audio projects: the Blue Cat's FreqAnalyst Pro plugin offers you high precision and advanced audio to MIDI CC capabilities for single track spectral analysis, and Blue Cat's FreqAnalyst Multi is a unique solution for multi-tracks spectrum monitoring. These plugins will help you see what you cannot hear.
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Product
04 With Pins For PCB Or Soldering Eyelets | 12, 24 Positions | 1 - 4 Wafers
04-Selector-Overview
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Very robust, multi wafer selector with up to 24 positions, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Winmeter Battery Analysis Software
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Explorer Technology Group (ETG)
The Winmeter Battery Analysis Software enables the user download and integrate data from the DMA-35n-BATT, DSG-30 or DLV-30 products and produce text and graphical battery analysis reports. With these reports, the user can quickly identify batteries that are likely to require preventative maintenance.
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Product
Finite Element Analysis (FEA) Solution
Femap
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Siemens Digital Industries Software
Femap is an advanced engineering simulation software program that creates finite element analysis models of complex engineering products and systems, and displays solution results. Femap can virtually model components, assemblies or systems and determine the behavioral response for a given operating environment.
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Product
Complete Graphical Power Quality Analysis System
PK5064-PRO+
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The PK5064-PRO+ is the top choice for comprehensive power quality studies, energy audits, load studies, harmonic analysis, and more. Wide-range flexible current probes allow you to get into tight and confined spaces, wrap around large conductors, and measure almost any AC circuit that comes your way.
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Product
Wafer Test Solutions
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Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Product
Data Collection and Analysis System
3002
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The Model 3002 SER System is a state of the art data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER) data in conformance with PRC-002-1 and PRC-018-1.
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Product
PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
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The optional LLDP Emulation feature allows a PSA-3000, PSL-3424L, or PSL-3000 test port to behave just like an 802.3at or 802.3bt PD that uses LLDP to convey its power demands. 802.3 PoE LLDP is a special variant of LLDP protocol that involves handshakes and protocol timing between a PSE and a PD.
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Product
Video Quality Analysis Systems
ClearView Shuttle 4K and IP Systems
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4K, HD, and SD Video and Audio Quality Analyzers Portable, Desktop, and 2RU Rackmountable
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Product
Pro Antenna Analysis Software
MININEC
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MININEC Pro is an antenna analysis program for Windows and Macintosh computers. Any type of antenna may be analyzed. The physical design of the antenna is entered (such as the lengths of wires and elements). For a given frequency, the feedpoint impedance is calculated, along with theoretical efficiency.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Bond Tester for Wafers 2 - 12 inch
Sigma W12
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Bondtester for wafers or at wafer level 2” – 12” (up to 300 mm)Precise testing and Cold Bump Pull (CBP) testingLarge X/Y stages X: 600mm, Y: 370 mmForce range from 1gf – 10 kgfBump pitch down to 20 µm
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Product
Software for Configuration, Logging and Analysis
LMG-CONTROL
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ZES ZIMMER Electronic Systems GmbH
Real-time display of configuration and measuring valuesTransfer of up to 3000 measuring values per secondTimestamps with a resolution of 1 millisecondVersatile analysis of sampling valuesExport of measuring values to other applications
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Product
On-line FT-NIR Analysis
MATRIX-F
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The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Product
Spectrum Analysis, Up To 13.5 GHz
S930901B
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The S930901B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 13.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Data Reporting and Analysis Software
TRACS
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TRACS (Trending-Reporting-Analysis-Capture-Software) is a graphical reporting software tool, which runs over a network and captures data from connected machines for analysis and reporting from a remote computer. Developed in partnership with AutoCoding Systems, TRACS displays live and historical batch data for all production runs and is designed to work with LOMA’s Metal Detectors, Checkweighing, X-ray Inspection and Combination Systems.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
04 With Soldering Eyelets | 3 Wafers | 24 Positions
04-3xx3-00/30-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Microchip Electrophoresis System For DNA/RNA Analysis MCE™
202 MultiNA
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This system is used to analyze the size of DNA/RNA samples, with convenientanalytical operability. It achieves analysis costs on par with agarose gel electrophoresis, and can perform fully automatic analyses of up to 108 samples. Using optimized reagent kits (four types for DNA analysis and one type for RNA analysis), the system achieves a high resolution and high sensitivity. It can significantly improve the workflow for mutation checks in genome editing, and genotype determination.
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Diagnostic Laboratory Software And Data Analysis
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Enhance the way you manage quality control data, build connectivity in diagnostic workflows, ensure system security, and more with our diagnostic laboratory software and data analysis tools.
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Product
Enhanced Time-Domain Analysis With TDR
S95011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications. All functionality of the S95010B are included (TDR/TDT mode). In addition, the S95011B enables more detailed measurements and evaluations, such as eye-diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S95011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical calibration kits or ECal with DC option (i.e., N469xD or N4433D with Option 0DC) are recommended.
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Product
Datalogger for IAQ Analysis
HD37AB1347
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Datalogger for indoor air quality analysis (IAQ). Measurement of airspeed, temperature, relative humidity, atmospheric pressure, CO² and CO.
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Product
Solder Paste Analysis
SPA1000
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The SPA 1000 also introduces new process control capability by accurately measuring the suitability of the solder paste prior to its implementation on the production line. It achieves this by determining the "Open-Time" for the paste. It also performs the Slump Test and both of these methods provide a "Go/No Go" answer in less than 30 minutes to ensure minimum delay for the production line.
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Product
Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Product
*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Gas Analysis
Si-CA 130
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The Si-CA 130 features a touch-screen display and comes with PC-based management software (in addition to the smartphone app) for more in-depth combustion gas analysis. The three field-replaceable cells and sensors offer expanded measurement capability.
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Product
Data Acquisition and Analysis Software
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Matec Instrument Companies, Inc.
Matec provides a full suite of Microsoft Windows pc-based data acquisition and analysis software for your ultrasonic testing applications. In addition to our base software packages, our team of software engineers can work with you to develop customized scan forms and algorithms specific to your application demands.
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Thermal Testing And Analysis
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Response Dynamics Vibration Engineering, Inc.
We have consulted on thermal issues ranging from conduction issues in TECs, thermal radiation modeling, and countless air cooled system issues relating to system performance, vibration, and acoustics noise. We use a wide array of thermocouple instrumentation, thermal imaging, flow measurements, as well as finite element analysis and analytic modeling to measure, design, and debug thermal and related issues. We often work on customer products in our Response Dynamics lab where we characterize the system, engineer solution options, and prototype solutions. We then work with the customer to work the winning solution into their quality control and manufacturing process.
