Defect
other than specified, imperfection .
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Product
Automotive Solutions
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Over the years, we have acquired profound, specific expertise in a number of areas, especially with respect to RF assembly and antenna technology testing. To give an example, we have acted as general contractor for implementing a number of rotary indexing tables for testing and labelling antenna amplifiers. The implementation as a rotary table has a number of advantages, since all mounting and test processes, as well as the handling of defective parts, are interlocked and concatenated, thereby effectively eliminating possible error sources during these process steps.
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Product
Software For Visualizing Surface Quality
STATOVISION
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Foerster Instruments, Incorporated
In combination with a STATOGRAPH module, the STATOVISION software enables the visualization of eddy current signals in a clearly arranged C-Scan. This results in an image of the surface quality of the components, allowing surface defects to be precisely localized. A major advantage of the STATOVISION software is the pattern recognition, which can be used for surpressing drill holes on brake discs, for example. The documentation of the entire scan is used for continuous quality assurance.
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Product
Downward-Looking SUMO Source For Gallium And Indium
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Attain large capacity, excellent flux uniformity, negligible shutter flux transients, and minimal depletion effects with Veeco’s Downward-Looking SUMO® Source for MBE. It combines a dual filament source with an asymmetric SUMO crucible featuring a narrow offset orifice and tapered exit cone with hot-lip heating. Result: excellent material quality, low defect counts, and good thickness uniformity. NOTE: This source is not for use with aluminum.
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Product
WireChop
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A cost-effective, proven defect chopper system that works with both bench presses and automatic machines
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Product
PXI Fault Insertion Insertion Switch Modules
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Our PXI Fault Insertion Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect – all of which can simulate connectivity problems in the system.
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Product
Package Leak Detectors
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Packages should be absolutely leak tight. However, even with the utmost care in the process, faulty packaged products cannot be completely avoided. Defects in the sealing process or in the material can easily lead to leaks, sometimes microscopically small.
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Product
SOLAR CELL TESTER
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The tester is designed for terrestrial solar cell incoming/outcoming inspection with the purpose of checking and optimizing parameters and preventing manufacture defects of solar modules. Solar cells are not heated in process of inspection due to the use of xenon pulse lamp installed in the tester.
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Product
High Power Burn-In Test
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Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Product
Surge Tester
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They are designed to detect quality defects in the insulation between winding turns, ensuring the reliability and performance of electrical components.
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Product
Precision LCR Meter (20Hz to 2MHz)
ST2840
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ST2840 series pricision LCR meter innovatively adopts a new generation of technologies such as dual CPU architecture, Linux bottom layer, 10.1-inch capacitive touch screen, built-in instruction which effectively solves the defects of slow LCR test, single display and complicated operation in the past.The measurement frequency of ST2840 series is from 20Hz-500kHz/2MHz, which makes up for the shortcoming of lack of high-performance bridge in the frequency range of 500kHz.
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
EasySegment
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Unsupervised mode: train only with “good” images to detect and segment anomalies and defects in new imagesSupervised mode: learn a model of the defects for better segmentation and detection precisionWorks with any image resolutionSupports data augmentation and masksCompatible with CPU and GPU processingIncludes the free Deep Learning Studio application for dataset creation, training and evaluationOnly available as part of the Deep Learning Bundle
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Product
Semiconductor Inspection (SEMI)
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A process for detecting any particles or defects in a wafer.
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Product
Automated Live Fish Measuring System
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The system for measuring and identifying aquatic organisms is designed to measure the linear dimensions and volume of live fish on a conveyor. The conveyor speed can reach 2.5 m / s, that is, up to 5 fish can pass through the installation in one second.The measurement of the thickness and volume of fish is carried out using a specialized camera Sick Ranger D40, which works on the principle of laser triangulation.The camera operation is synchronized with the conveyor movement using the Sick DGS-60 encoder.The industrial color camera Basler Scout scA1300-32gc is used for measuring the linear dimensions of fish (length and width), as well as highlighting characteristic features of different types (color of scales and fins) and possible defects.
