Defect
other than specified, imperfection .
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Product
3D AOI
Zenith2
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Zenith 2 AOI platform, which provides the AI-driven Auto Programming for rapid job programming. The Zenith 2 also combines Koh Young’s advanced vision algorithms with innovative high-resolution optics. The latest platform expands inspection capabilities, delivering best-in-class performance, functionality, and accessibility. Koh Young’s side-view solution allows Zenith 2 to quickly detect and analyze defects on a wide range of mounted components and chips.
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Product
Flux Leakage Tester For Detecting Surface Defects In Hot Rolled Black Steel Bar
130MM ROTOFLUX® AC
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Highly sensitive AC flux leakage is especially well suited to test hot rolled black steel bars and rods that have surface conditions which used to make finding shallow defects very difficult, if not impossible.
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Product
X-ray Inspection System
X-eye SF160 Series
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High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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Product
Sensor Products: Weld Force Gage
90061
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Model 90061 is a self-contained, portable measurement system which allows auditing of the pinch force generated between the electrodes of resistance spot welders. Resistance welding uses a pair of electrodes to clamp two base metals firmly together prior to and during application of electrical current. Poorly clamped parts result in a defective joint. A correctly clamped assembly aids in reducing the resistance in the joint and allows the current flow to properly heat the base metals to weld the part.
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Product
Slip Line Detection System
YIS 200
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The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Product
Transportation Environment Data Recorder
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For investigation and evaluation of the transportation route by measuring vibration,temperature and humidity on the whole travel.For search of the cause of defects of any expensive freights as shock, fall, temperature or humidity,and location of place and time.For evaluation of vibration durability of the freights or R & D of the most suitable package using the function of tailoring.Specifications
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Product
Leadframe Inspection Machine
IV-L200
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The IV-L200 is a leadframe inspection machine ideal for measuring leadframe dimension and pitch. Aside from identifying leadframe warpage, it is also used to detect bent or skewed leads as well as surface defects such as scratch, ink, and contamination, among others.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Precision Continuous Flow Metering + Dispense System
Graco Dispense Analyzer
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A whole new level of precision for drivetrain gasketing. Detect air bubbles and defects you couldn't see before. Track critical measurements, including entrapped air. Quickly and easily find a defect's root cause. Avoid expensive problems by responding sooner. Save millions: Contain warranty claims and recalls. The Graco PCF and Analyzer combination: Your ultimate system for accurate, reliable dispensing. The new Graco Dispense Analyzer is a monitoring system capable of detecting the tiniest air bubble or error during adhesive dispensing. Paired with the Graco Precision Continuous Flow (PCF) system, the Analyzer monitors your dispense in real time, detecting immediately if conditions are off and may potentially compromise your final product. With the ability to respond immediately, you can avoid defects that lead to costly recalls. The Analyzer stores the signature of each dispense, giving you the ability to replay the data, even months or years after the actual dispense. Seeing the data replayed as if in real time, you can more easily pinpoint the root cause of the defect and contain a recall or warranty claim to only those products that were affected.
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Product
Sorter
IV-200I
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IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Product
Radiographic Inspection Test
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The radiographic inspection is a non-destructive x-ray method for detecting internal physical defects in small component parts which are not otherwise visible. Radiographic techniques are intended to reveal such flaws as improper positioning of elements, voids in encapsulating or potting compounds, inhomogeneities in materials, presence of foreign materials, broken elements, etc.
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Product
Vision Metrology System
NGS 3500Z
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This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.
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Product
SDT Checker Range
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With a focused solution for every problem, the Checker range makes ultrasound available to everyone. Choose the right tool for the right job and perform fast troubleshooting inspections. As a first defense against breakdown, Checkers identify defects quick and early, allowing for deeper analysis and trending with an SDT200, SDT270 or SDT340.
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Product
Pinhole Detection Devices
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
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Product
Line Noise and Vibration Test Systems
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The sound and vibration characteristics of your product can be used to identify many common mechanical and assembly defectives.
