Defect
other than specified, imperfection .
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Product
Advanced 3D Automatic X-Ray Inspection
V810 S2EX
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V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.
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Product
Companion Tool to VS for Test Time & Pin reduction
UltraScan
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UltraScan is SynTest's solution to combat increase in test time. In 130 nm or smaller ? nanometer geometries, many defects become delay defects and it becomes necessary to use delay tests to detect the transition faults and path delay faults. Often bridging tests are also required.
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Product
Particle Impact Detection System 10
BW-LPD-DAQ4000HD
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This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Product
Optical Inspection Machine
3D AOI
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3D AOI latest optical inspection machine 1. No part dead angle, 4-way projection, complete measurement 2. Part height measurement, accurate measurement of defects 3. Multi-piece inspection without additional program 4. DLP digital projection, program editable height measurement
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Product
Test Services For Circuit Board
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Acculogic Contract Testing Services group with multiple locations in United States, Canada, Germany and China provides Cost Effective, On-Demand (Quick-Turn) testing service. Our circuit board assembly test services include defect analysis, In-Circuit, Boundary Scan JTAG and Functional testing on industries most widely used test platforms.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Making Invisible Visible
Quadra 3
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Quadra™ 3 is your partner for high quality X-ray inspection for production line quality control. Detect a wide range of manufacturing defects including BGA, QFN and IGBT attachment, PTH filling, interfacial voiding, component cracking and counterfeit device screening. High quality, high magnification inspection for product applications.
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
Microelectronics And Packaging AOI
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Machine Vision Products, Inc. has extensive experience in a wide range of Microelectronics and Packaging applications. MVP works with the world’s leading manufacturers on a global basis. From multiple die and wire technologies to leadframe, ball grid array and surface inspection applications, MVP has the widest applications toolbox of any AOI provider. MVP takes pride in the fact that they supply many complex inspection solutions to diverse industries such as Automotive, Telecoms, Medical Devices, Military, and Space. MVP’s 900 Series is the base platform upon which all Microelectronics and Packaging inspection solutions are based. The 900 series 2D capabilities provide metrology and defect detection using a propriety Quad-Color lighting, Telecentric optics and resolutions down to 1um. 3D height measurement capabilities allow for in-line high speed inspection of Dies, paste deposition, positional accuracy, volume and height with a resolution down to 1.13um.
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Ultrasonic Flaw Detector
MFD800C
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MFD800C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed main product. Unique design, sophisticated manufacturing, convenient operation, powerful function, It takes many advantages in one unit. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module，it can work more than 8 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating way in one body, customer with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.
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Product
Qualmark HASS Systems
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Advanced environmental test chambers that combine rapid temperature changes with multi-axis vibration to quickly find product weaknesses and eliminate defects in electronics and electromechanical devices.
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Product
Pipeline Defect Mapper
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The non-intrusive measuring device takes measurements along the pipeline and plots the results directly onto the screen of the receiver. There is no need to carry extra logging and display devices. All the data is displayed and logged into the receiver for downloading to a spreadsheet or dedicated analysis program.
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Product
Automated Control System for Veneer Edge Gluing Line
Vikat
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The automated veneer splicing line control system is designed to identify defective veneer areas, control the scrap trimming, bonding of suitable areas and the formation of output sheets of a given size.
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Product
Flat Panel Display Test Solutions
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Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Product
Flaw Detectors
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Flaw detectors are essential for ensuring the safety and quality of industrial products. They accurately identify defects such as cracks, voids, and inclusions without damaging the materials. Ultrasonic testing is particularly notable for its precision and versatility among the various non-destructive testing methods.
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Product
High-Accuracy Automated Optical Inspection Systems
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Fully-automated and high-accuracy 3D inspection and measurement systems. High-power, long working distance optics and high-resolution digital camera are perfect for high-magnification applications. These are full-color systems capable of high-accuracy measurements, automated defect detection and color verification.
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Product
Highly Accelerated Life Testing (HALT)
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Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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Product
Slip Line Detection System
YIS 200
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The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Product
ECHO VS System with Image Enhancement
Echo VS
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The ECHO VS system adds our Image Enhancement Suite to the ECHO platform to provide industry-leading image quality and defect identification capabilities. It’s our most accurate ultrasonic NDT equipment for development labs and for production environments that require the highest precision. The Echo system can be fitted with an optional chuck for manual wafer inspection.
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Product
Software
Interface Analysis
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Surface-mount components warp during the reflow process, and the area where they attach also changes shape during assembly. This interface between components is where solder, paste, and gaps created due to thermal expansion combine to create 100% good products, or defects such as Head-in-Pillow, Shorts, and Opens. Fully understanding that critical interface between surfaces is more important than ever.
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Product
Manufacturing Defects Analyzer
eloZ1-400
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.
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Product
SlipFinder
YIS and SF Series
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The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
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Product
Power Steering Tester in Storage Case
34650
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Gives fast, accurate power steering analysis. Test for defects in power steering pumps, gears and lines. Large heavy duty gage reads from 0-2,000 PSI and 0-140 BAR. Use to rule out power steering problems before expensive suspension or steering linkage problem is attacked. Includes 13 adapters. Supplied with instructions in a durable, plastic molded storage case.
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Product
Thermal Shock Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Thermal Shock Chamber provide the sudden temperature changes between extreme cold and extreme hot from -65℃ to 150℃ (customized available), specially for environmental stress screen test of the industries that rely on thermal testing, such as component, board electronic assemblies, defense, material stress, consumer products etc. The thermal shock test can cause faulting or cracking by the expansion and contraction on the products, indicates the hidden manufacturing defects. Bell’s Thermal Shock Chamber ensure you to launch qualified product to the market.
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Product
Semiconductor Inspection (SEMI)
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A process for detecting any particles or defects in a wafer.
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Product
Soldering Inspection Video Microscope
MS-1000
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The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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Product
Dual Voltage Detector / Maintenance Tester
MicroPhase I
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Hachmann Innovative Elektronik
MicroPhase I is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. The integrated "Universal Phase Comparator" compares two different interface signals, even if they are of different interface type or voltage. A unique error control avoids switching errors caused by erratic or unfeasible phase comparison.
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Product
Sorter
IV-200I
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IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Product
WireChop
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A cost-effective, proven defect chopper system that works with both bench presses and automatic machines
