Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Water Iron Analysis
Aztec AW633
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The Aztec 600 colorimetric iron analyzer provides reliable and accurate measurement of iron concentrations to improve drinking water quality and optimize chemical usage.
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Product
PCIe Exerciser & PCIe LTSSM Exerciser with L1 Substate Analysis
U4305B
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Supports 2.5 GT/s (Gen1), 5.0 GT/s (Gen2) and 8.0 GT/s (Gen3) speeds Link width support x1 through x16 lanes Standard PCIe half-size card form factor to fit into most platforms Emulate Root Complex (RC) or Add-In-Card (AIC)
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Wafer Thickness Measuring System
WT-425
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Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Neutrals, Radicals and Ions Analysis
HPR-60 MBMS
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The Hiden HPR-60 molecular beam mass spectrometer is a compact skimmer inlet MS for the analysis of atmospheric plasma and reactive gas phase intermediates.
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In Vivo Signal Detection & Intelligent Image Analysis Software
VISQUE®
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Patented algorithms for kinetic analysis of molecular diffusion phenomenon- Tmax, Tarrival, Imax, Iarrival, Trising, 1st Peak, FluAngio, DyAngio, etc.Kinetics visualization with feature mapsTime-series kinetics graphs
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Network Forensic Analysis
nChronos
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nChronos is a Network Forensic Analysis Application for high performance & critical enterprise networks. It combines nChronos Console and nChronos Server to deliver the capability of 7*24 continuous packet capturing, unlimited data storage, efficient data mining and in depth traffic analysis.
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Corrosion Analysis
Resipod
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Resipod is a fully integrated 4-point Wenner probe, designed to measure the electrical resistivity of concrete in a completely non-destructive test. It is the most accurate instrument available, extremely fast and stable and packaged in a robust, waterproof housing designed to operate in a demanding site environment. The Resipod is the successor of the classic CNS Farnell Resistivity Meter.Surface resistivity measurement provides extremely useful information about the state of a concrete structure. Not only has it been proven to be directly linked to the likelihood of corrosion and the corrosion rate, recent studies have shown that there is a direct correlation between resistivity and chloride diffusion rate and even to determination of early compressive strength. This makes it one of the most versatile NDT methods for concrete.
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Circuit Breaker Analysis System
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Weshine Electric Manufacturing Co., Ltd
1. Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
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Gas Analysis
Si-CA 130
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The Si-CA 130 features a touch-screen display and comes with PC-based management software (in addition to the smartphone app) for more in-depth combustion gas analysis. The three field-replaceable cells and sensors offer expanded measurement capability.
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Product
Time Frequency Analysis Function
OS-0527
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This function can evaluate transient phenomena that were difficult to capture by FFT analysis, and display clearly time change of the frequency component while maintaining its frequency resolution . The OS-0527 is equipped with STFT (Short Time Fourier Transform) and Wavelet transform.
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Data Analysis
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Power Monitoring and Diagnostic Technology Ltd.
PMDT Engineers are always available to review your test samples and to provide guidance to users in the field. Our PD experts have the ability to accurately analyze various types of field test data based on PRPD/PRPS spectrums, waveforms and audio files collected during a field test.
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Image Analysis
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In today's demanding environment where quality assurance is an everyday requirement Aprotec have sought to find present day retrofit solutions that compliment fully functional older machinery.
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WAFER MVM-SEM
E3300 Family
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The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Complete Power Quality Analysis System
PK4564-PRO+
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This system contains the essentials for almost any power quality study in the world. Other tiers in the PK4564 class include the standard PK4564 and PK4564-PRO systems.
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Image Analysis Software
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Olympus image analysis software turns an Olympus microscope into an effective, high-performance analysis station. Its intuitive operation enables smooth image acquisition, filtering, measurement, documentation and archiving.
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Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
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L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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PathWave BenchVue Advanced Power Control And Analysis For Multiple Instrument Connections
BV9200B
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Control and analyze voltage and current measurements from multiple N6705C, N7900 or RP7900 Series
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Powertrain Analysis System
KiBox2
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With the KiBox2 analysis system, you have all the data related to vehicle powertrains under control.
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Ballistics Analysis Software
BallAX 4
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BallAX 4 is used to acquire and analyse measurement data from firearms, guns, artillery, projectiles and grenades using different ammunition and explosive propellants. Data gathered by the software aids in determining the accuracy and consistency of a projectile before it exits a firearm. Manufacturers of firearms ranging from basic hunting rifles to critical military artillery will benefit from the precision data afforded by this industry-specific software module.
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Shock Response Spectrum (SRS) Analysis Solution
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Shock Response Spectrum (SRS) Analysis SolutionMechanical shock pulses are often analyzed in terms of the shock response spectrum. The shock response spectrum assumes that the shock pulse is applied as a base input to an array of independent single-degree-of-freedom systems. SDOF system assumes that each system hat its own natural frequency.
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Dynamic Particle Image Analysis System
iSpect DIA-10
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Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Noise & Vibration Analysis
DATS Software
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DATS is a comprehensive package of data acquisition, signal processing and reporting tools. It is used mainly for noise and vibration analysis, but can be used for a wide range of engineering and general signal processing tasks.
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Combustion Analysis
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The Phoenix family provides combustion analysis solutions for both in-cell and in-vehicle testing.
