Defect
other than specified, imperfection .
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Product
Ultrasonic Flaw Detector
MFD550B
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Based on ultrasonic principle, digital ultrasonic flaw detector MFD550B can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it show the defect clearly under the dim light and strong sunlight environment. 0-9999mm measuring range can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium ion battery module，it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways inone body, customers with different habits can operate it freely. With comprehensive performance self-checking function, it can automatically generate test reports and support for many languages. With high cost performance, it is the smart choice for the practical economic model of ultrasonic testingequipment.
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Product
Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
FTIR Microscopes & Imaging Systems
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Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Product
Static Analysis
SAST
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Coverity® is a fast, accurate, and highly scalable static analysis (SAST) solution that helps development and security teams address security and quality defects early in the software development life cycle (SDLC), track and manage risks across the application portfolio, and ensure compliance with security and coding standards.
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Product
Wiring Analyzers for Cables, Wire Harnesses, Backplanes
CableEye M2Z, M3Z, M4
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With our cable testers and harness testers, find defective or miswired cables instantly before they damage equipment or waste valuable technician time. CableEye® all-in-one test and cable management systems have a unique, patented graphic wiring display to visually pinpoint problems when wiring errors are detected, and offer under a second pass/fail testing for production environments. Quickly locate intermittent connections and identify their position in the cable.
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Product
Circuit Breaker Time Interval Meter
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Measuring contact timings is useful for finding the contact bounces and non-simultaneity of contacts. This helps in finding the possible electrical or mechanical defects in the circuit breaker contacts. Timing analysis also make it possible to detect incorrect mechanical adjustments and wear phenomena of the circuit breaker by measuring the differences between the fastest and slowest phases.
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Product
Full 3D Inline Metrological & Imaging AOI
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Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
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Product
SOLAR CELL TESTER
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The tester is designed for terrestrial solar cell incoming/outcoming inspection with the purpose of checking and optimizing parameters and preventing manufacture defects of solar modules. Solar cells are not heated in process of inspection due to the use of xenon pulse lamp installed in the tester.
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Product
Textile Testing Instruments
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Dongguan Amade Instruments Technology Co., Ltd
Textile testing instruments are developed to determine the quality and performance of various fibrillar component fabrics, structural fabrics, garments, home textiles and other textiles by physical and chemical methods in conformance with international standards. By using scientific testing methods to judge the quality of materials or final products, manufacturers of textiles are capable of detecting the defects and unqualified products to correct problems in time, conducive to reducing loss and maintaining the business reputation. Testings cover tensile strength, tearing strength, seam slippage, joint strength, bursting strength, resistance to wear, pilling resistance, color fastness to washing, rubbing fastness, light fastness, color fastness to perspiration, dimension stability, inflaming retarding test etc.
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Product
Ultrasonic Optical Flaw Detector
MIV-X
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Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively.
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Product
Intelligent Cable Fault Locator
TM800
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TM800 Cable Fault Locator is a portable field instrument working on TDR and bridge methods, adopting advanced micro-electronics technology. It is designed to locate accurate fault points in such cables as telecommunication leadsheathed cable, plastic cable or user’s lead covered wire, while the faults include break, mix, earthing, defective insulation, or poor connecting. It is and ideal function-stable instrument for the field operator to improve work efficiency, in addition, it can also be used for circuitry project checking electric property testing of the cable.
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Product
Electronic Inspection Systems
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Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
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Product
Holiday Detector
VHD
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Veer Electronics Make Holiday Detector is Capable to Detect Any Pinhole or Defects .In Anticorrosive Coating on Metallic Pipes/Surfaces. The Pipe is connected to Earth and Electrode Charged to High Tension is moved over Coating. If Any Pinhole or Defective Point is detected on Coating High Voltage Spark Occurs on Pipe or Surface of Testing. At the Same time Electronic Buzzer also gives Audio Indication and Fault LED glows as Visual Indication of Fault.
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Product
Surface Paint Quality Scanner
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Konica Minolta Sensing Americas, Inc
There is always a challenge to achieve a consistent high quality surface on a car body during production. The goal of the manufactures is to reduce defects and, quickly and accurately fix the ones that occur.
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Product
Automated Optical Inspection (AOI)
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Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Product
Welding Resistance Tester
WRT
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The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
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Product
DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
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Identifies defect position instantly- contributes to saving inspection time
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Product
19" 1He PCIe To PCIe Erweiterung With 4 PCIe X8 Gen-2 Slots
ExpressBox4-1U-xG2, EB4-1U-EXT
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The PCIe Expansion ExpressBox4 1U-x8G2 provides a cost-effective path to expand your available number of PCI Express slots while maintaining a consistent server configuration. Magma products provide increased I /O capacity and scalability because multiple expansion systems can be combined to provide an almost unlimited number of PCI Express slots to a single computer. The ExpressBox4 is the only expansion solution that provides four full-length PCI Express slots in 1U rack-mount form factor. The enclosure includes a hot-swappable redundant power supply and hot-swappable cooling fans. The PCI Express slots are hot-swappable allowing you to replace a defective card without shutting down the system.
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Product
Power Steering Tester Kit
PST22A
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Pinpoints defective power steering pumps, defective power steering gears and kinked or clogged power steering lines.
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Product
DI Lab System™
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Comprehensive Product Engineering and Failure Analysis Lab system for complete device analysis and physical defect isolation.
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Product
Thermal Shock Chambers
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We provide a large selection of thermal shock chambers to accommodate various types of product testing. Thermal Shock Chambers perform tailored environmental stress screening of component and board electronic assemblies. Our unique chamber design transfers product between two extreme temperature-controlled chambers, passing equal volumes of high velocity conditioned air over the product and resulting in rapid product temperature changes. The induced thermal stresses can reveal hidden manufacturing defects in electronic sub-assemblies and other components by the expansion and contraction of critical parts.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Product
Defect Isolation
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*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Product
Backplane Profiling & Inspection System
603d
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A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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Product
Magnetic Particle Inspection
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Is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
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Product
Vibration Testers
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Analyzes vibration patterns within mechanical systems or individual components and structures to identify defects and evaluate the test object's overall condition.
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Product
Environmental Stress Screening
E.S.S
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King Design Industrial Co., Ltd.
E.S.S system could find most potential and hiding defects earlier by checking the physical property of allmaterials and components, and make use of their nature response under Environmental Stress. Through our screening will to pick out all potential and hiding defects in advance and improving the product's reliability inling. It benefits the manufacturer and customer mutually.
