Defect
other than specified, imperfection .
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Product
Wafer Inspection System
INSPECTRA® Series
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INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Product
Semiconductor Inspection (SEMI)
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A process for detecting any particles or defects in a wafer.
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Product
Manual Testing Services
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With manual testing services, we will hand-pick a team dedicated solely to your project. Our professionals will work with your developers, business analysts, and managers to go over requirements, build a comprehensive test plan, design thorough test cases, rapidly execute the tests, help remediate defects, and retest until the project is satisfactorily completed. The same individuals will be with you from beginning to end, so they have a complete understanding of the project and how you want it done, and you will always know exactly who you are dealing with. The same QA Engineers that develop the test cases will also execute them, leaving no room for misunderstandings and greatly expediting the process.
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Product
Single, Double Power Cord Tester
LX-30A+
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Shenzhen Lian Xin Technology Co., Ltd.
Meet UL, VDE, CSA, SAA, T-MARK, KS. IRAM, CCC and other countries’ standards .．·used to test single – ends ,double –ends ,three-ends power supply cords.．·Auto and continuous test in COND,Insulation Resistance ,Leakage Current, Line-to-line Hi-pot(inside HV), Leaking copper(outside HV), relative length,．·Auto test the fine and detective goods, tested qualified ones can be be ejected by ejector pin and marked , automatic cutting defective products， and alarmed with voice prompt and light,
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Product
Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Product
Terahertz imaging cameras
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The detectors are fabricated with a GaAs high-mobility heterostructure in the standard semiconductor cycle using conventional optical lithography. The imaging sensor is manufactured on a single wafer. That process ensures high homogeneity and reproducibility of the plasmonic detector parameters (pixel-to-pixel deviation responsivity is within a 20- percent range). Each detector unit has a room-temperature responsivity up to 50 kV/W with read-out circuitry and noise-equivalent power of 1 nW/\sqrt{\rm{Hz}} in the frequency range 10 GHz — 1 THz. The detection mechanism is based on excitation of plasma oscillations in a two-dimensional electron system with subsequent rectification. The rectification takes place on special defects made in the electron system.
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Product
Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
DI Lab System™
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Comprehensive Product Engineering and Failure Analysis Lab system for complete device analysis and physical defect isolation.
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Product
Portable Eddy Current Flaw Detectors
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Portable eddy current (EC) flaw detectors inspect metallic parts and perform highly reliable and advanced flaw detection of surface and near-surface defects. Olympus offers portable eddy current equipment to meet a broad range of applications, including the detection of surface or near-surface defects, and the inspection of bolt holes.
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Product
Ultrasonic Optical Flaw Detector
MIV-X
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Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively.
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
Surface Defect Inspection System
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Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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Product
Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Product
Ultrasonic Flaw Detector
MFD500B
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Based on ultrasonic principle, digital ultrasonic flaw detector MFD500B with 320*240 TFT LCD, it can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. It can be used in Laboratory as well as in engineering filed. With range of 0-9999mm, it can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium battery module, it can be long standby for months. High quality with low price, it is the first choice for the practical economic model for ultrasonic testing equipment.
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Product
Automatic and Accurate Inspecting Systems
Circuit AOI
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The Circuit AOI system is designed to perform automatic and accurate inspecting systems. It integrates rigid mechanical system with advanced vision technology and manufactured and tested by strict is standards. It is suitable for circuit inspection for PCB/FPC, verification and repair. Innovation and unique inspection algorithms are applied to inspect open, short, protrusion, nick, scratch, pin hole, island, line width/space violation, object missing and others defects. AOI system can use offline setup project and check results. It will improve the throughput.Compare to halogen lighting, the full angle LED lighting of Circuit AOI can obtain the best image contrast and is good for different panel type inspection.
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Product
X-Ray Inspection
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X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Product
Protection Device Testing
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The Motwane Manufacturing Company
Power system protection is a branch of electrical power engineering that focuses on protecting electrical power systems to detect and isolate faulty parts. The objective is to keep the power system stable by separating only the defective components while keeping the rest of the network in operation. The device protects the transmission lines, generator transformer, and other electrical apparatus from multiple faults.
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Product
Tool and Process Monitoring
BK MIKRO
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BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
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Product
Weatherometer with Air Cooling System, 80 Liters, 175 Liters, 225 Liters
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Wewon Environmental Chambers Co, Ltd.
Weatherometer test is important to bring out the defects in something and to ensure its durability. The weatherometer result will make us identify those areas which need immediate improvements. But, there are areas where basic testing is not enough and does not do the job perfectly. To meet the high quality requirement, there is a need to perform extensive weatherometer testing on some materials. A place where such kind of testing is conducted is the xenon weatherometer.
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Product
Digital In-Circuit tester
MTS180/300
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Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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Product
Superior Handheld Partial Discharge Detector
PDStar
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Power Monitoring and Diagnostic Technology Ltd.
PMDT is proud to present one of our latest innovations, the PDStar. It integrates On-Line Partial Discharge (OLPD) testing and Infrared testing for MV and HV equipment, which combines UHF, AE, Ultrasonic, HFCT, TEV, and Infrared testing technologies. It is applicable for online PD testing, as well as abnormal heating and defect detection on all types of substation equipment. PD amplitude, PRPD, PRPS, and infrared spectrums provide critical data for determining the operational condition of electric power equipment. It connects to the PMDTCloud via Wi-Fi/3G/4G to upload test data, download test tasks, and receive diagnostic results in real time. Another uniquely advanced feature of the PDStar is that it integrates with a 100 MSPS (Mega-Samples per Second) HFCT signal processor, which greatly improves the performance for power cable OLPD testing.
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Product
Static Code Analysis Tool
Klockwork
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Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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Product
FTIR Microscopes & Imaging Systems
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Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Product
Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Product
Chip Inspection System
GEN3000T
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GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Product
Network Emulator
KMAX
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The KMAX network emulator helps network engineers test and measure performance in order to identify and remove defects. Network emulators turn well behaved development and test networks into the kind of slow, congested, and less-than-reliable services encountered on the internet. In addition, unlike the real internet, network emulators allow the operator to control these conditions so that products and apps can be subjected to controlled and repeatable tests, by routing selected packets through a series of impairment nodes.
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Product
Power Steering Tester in Storage Case
34650
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Gives fast, accurate power steering analysis. Test for defects in power steering pumps, gears and lines. Large heavy duty gage reads from 0-2,000 PSI and 0-140 BAR. Use to rule out power steering problems before expensive suspension or steering linkage problem is attacked. Includes 13 adapters. Supplied with instructions in a durable, plastic molded storage case.
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Product
Precision Impedance Analyzer (10Hz to 130MHz)
ST2851
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ST2851 series precision impedance analyzer is a new generation impedance test instrument by adopting the current international advanced automatic balance bridge principle. It is based on Windows10 operating system, which realizes a fully computerized operation interface, making the measurement more intelligent and easier.ST2851 series impedance analyzer surpasses the 120MHz frequency bottleneck of similar foreign instruments, and solves the defect that it can only be analyzed but cannot be tested independently. At the same time, it adopts two interfaces of single test and analysis to make the test easier.