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Product
Voltage Detector
PocketDetect LR
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Hachmann Innovative Elektronik
With a PocketDetect LR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working.
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Product
Alternator/Battery Load Tester
6031
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• Tests for defective alternator diodes including GM trio test• Performs complete battery test• 125 Amp load checks state of charge • Searches for excess starter current and alternator/regulator output voltage• Includes test lead set (610271)• Made in USA of US and Global Components
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Product
Vacuum Inspection
INDEC
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INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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Product
Ultrasonic Immersion Probes
SONOSCAN I
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The SONOSCAN immersion transducers for Non-destructive Testing (NDT) are mainly used to test metals and plastics for the smallest material defects. For example, binding defects, welding defects or cracks and pores in metal parts can be detected. The powerful, robust ultrasonic probes can be connected to all common ultrasonic testing devices. Due to variable designs and sizes, the immersion probes guarantee optimal use. In addition to ultrasonic standard pobes, we also offer customized transducers according to your individual specifications.
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Product
Composite Damage Checker
35RDC
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The handheld 35RDC is a simple Go/No-Go ultrasonic instrument designed to detect subsurface defects caused by impact damage on solid laminate aircraft composite structures. The 35RDC features a backlit LCD that displays the word GOOD if no subsurface damage is found or the word BAD when it detects subsurface damage.
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Product
Portable Eddy Current Flaw Detectors
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Portable eddy current (EC) flaw detectors inspect metallic parts and perform highly reliable and advanced flaw detection of surface and near-surface defects. Olympus offers portable eddy current equipment to meet a broad range of applications, including the detection of surface or near-surface defects, and the inspection of bolt holes.
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Product
Voltage Detector / Phase Comparators
VisualPhase
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Hachmann Innovative Elektronik
With the VisualPhase line you get a type series of handy, exact and easily operated multi-functional devices with integrated voltage detectors, phase comparator and maintenance testers. Equipped with a thorough self test to ensure reliable function, a permanently enabled interface-tester to warn against defect interfaces and the connectability to HR, MR, LR, LRM or LRP string parts every VisualPhase delivers uncompromising safety.
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Product
Static Code Analysis Tool
Klockwork
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Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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Product
3D CT AXI
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PCB manufacturers can enjoy comprehensive, high-speed inspection with Omron’s revolutionary technology that reliably captures defects in hidden areas.
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Product
Defect Inspection System
NovusEdge
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The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
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High-Accuracy Automated Optical Inspection Systems
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Fully-automated and high-accuracy 3D inspection and measurement systems. High-power, long working distance optics and high-resolution digital camera are perfect for high-magnification applications. These are full-color systems capable of high-accuracy measurements, automated defect detection and color verification.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
E-beam Metrology And Inspection
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Our HMI e-beam solutions help to locate and analyze individual chip defects amid millions of printed patterns.
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Product
EasyClassify
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Includes functions for classifier training and image classificationAble to detect defective products or sort products into various classesSupports data augmentation, works with as few as one hundred training images per classCompatible with CPU and GPU processingIncludes the free Deep Learning Studio application for dataset creation, training and evaluationOnly available as part of the Deep Learning Bundle
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Product
Contour Check Shape
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Contour Check Shape has proven itself in hot rolling of long products and is an essential part of the rolling process in many factories. It checks hot and cold steel profiles with the help of three-dimensional surface reconstruction. Thus, it records geometrical errors due to rolling defects including surface defects like scale seams, shells or roller outbreaks.
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Product
Fully Automatic Full Load (Routine) Testing Panel For Induction Motor
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Aarohi Embedded Systems Pvt. Ltd
Aarohi introduced fully automatic routine testing panel. The primary purpose of the routine test is to insure freedom from electrical and mechanical defects, and to demonstrate by means of key tests the similarity of the motor to a “standard” motor of the same design. this panel also help to enhance productivity, Work efficiency & reduces need for skill operator. More then 500 Indian pump manufacturer ware installed this system & satisfied with performance.