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Product
High-speed In-Line 3D CT Inspection System
X-eye 6300
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Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Product
Ultrasonic Flaw Detector
MFD550B
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Based on ultrasonic principle, digital ultrasonic flaw detector MFD550B can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it show the defect clearly under the dim light and strong sunlight environment. 0-9999mm measuring range can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium ion battery module，it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways inone body, customers with different habits can operate it freely. With comprehensive performance self-checking function, it can automatically generate test reports and support for many languages. With high cost performance, it is the smart choice for the practical economic model of ultrasonic testingequipment.
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Product
Large Surface Defect Gauge
4D InSpec® XL Surface Defect Gauge
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The 4D InSpec XL Surface Defect Gauge expands 4D Technology’s 4D InSpec product line—they’re the first handheld, precision instruments for 3D non-contact surface defect measurement.
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Product
Precision LCR Meter (20Hz to 2MHz)
ST2840
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ST2840 series pricision LCR meter innovatively adopts a new generation of technologies such as dual CPU architecture, Linux bottom layer, 10.1-inch capacitive touch screen, built-in instruction which effectively solves the defects of slow LCR test, single display and complicated operation in the past.The measurement frequency of ST2840 series is from 20Hz-500kHz/2MHz, which makes up for the shortcoming of lack of high-performance bridge in the frequency range of 500kHz.
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Product
Mini Visual Laser Source
TM536 Series
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TM536 Series Mini Visual Laser Source totally complies with the human engineering. It's small in size, easy to operate, portable and integrated with a launching indicator. A Visual Laser Source is usually used to inspect the damaged or broken point of a optical fiber, cable, patchcord and etc.If the inspected fiber does have a defect, user could find the visual laser at the broken or damaged point. TM536 Series Mini Visual Laser Source is suitable for both single mode and multimode fibers. The performance of the visual laser source will act a little different on different fiber coat and color.
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Product
PocketDetect HR
PocketDetect HR
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Hachmann Innovative Elektronik
With a PocketDetect HR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
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Product
Wafer Inspection System
INSPECTRA® Series
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INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Product
Circuit Breaker Time Interval Meter
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Measuring contact timings is useful for finding the contact bounces and non-simultaneity of contacts. This helps in finding the possible electrical or mechanical defects in the circuit breaker contacts. Timing analysis also make it possible to detect incorrect mechanical adjustments and wear phenomena of the circuit breaker by measuring the differences between the fastest and slowest phases.
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Product
Inspection System for Die Casting
X-eye 7000BS
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Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Photomask Stations
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Fast, sensitive, economic, off-line photomask defect review. Our 300 series photomask inspection and review stations use long working-distance microscopy and a unique four-way lighting system to greatly speed up location and identification of micron- and submicron-sized defects
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Product
Open Source Service to Help Secure and Trust Your Software
Community Attestation Service / CAS
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- CAS stores all signatures inside of immudb, the standard for open source immutable databases.- CAS is protected against tampering. All attestation data is integrity-checked and cryptographically verified by the CAS client.- CAS is also protected against MITM attacks. The public key below is checked by every communication.A Software Bill of Materials (SBOM) is a list of components in a piece of software.Like a list of ingredients on food packaging -- where you might consult a label to avoid foods that may cause an allergy -- SBOMs can help companies avoid use of software that may harm their organization.If defects are later found in a specific part, the SBOM makes it easy to locate affected products.
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Product
Security Testing Services
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You're building more-complex software faster than ever before, but does your team have sufficient application security skills and resources to test it for security defects? Synopsys security testing services provide continuous access to security testing experts with the skills, tools, and discipline needed to cost-effectively analyze any application, at any depth, at any time.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
PXI Fault Insertion Matrix Modules
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All of our fault insertion matrices feature a breakout arrangement that allows faults to be attached to the sensor lines via the Y axis. This includes the breaking of a connection or the adding of a series defect – all of which can simulate connectivity problems in the system. The three pin breakout versions allow the connection to be swapped for a “bad” sensor simulation.
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Product
Magnetic Particle Inspection(MPI)
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Magnetic particle inspection is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
